1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete the Integral nonlinearity (INL) test as specified under table I. - ro 03-05-28 R. Monnin B Add paragraph 3.11 and make changes to figure 2 block diagram. - ro 07-09-13 R. Heber C Made change to paragraph 2.1 and 3.11. - rrp 08-06-09 R. Heb
2、er D Add device type 02. - drw 12-01-24 Charles F. Saffle REV SHEET REV D SHEET 15 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Rick Officer DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD
3、MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Rajesh Pithadia APPROVED BY Raymond Monnin MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT, 41 MSPS ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 02-08-01 AMSC
4、N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-02538 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E086-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 RE
5、VISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in th
6、e Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 02538 01 V X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device cla
7、ss designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL
8、-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit function 01 AD9042S 12-bit, 41 MSPS analog to digit
9、al converter 02 AD9042S 12-bit, 41 MSPS analog to digital converter 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL
10、-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package st
11、yle X CDIP2-T28 28 Dual in line Z CDFP3-F28 28 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-S
12、TANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ AVCCvoltage 7 V DVCCvoltage 7 V Analog input voltage . 0.5 V to 4.5 V Analog input current 20 mA Digital input voltage (ENCOD
13、E) 0 V to AVCCENCODE, ENCODE differential voltage 4 V Digital output current . 40 mA Maximum junction temperature (TJ) +175C Lead temperature (soldering, 10 seconds) +300C Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) Case X . 14C/W Case Z . 22C/W Thermal resist
14、ance, junction-to-ambient (JA) : Case X . 34C/W Case Z . 60C/W 1.4 Recommended operating conditions. AVCCvoltage 5 V DVCCvoltage 5 V Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Device type 01: Maximum total dose available (dose rate = 50 300 rads(Si)/s) . 100 kra
15、ds (Si) 2/ Device type 02: Maximum total dose available (dose rate 10 mrads(Si)/s) 50 krads (Si) 3/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless
16、 otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MI
17、L-STD-1835 - Interface Standard Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. TA= +25C. 2/ Device type 01 may be dose rate sensitiv
18、e in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 3/ For device type 02, radiation end point limits for the noted parameters are g
19、uaranteed only for the conditions specified in MIL-STD-883, method 1019, condition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHE
20、ET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk,
21、 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulatio
22、ns unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modificatio
23、n in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. Th
24、e design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The te
25、rminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available t
26、o the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over th
27、e full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In add
28、ition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Ma
29、rking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. T
30、he compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6
31、.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of su
32、pply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required
33、for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
34、IZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/, 2/, 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Static charact
35、eristics VCCsupply ICC(total) 1, 2, 3 All 146 mA M,D,P,L,R 1 01 146 M,D,P,L 1 02 146 Power dissipation 4/ PD1, 2, 3 All 735 mW Power supply 4/ rejection ratio PSRR TA= 25C 1 All -20 20 mV/V DC accuracy 4/ No missing codes All Offset error OE 1, 2, 3 All -10 10 mV M,D,P,L,R 1 01 -10 10 M,D,P,L 1 02 -
36、10 10 Gain error GE 4, 5, 6 All -6.5 6.5 %FS M,D,P,L,R 4 01 -6.5 6.5 M,D,P,L 4 02 -6.5 6.5 ANALOG INPUT (AIN) section Input voltage range 4/ IVR 1, 2, 3 All VREF-0.5 VREF+0.5 V Input resistance 4/, 5/ RINTA= 25C 4 All 200 300 See footnotes at end of table. Provided by IHSNot for ResaleNo reproductio
37、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions 1/, 2/, 3/ -55C TA +
38、125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max ENCODE INPUT section (Logic compatibility, TTL / CMOS) Logic “1” voltage 4/ VIH1, 2, 3 All 2 5 V Logic “0” voltage 4/ VIL1, 2, 3 All 0 0.8 V Logic “1” current IIHVINH= 5 V 1, 2, 3 All 450 800 A M,D,P,L,R 1 01 450 800 M
39、,D,P,L 1 02 450 800 Logic “0” current IILVINL= 5 V 1, 2, 3 All -400 -200 A M,D,P,L,R 1 01 -400 -200 M,D,P,L 1 02 -400 -200 DIGITAL OUTPUTS section (Logic compatibility, CMOS) Logic “1” voltage 4/ VOHIOH= 10 A 1, 2, 3 All 3.5 V Logic “0” voltage 4/ VOLIOL= 10 A 1 All 0.8 V 2, 3 1 Dynamic characterist
40、ics section Differential non-linearity DNL ENCODE = 20 MSPS 4, 5, 6 All -2 2 LSB M,D,P,L,R 4 01 -2 2 M,D,P,L 4 02 -2 2 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA
41、LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Switching characteristics s
42、ection Conversion rate 4/ 5/ CR TA= 25C 9 All 5 41 MSPS Output delay 4/ 5/ tODSee figure 3, TA= 25C 9 All 5 14 ns ENCODE pulse 4/ 5/ width, high EPW TA= 25C 9 All 10 ns ENCODE pulse 4/ 5/ width, low EPWL TA= 25C 9 All 10 ns Signal to noise ratio 4/ 6/ SNR Analog input at 1 dBFS, 1.2, 9.6, and 19.6 M
43、Hz 7 All 52 dB Signal to noise and 4/ 7/ distortion ratio SINAD Analog input at 1 dBFS, 1.2, 9.6, and 19.6 MHz 7 All 52 dB Worst spur ratio 4/ 8/ WS Analog input at 1 dBFS, 1.2, 9.6, and 19.6 MHz 7 All 57 dBc 1/ Unless otherwise specified, AVCC= DVCC= +5 V, VREFtied to VOFFSETthrough 50 . 2/ Device
44、type 01 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device type 02 supplied to this drawing has been characterized through all levels P and L of irradiation. However, device type 01 is only tested at the “R” level and device type 02 is only tested
45、 at the “L”. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effec
46、ts. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device type 01. Device type 02 has been tested at low dose rate. For device type 02, radiation end point limits for the noted parameters are guarantee
47、d only for the conditions specified in MIL-STD-883, method 1019, condition D. 4/ Not tested post irradiation. 5/ Guaranteed by design, not tested. 6/ Analog input signal power at 1 dBFS; signal to noise ratio (SNR) is the ratio of the signal level to total noise (first five harmonics removed). 7/ An
48、alog input signal power at 1 dBFS; signal to noise and distortion (SINAD) is the ratio of signal level to total noise + harmonics. 8/ Analog input signal power at 1 dBFS; worst spur is the ratio of the signal level to worst spur, usually limited by harmonics. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02538 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-39
