1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-07-17 Charles F. Saffle B Updated drawing paragraphs. -sld 12-01-19 Charles F. Saffle REV SHEET REV B B B SHEET 15 16 17 REV STATUS REV B B B B
2、 B A B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Greg Cecil DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGEN
3、CIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, LINEAR, 3.3 VOLT, SINGLE CHANNEL, DC-DC CONVERTER DRAWING APPROVAL DATE 07-10-03 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-06209 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E123-12 Provided by IHSNot for Res
4、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined
5、in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the followi
6、ng example: 5962 - 06209 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall me
7、et the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SMFLHP283R3S DC-DC converter, 52
8、.8 W, 3.3 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Clas
9、s G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space
10、high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test
11、) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition
12、document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot fo
13、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and
14、 as follows: Outline letter Descriptive designator Terminals Package style T See figure 1 12 Tabbed flange, mount, lead formed up U See figure 1 12 Flange mount, lead formed down X See figure 1 12 Flange mount, short lead Y See figure 1 12 Tabbed flange mount, short lead Z See figure 1 12 Tabbed fla
15、nge mount, lead formed down 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range 2/ . -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 (non-RHA) 24 W Device type 01 (RHA levels P, L and R) . 28.3 W Lead soldering
16、 temperature (10 seconds) . +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range +19 V dc to +40 V dc Output power . 52.8 W Case operating temperature range (TC) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad
17、(Si)/s): Device type 01 (RHA levels P, L and R) 100 krad (Si) 3/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of
18、 these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Co
19、mponent Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ An undervoltage lockout circuit shuts the unit off when the input voltage drops to approximately
20、 12 volts. Operation of the unit between 15 volts and 19 volts is nondestructive at reduced output power, but performance is not guaranteed. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted p
21、arameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUM
22、BUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from
23、 the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however,
24、 supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include t
25、he performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-P
26、RF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
27、 as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall
28、be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in tabl
29、e I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shal
30、l be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein s
31、hall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be
32、 maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The cer
33、tificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with e
34、ach lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the
35、form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electr
36、ical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN = 28 V dc 0.5 V no external sync, CL = 0 unless otherwise specified Group A subgroups Device types Limits Unit Min Max Output voltage VOUT IOUT = 16 A dc 1 01 3.26 3.34 V 2,3 3.20 3.40 P, L, R 1,2,3 01 3.10 3.50 Output
37、current IOUT VIN = 19 V dc to 40 V dc 1,2,3 01 0.0 16 A P, L, R 1,2,3 01 0.0 16 VOUT ripple voltage VRIP IOUT = 16 A B.W = 10 kHz to 2 MHz 1 01 25 mV 2,3 40 P, L, R 1,2,3 01 60 VOUT line regulation VRLINE VIN =19 V dc to 40 V dc IOUT = 16 A 1,2,3 01 50 mV P, L, R 1,2,3 01 60 VOUT load regulation VRL
38、OAD IOUT = 0 to 16 A 1,2,3 01 20 mV P, L, R 1,2,3 01 40 Input current IIN IOUT = 0 A, Inhibit (pin 4 and pin 12) = open 1,2,3 01 120 mA P, L, R 1,2,3 01 150 IOUT = 0 A, Inhibit 1 (pin 4) tied to input return (pin 2) 1, 2, 3 01 15 P, L, R 1,2,3 01 18 IOUT = 0 A, Inhibit 2 (pin 12) tied to output retu
39、rn (pin 8) 1, 2, 3 01 80 P, L, R 1,2,3 01 90 IIN ripple current IRIP IOUT = 16 A, BW = 10 kHz to 10 MHz 1 01 45 mAp-p 2,3 01 80 P, L, R 1,2,3 01 90 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D
40、RAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN = 28 V dc 0.5 V no external sync, CL = 0 unless otherwise specified Grou
41、p A subgroups Device types Limits Unit Min Max Efficiency Eff IOUT = 16 A 1 01 70 % 2,3 01 65 P, L, R 1,2,3 01 64 Isolation ISO Input to output or any pin to case at 500V dc, 1 01 100 M TC =+25C P, L, R 1 01 100 Capacitive load 3/ 4/ CL No effect on dc performance, TC = +25C 4 01 1000 F P, L, R 4 01
42、 1000 Power dissipation load fault PD Short circuit 1 01 22 W 2,3 24 P, L, R 1,2,3 01 28.3 Switching frequency FS IOUT = 16 A 4 01 550 650 kHz 5,6 01 525 675 P, L, R 4,5,6 01 500 700 External sync range 5/ FSYNC IOUT = 16 A, TTL level to pin 6 4,5,6 01 525 675 kHz P, L, R 4,5,6 01 525 675 VOUT step
43、load transient 6/ VTLOAD IOUT = 8 A to 16 A 4,5,6 01 -400 +400 mV pk IOUT = 16 A to 8 A 01 -400 +400 IOUT = 8 A to 16 A P, L, R 4,5,6 01 -400 +400 IOUT = 16 A to 8 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND
44、ARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C VIN = 28 V dc 0.5 V no external sync, CL = 0 unless otherw
45、ise specified Group A subgroups Device types Limits Unit VOUT step load transient recovery 4/ 6/ 7/ TTLOAD IOUT = 8 A to 16 A 4,5,6 01 3.0 ms P, L, R 4,5,6 01 4.0 IOUT = 16 A to 8 A 4,5,6 01 3.0 P, L, R 4,5,6 01 4.0 VOUT step line transient 4/ 8/ VTLINE IOUT = 16 A Input step 19 V dc to 40 V dc 4,5,
46、6 01 400 mV pk P, L, R 4,5,6 01 500 IOUT = 16 A Input step 40 V dc to 19 V dc 4,5,6 01 400 mV pk P, L, R 4,5,6 01 500 VOUT step line transient recovery 4/ 7/ 8/ TTLINE IOUT = 16 A Input step 19 V dc to 40 V dc 4,5,6 01 300 ms P, L, R 4,5,6 01 400 IOUT = 16 A Input step 40 V dc to 16 V dc 4,5,6 01 30
47、0 P, L, R 4,5,6 01 400 Start up overshoot 4/ VtonOS IOUT = 16 A VIN = 0 to 40 V dc 4,5,6 01 50 mV pk P, L, R 4,5,6 01 75 Start up delay 9/ TonD IOUT = 16 A VIN = 0 to 28 V dc 4,5,6 01 10 ms P, L, R 4,5,6 01 12 Load fault recovery 4/ TrLF IOUT = 16 A 4,5,6 01 10 ms P, L, R 4,5,6 01 12 See notes on to
48、p of next page. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06209 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. 1/ Post irradiation testing shall be in accordance with 4.3.5 herein. 2/ These parts may be dose rate sensi
