1、.h . A 5 - sa- 33 Convert to Military Drawing format. time on page 2. Extensive changes to table I. Change end point electrical test requirements in table II. Editorial changes throughout. Change clock rise and fall REVISIONS LTA DESCRIPTION C Correct timing diagrams, change vendor address. Add swit
2、ching test circuits and input/output waveforms. changes throughout. Editorial Changes in table II. Changes to table I, figure 1, and vendor part number. Editorial changes throughout. THIS DRAWING IS AVAILABLE FOR USE BY AU DEPARTMENTS DEPAnTMENi OF DEFENSE AMSC NIA AND AGENCIES OF THE - _ - - CAGE C
3、OOE =NG SUE 4 July 1985 . A 14933 84186 REVISION LEVEL C SHEET 1 OF 23 Ni( 1987 Mar 24 p%& 1987 May 28 1988 Dec 30 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircu
4、its in accordance ith 1.Elf MIL-STO-883, “Provisions for the use of MIL-STO-883 in conjunction with compliant on-JAN devices“. 1.2 Part number. The complete part number shall be as shown in the following example: STANDARDIZED SIZE MILITARY DRAWING A 84 186 I I I 84186 o1 1 I I I i Drawing number Dev
5、ice type (1.2.1) Q T I 1 i Case outline (1.2.2) X T I I l MIL-M-38510 Lead finish per 1.2.1 Device types. The device types shall identify the circuit function as follows: Device type Generic number Frequency Circuit function o1 28420A/20842004 4.0 MHz Para1 le1 i nput/output controller 02 28420/2084
6、2002 2.5 MHz Parallel input/output controller 1.2.2 Case outline. The case outline shall be as designated in appendix C of MIL-M-38510, and as 11 lows: Outline letter Case outline Q D-5 (40-lead, 2.096“ x .620“ x .225“), dual-in-line package -0.3 to t7.0 V dC -0.3 to t7.0 V dc -65C to +150C 0.7 w +2
7、70C +18OoC See MIL-M-38510, appendix C 4.5 V dc minimum to 5.5 V dc maximum 2.2 V dc 0.8 Y dc 0.45 V dc 0.5 to 4.0 MHz 0.5 to 2.5 MHz -55OC to +125C 30 ns maximum 30 ns maximum VCC - 0.6 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. SIZE A S
8、TANDARDIZED 9999996 OLL4481 984 m 84186 2. APPLICABLE DOCUMENTS 2.1 Government specification and standard. Unless otherwise specified, the following pecification and standard, of the issue listed in that issue of the Department of Defense Index of Pecifications and Standards sDecified in the solicit
9、ation. form a Dart of this drawina to the xtent specified herein. SPEC IF I CATI ON MIL ITARY MI L-M-38510 - Microcircuits, General Specification for. STANDARD MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. (Copies of the specification and standard required by manufacturers
10、 in connection with specific cquisition functions should be obtained from the contracting activity or as directed by the ontracting activity. 1 ,eferences cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence. In the event of a conflict between the text of this drawin
11、g and the 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of !IL-STD-883, “Provisions for the use of MIL-STO-883 in conjunction with compliant non-JAN devices“ ind as specified herein. limensions shall be as speciffed in MIL-M-38510 and herei
12、n. 3.2 Design, construction, and physical dimensions. The design, construction, and physical 3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.2 Logic diagram. The logic diagram shall be as specified on figure 2. 3.2.3 Case outline. 3.3 Electrical performanc
13、e characteristics. Unless otherwise specified, the electrical The case outline shall be in accordance with 1.2.2 herein. ierformance characteristics are as specified in table I and apply over the full case operating temperature range. ,e mark- the part number listed in 1.2 herein. nay also be marked
14、 as listed in 6.5 herein. in order to be listed as an approved source of supply in 6.5. The certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply shall state that the nanufacturers product meets the requirements of MIL-STO-883 (see 3.1 herein) and the requi
15、rements yerein. 3.6 Certificate of conformance. A certificate of conformance as required in MIL-STO-883 (see 3.1 lerein) shall be provided with each lot of microcircuits delivered to this drawing. 3.4 Marking, Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall In additi
16、on, the manufacturers part number 3.5 Certificate of compliance. A certificate of compliance shall be required from a manufacturer DESC FORM 193A SEP 87 f U. 5. GOVERNMENT PRINNNQ OFFICE: 1-550-547 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I St
17、iE A STANDARDIZED TABLE I. Electrical perfomance characteristics. I 84186 I I I I I I I I -55C c T (N-2) tPHL2 + tPHL1 + tSHL5. For mode 2: tpw2 SLH. DESC FORM 193A SEP 87 4 U. 8. QOYERNMENT FWNnN (YFICE: i-7 .- Provided by IHSNot for ResaleNo reproduction or networking permitted without license fro
18、m IHS-,-,-9h 0114486 4bh u- -4 Device types O1 and 02 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- - W 9999996 OLL4487 3T2 W STANDARDIZED sin MILITARY DRAWING A Device types O1 and 02 841 86 INTERFACE -A,L U BUS , CONTROL HANDSHAKE I I NT ERR U P
19、T CONTROL INTERRUPT CONTROL LINES FIGURE 2. Logic diagram. PERIPHERAL I NTE R FACE Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-b OLLYYBB 237 “ -_ STANDARDIZED MILITARY DRAWING DEFENSZ8uPpLYCENTER I - SIZE A 841 86 IFaVISIONLNEL IsulFm Switching t
20、est circuits Standard test load t5 v FROM OUTPUT UNDER TEST 0 = 100 pF Open drain test load t5 v T 2.2 k a FROM OUTPUT UNDER TEST 50 pF T * Switching test i nput/output waveform 2.4 2.01, TEST A2. .8/ POINTS- ,45 AC testing: Timing measurements are made at 2.0 V for a logic “1“ and 0.8 V for logic “
21、O“. Inputs are driven at 2.4 V for a logic “1“ and 0.45 V for a logic “O“. -. FIGURE 3. Timing diagrams and test circuits. MOniOraUr I I C I 10 ZU. S OOVERYENT RIMWQ OFRCL leM46d(? ESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
22、 b OLL4489 175 WA t3 I CLK I CE 00-07 OUT Read cycl e timing STANDARDIZED I MILITARY DRAWING 1 SIZE I I IA1 I 84186 I I DEFENSE ELECTRONICS SUPPLY CENTER REVISONLEVEL SHEET MYTON, OHK 45444 C 11 ir U 8 GOVERNMENT PRINTING OFFICE lWU-550.M DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reprodu
23、ction or networking permitted without license from IHS-,-,- 9999996 OLL4490 997 = CLK c/o 0 /A - CE IORQ . I I %I I DATA BUS IN z RD WA = Automatic wait state Write cycl e tirni ng Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-I NT - iORQ Mi 1EO IE
24、I MILITARY DRAWING DEFENSE UECTRONICS SUPPLY CEHTER MY“, OHIO 45444 DO- O7 I 841 86 REVISIONLEVEL SHEET P ?- Interrupt acknowledge timing FIGURE 3. Timing diagrams and test circuits - Continued. STANDARDIZED SIZE i I I L I IJ * U S. GOVERNMENTPRINTINGOFFICE: 1887-514088 DESC FORM 193A SEP a7 Provide
25、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 999999b 0334492 7bT - -_ SIZE A 841 86 I CLK - MI RD - DO-O7 ED 4D I EO Return from interrupt timing FIGURE 3. Timing diagrams and test circuits - Continued. STANDARDIZED MILITARY DRAWING I DEFENCE ELECTRONIC
26、S SUPPLY CENTER r I DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- = 999999b 0334493 bTb I I EO 4 IEI/IEO timing FIGURE 3. Timing diagrams and test circuits - Continued. STANDARDIZED I MILITARY DRAWING I zl I 841 86 I I EFENSE
27、 ELECTRONICS SUPPLY CEHIER DAYTON. OHIO 45404 I REVISION LEVU I SHEET r IC, L I I u I .“ ii U. S. QOVERNMENT PRINTINQ OFFICE: lSB5-65p54.I DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 9999996 0114494 532 I CLK STROBE PORT I
28、NPUT sL REA DY .- - I NT Mode 1 input timing L FIGURE 3. Timing diagrams and test circuits - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- W 999999b 0114495 479 I I I b I I, t U. S QOVERNMENT PWNTINQ ORICE: 1988-550547 DESC FORM 193A SE
29、P 87 OUTPUT A READY * 1 STROBE SIZE A Mode O output timing 841 86 FIGURE 3. Timing diagrams and test circuits - Continued. STANDARDIZED I MILITARY DRAWING I I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON. OHIO 45444 I REM“ LEVU r I SHEET 17 Provided by IHSNot for ResaleNo reproduction or networking perm
30、itted without license from IHS-,-,- 9999996 OLL4496 305 I CLK CE - I ORO PORT DATA BUS - ASTB ARDY , 1 Mode 2 bidirectional timing write data to port A registers FIGURE 3. Timing diagrams and test circuits - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice
31、nse from IHS-,-,-c m 9b 0114497 241 W DATA BUS DATA WORDI DATA WORD 2 PORT -7 x 4 28p x 1 NT - IORQ I DO-D7 ( DATAIN (o) IF generated only when enable Mode 3 bit mode timing FIGURE 3. Timing diagrams and test circuits - Continued. STANDARDIZED I MILITARY DRAWING IYI I 84186 I I WENSE ELECTRONICS SUP
32、PLY CENTER REVSiON LEVU SHEET DAYTON, OHIO 45444 C 19 t U S GOVERNYEM PRINTING OFFICE lW-6W.547 DESC FORM 193A SEP a7 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1 c SEE A STANDARDIZED 3.7 Notification of chan e. Notification of change to DESC-EC
33、S shall be required in accordance ith Mn-STD-SW ( see 3.1 harein). r 84186 3.8 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to eview the manufacturers facil ity and applicable required documentation. Offshore documentation hall be made available onshore at
34、 the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with ection 4 of MIL - M 38510 t o the extent specified in MIL-STO-883 (see 3.1 herein). 4.2 Screenin . onducte a-+ on a devices prior to quality confor
35、mance inspection. hall apply: a. Burn-in test, method 1015 of MIL-STD-883. (i) (2) TA = +125C, minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer
36、. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be The following additional criteria Test condition A, B, C, or D using the circuit submitted with the certificate of compl i ance ( see 3.5 herein) . b. 4.3 Quality conformance inspection. Quality conformance inspection s
37、hall be in accordance with Ithod SOOS of MIL-STD-g83 including groups A, B, C, and D inspections. riteria shall apply. The following additional 4.3.1 a. b. C. d. 4.3.2 a. b. Group A inspection. Tests shall be as specified in table II herein. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 s
38、hall be omitted. Subgroup 4 CI, CI, and Co measurements) shall be measured only for the initial test and after process or design changes which may affect capacitance. A minimum sample sire of 5 devices with zero rejects shall .be required. Subgroups 7 and 8 functional testing shall include verificat
39、ion of instruction set. These tests form a part of the manufacturers test tape and shall be maintained and available from approved sources of supply. Groups C and D inspections. End-point electrical parameters shall be as specified in table II herein. Steady-state life test, method 1005 of MIL-STD-8
40、83 conditions: (1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.5 herein). (2) TA = +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking perm
41、itted without license from IHS-,-,-TABLE II. Electrical test requirements. u grou s I MIL-STD-883 test requirements I (:e: metRod i I I 5005, table I) I I I I I Interim electrical parameters I - I (method 5004) I 1 I IFinal electrical test parameters I 1*,2,3,7,9 I I (method 5004) I I I I 1,2,3,4,7,
42、8 9 I IGroup A test requirements I (method 5005) I 10,11* I I I I I Groups C and D end-point I electrical parameters 1 (method 5005) I * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. I 1 1s2*3 - Terms Definitions Interrupt en
43、able in (input, active high). When this line is active, the PIO is able to interrupt the CPU. Interrupt enable out (output, active high). This output is high only if IEI is high and the CPU is not servicing an interrupt from this PIO. In conjunction with IEI, this line can be used to implement a sys
44、tem-wide interrupt priority daisy chain. Port A bus (bidirectional, tristate). This 8 bit bus is used to transfer data or status or control information between port A of the PIO and a peripheral device. AO is the least significant bit. IEI I EO AO-A7 SIZE A 84186 STANDARDIZED MILITARY DRAWING DEFENS
45、E ELECTRONICS SUPPLY CENTER REWSiN LEVEL SHEET i DAYTON, 01.110 45444 C 21 t u s. GOVERNMENT PRINTINQ OFFICE. 19(lbsm-517 DESC FORM 193A SEP 87 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-M-3m. I l 6. NOTES 6.1 Intended use. Microcircuits conforming to
46、this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for OEM application. by this drawing has been qualified for listing on QPL-38510, the device specified herein will be inactivated and w
47、ill not be used for new design. The QPL-38510 product shall be the preferred item for al 1 applications. covered by a contractor-prepared specification or drawing. When a military specification exists and the product covered 6.2 Replaceability. Microcircuits covered by this drawing will replace the
48、same generic device 6.3 Comments. 6.4 Terms and definitions. The abbreviations, terms, symbols, and definitions used herein Comments on this drawing should be directed to DESC-ECS, Dayton, Ohio 45444, or telephone 513-296-5375. (including terms and symbols for device terminals) are defined in MIL-M-38510, MIL-STD-1331, and as fol 1 ows: Provided by IHSNot for ResaleNo reproduction or networking permitted without lic
