1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table II, add note to Group C end-point test parameters. Update boilerplate paragraphs. -gz 10-02-23 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn
2、 DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, LINEAR, 15 VOLT, SINGLE CHANNEL, DC/DC CONVERTER AND AGENCIES OF
3、THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 06-04-18 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-04254 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E200-10Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
4、5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are availabl
5、e and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 04254 01 H X X Federal RHA Device Device Case Lead stock class designator type cl
6、ass outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A
7、 dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 AMF2815S DC/DC converter, 12 W, 15 V output 1.2.3 Device class designator. This device class designator shall be a single letter ide
8、ntifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Hi
9、ghest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. Th
10、is level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon on
11、e of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system perform
12、ance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
13、 SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Straight le
14、ads with end mounting tabs (leads are ceramic sealed) 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +50 V dc (continuous) Lead temperature (soldering, 10 seconds) +300C Storage temperature range -65C to +1
15、35C 1.4 Recommended operating conditions. Input voltage range +16 V dc to +40 V dc Output power . 12 W Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a par
16、t of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-88
17、3 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at h
18、ttps:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes
19、precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534.
20、 Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the
21、performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanen
22、t damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
23、OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and fig
24、ure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating tempe
25、rature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be mark
26、ed with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from
27、the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufa
28、cturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the
29、 manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sa
30、mpling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MI
31、L-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring act
32、ivity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electri
33、cal test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
34、 SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit
35、Min Max Output voltage VOUTIOUT= 0 A 1 01 14.85 15.15 V 2,3 14.70 15.30 Output current 1/ IOUTVIN= 16, 28, and 40 V dc 1,2,3 01 0.8 A Output ripple voltage 2/ VRIPVIN= 16, 28, and 40 V dc, IOUT= 0.8 A, BW = 20 Hz to 2 MHz 1,2,3 01 60 mV p-p Line regulation VRLINEVIN= 16, 28, and 40 V dc, IOUT= 0, 0.
36、4, and 0.8 A 1,2,3 01 -50 +50 mV Load regulation VRLOADVIN= 16, 28, and 40 V dc, IOUT= 0, 0.4, and 0.8 A 1,2,3 01 -50 +50 mV Input current IINIOUT= 0 A, pin 1 open 1,2,3 01 30 mA Pin 1 shorted to pin 7 12 Input current ripple IRIPVIN= 16, 28, and 40 V dc, IOUT= 0.8 A, BW = 20 Hz to 2 MHz 1,2,3 01 50
37、 mA p-p Efficiency EFFIOUT= 0.8 A 1,3 01 78 % 2 75 Isolation ISO Input to output or any pin to case (except pin 6) at 500 V dc, TC= +25C 1 01 100 M Maximum capacitive load 3/ 4/ CLIOUT= 0.8 A, TC= +25C 4 01 200 F Power dissipation load fault PDShort circuit 1,2,3 01 6 W Short circuit recovery 3/ TSC
38、0% load to 100% load 4,5,6 01 20 ms See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC
39、FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC+125C VIN= 28 V dc 5%, CL= 0 unless otherwise specifiedGroup A subgroups Device type Limits Unit Min Max Switching frequency FS100% load 4,5,6 01 500 600 kHz Sync frequency range Fsync4,5,6 01
40、500 700 kHz Output response to step load changes 5/ VOTLOAD 50% to/from 100% load 4,5,6 01 -300 +300 mV pk 0% to/from 50% load 4,5,6 -750 +750 Recovery time, step load changes 5/ 6/ TTLOAD 50% to/from 100% load 4,5,6 01 100 s 0% to/from 50% load 4,5,6 2 ms Output response to step line changes 3/ 7/
41、VOTLINE Input step 16 V to/from 40 V dc, IOUT= 0.8 A 4,5,6 01 -1500 +1500 mV pk Recovery time, step line changes 3/ 6/ 7/ TTLINE Input step 16 V to/from 40 V dc, IOUT= 0.8 A 4,5,6 01 800 s Turn on overshoot VTonOS0% load to 100% load 4,5,6 01 750 mV pk Turn on delay 8/ TonD0% load to 100% load 4,5,6
42、 01 20 ms 1/ Parameter verified during line and load regulation tests. 2/ Guaranteed for a DC to 2 MHz bandwidth. Tested using a 20 kHz to 2 MHz bandwidth. 3/ Parameter is tested as part of design characterization or after design or process changes. Thereafter, parameter shall be guaranteed to the l
43、imits specified in table 1. 4/ Capacitive load may be any value from 0 to the maximum limit without compromising dc performance. 5/ Load step transition time between 2 and 10 microseconds. 6/ Recovery time is measured from the initiation of the transient to where VOUThas returned to within 1 percent
44、 of its steady state value at 50 percent load. 7/ Line step transition time between 1 and 10 microseconds. 8/ Turn on delay time from either a step application of input power or the removal of a ground signal from the enable pin (pin 1) while power is applied to the input. Provided by IHSNot for Res
45、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo repr
46、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04254 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case outline X - Continued. Symbol Millimeters Inches Min Max Min Max A 8.38 .330 b 0.
47、63 0.89 .025 .035 D 52.96 53.72 2.085 2.115 D1 40.51 40.77 1.595 1.605 D2 6.22 6.48 .245 .255 E 34.92 35.18 1.375 1.385 E1 6.22 6.48 .245 .255 e 4.94 5.21 .195 .205 e1 10.03 10.29 .395 .405 e2 15.11 15.37 .595 .605 e3 25.27 25.53 .995 1.005 F 1.14 1.40 .045 .055 L 6.48 6.73 .255 .265 P 3.43 3.68 .13
48、5 .145 Q 4.19 4.45 .165 .175 q 46.86 47.12 1.845 1.855 q1 28.57 28.83 1.125 1.135 q2 17.40 17.65 .685 .695 S 4.57 4.83 .180 .190 NOTES: 1. The US government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Pin n
