1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Paragraph 1.5, correct maximum total dose available from 300 Krads (Si) to 300 Krads (Si). Paragraph 4.3.5.1a, last sentence, correct 5962F0824601 to 5962F0921001. Update boilerplate paragraphs. -gz 11-04-05 Charles F. Saffle REV SHET REV SHET RE
2、V STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charle
3、s F. Saffle MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 09-07-15 LOW DROPOUT, FIXED VOLTAGE REGULATOR AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-08246 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E195-11Provided by IHSNot for ResaleN
4、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in p
5、aragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following e
6、xample: 5962 F 08246 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet t
7、he MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types The device types identify the circuit function as follows: Device type Generic number Circuit function 01 MSK 5823-1.8RH Radiation hardened, 3.5 A,
8、 1.8 V voltage regulator 02 MSK 5823-2.5RH Radiation hardened, 3.5 A, 2.5 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Cert
9、ification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality c
10、lass level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer
11、 specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must
12、 be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified fl
13、ow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.
14、4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flat pack with gull wing leads, glass sealed Y See figure 1 8 Flat pack with straight leads, glass sealed 1.2.5 Lead finish. The lead fi
15、nish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) +7.0 V dc Output current 3.5 A 2/ Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC), TC= +125C . 6.5C/W Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds)
16、 +300C 1.4 Recommended operating conditions. Input voltage range (VIN) +2.9 V dc to +6.5 V dcCase operating temperature range (TC). -55C to +125C 1.5 Radiation features. Maximum total dose available 300 Krads (Si) 3/ 4/ 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook
17、s. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, Ge
18、neral Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcir
19、cuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawi
20、ng and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extende
21、d operation at the maximum levels may degrade performance and affect reliability. 2/ Output current limit is dependent on the value of VIN- VOUT. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the no
22、ted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A. 4/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These d
23、evice types have not been characterized for displacement damage. 5/ See figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4
24、 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manu
25、facturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, th
26、e modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The ca
27、se outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics.
28、 Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electri
29、cal tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the g
30、eneral performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary
31、 of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certifica
32、te of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate o
33、f conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device
34、manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND
35、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxOutput voltage VOUTVIN= 3.3 V, IOUT= 1.5 A 1 01
36、1.782 1.818 V 02 2.475 2.525 2.97 V VIN 3.63 V 50 mA IOUT 3.0 A 1,2,3 01 1.710 1.890 02 2.375 2.625 M,D,P,L,R,F 1/ 1 01 1.710 1.890 02 2.375 2.625 Dropout voltage VDOIOUT= 3.0 A 4/ 1,2,3 01 1.1 V IOUT= 3.0 A 02 0.5 Current limit 5/ IOUTVIN= 3.3 V 1,2,3 01,02 3.0 A Shutdown threshold VSTVIN= 3.3 V 1,
37、2,3 01,02 1.0 1.6 V Output voltage at shutdown VOUTSD VIN= VSHDN= 3.3 V, IOUT= 50 mA 1,2,3 01,02 -0.1 +0.1 V 1/ Device types 01 and 02 have been characterized through all levels M, D, P, L, R, F of irradiation and tested to 1.5 times at the F level. Pre and post irradiation values are identical unle
38、ss otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified, VIN= 3.3 V, VSHUTDOWN= 0 V, and IOUT= 50 mA. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose
39、rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. 4/ Dropout is limited by the minimum value of VIN. 5/ Current limit is dependent upon the value of VIN. Provided by IHSNot for ResaleNo repr
40、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters InchesMin Max Min Max A - 4.83 - .190 A1 0.076 0.18 .003 .00
41、7 b 0.58 0.69 .023 .027 D/E 18.92 19.18 .745 .755 D1 27.18 27.69 1.070 1.090 e 2.54 TYP .100 TYP e1 7.49 7.75 .295 .305 L 2.79 3.81 .110 .150 L1 0.76 1.27 .030 .050 R 0.76 REF .030 REF S1 5.21 6.22 .205 .245 NOTES: 1. A1 is measured from the bottom of the lead to the bottom of the package. 2. Pin 1
42、is indicated by the ESD marking on the package. Pin numbers are for reference only. 3. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units,
43、 the inch-pound units shall take precedence. 4. Case outline X weight: 5.5 grams typical. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43
44、218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline Y. Symbol Millimeters InchesMin Max Min Max A - 4.57 - .180 A1 1.78 2.03 .070 .080 b 0.58 0.69 .023 .027 D/E 18.92 19.18 .745 .755 e 2.54 TYP .100 TYP e1 7.49 7.75 .295 .305 L 10.16 - .400 - S1 5.21 6.22 .205 .245 NOTES: 1. Pin 1 i
45、s indicated by the ESD class marking. Pin numbers are for reference. 2. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
46、 units shall take precedence. 3. Pin numbers are for reference only. 4. Case outline Y weight: 5.8 grams typical. FIGURE 1. Case outlines - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA
47、 LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines X and Y Terminal number Terminal symbol 1 2 3 4 5 6 7 8 GND GND SHUTDOWN NO CONNECT VOUTVOUTVINVINFIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduct
48、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-08246 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Device types 01 and 02. FIGURE 3. Radiation exposure circuits. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD
