1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes according to NOR 5962-R029-92. thn 91-11-22 Mionica L. Poelking B Changes according to NOR 5962-R130-93. tvn 93-04-12 Thomas M. Hess C Add package CDFP4-F16. Change document to current electronic format. Editorial changes throughout. les
2、98-02-04 Raymond Monnin D Figure 4 modified to be consistent with Table I. ljs 98-08-12 Raymond Monnin E Correct truth table. les 01-09-12 Raymond Monnin F Update drawing to current requirement. Editorial changes throughout. - gap 09-01-23 Robert M. Heber The original first sheet of this drawing has
3、 been replaced. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS
4、DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, QUAD 2-INPUT AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-03-03 AND GATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-87504 SHEET 1 OF 13 DSCC FO
5、RM 2233 APR 97 5962-E362-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. Th
6、is drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87504 01 E X Drawing number Device type (see 1.2.1)
7、Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H504 Quad 2-input AND gate 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Ou
8、tline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package X CDFP4-F16 16 Flat package 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute m
9、aximum ratings. Supply voltage range (VEE) . -8.0 V dc to 0.0 V dc Input voltage range . -5.2 V dc to 0.0 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +165C Maximum power dissipation (PD) 250 mW Thermal resistance, juncti
10、on-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Supply voltage range (VCC . -0.02 V dc to 0.02 V dc or 1.98 V dc to 2.02 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum high level inp
11、ut voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) . -1.950 V Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS
12、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the
13、issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Sta
14、ndard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Docume
15、nt Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws
16、 and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a
17、 Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with
18、 MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification
19、 mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines
20、shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and swi
21、tching waveforms. Test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature
22、range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
23、CUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer
24、s PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices
25、 built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a
26、manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and
27、 the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change t
28、hat affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1
29、 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional
30、 criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
31、 specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tes
32、ts prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5
33、DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, 2 and X Quiescent tests 1/ VIHVIL-0.780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output volta
34、ge VOHOutputs terminated through 100 to -2 V, -0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0.650 High level thre
35、shold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLA-1.160 -1.510 3 -1.950 -1.610 V 1 -35 Power supply drain current 4/ IEEVEE= -5.46 V, VCC= 0.0 V, VIH= -0.780 V at +25C 2, 3 -39 mA 1, 2 265 High
36、 level input current IIH1-0.650 V at +125C -0.840 V at -55C A1, B2, A3,and B4 3 425 A 1, 2 220 IIH2B1, A2, B3,and A4 3 350 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0.3 A Functional test See 4.3.1c 7 See footnotes at end of table. Provided by IHSNot for ResaleNo
37、 reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditio
38、ns -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F and X Rapid tests 3/ VIHVIL-0.791 -1.950 1 -1.020 -0.791 -0.662 -1.950 2 -0.871 -0.662 High level output voltage VOHOutputs terminated through 100 to -2 V, -0.852 -1.950 3 -1.071 -0.852 V -0.791 -1.950 1 -1.9
39、50 -1.583 -0.662 -1.950 2 -1.950 -1.568 Low level output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.852 -1.950 3 -1.950 -1.614 V -1.120 -1.483 1 -1.020 -0.791 -0.971 -1.469 2 -0.871 -0.662 High level threshold output voltage VOHA-1.171 -1.514 3 -1.071 -0.852 V -1.120 -1.483 1 -1.950 -1.583 -0.971 -1.4
40、69 2 -1.950 -1.569 Low level threshold output voltage VOLA-1.171 -1.514 3 -1.950 -1.614 V 1 -34 Power supply drain current 4/ IEEVEE= -5.46 V, VCC= 0.0 V, VIH= -0.791 V at +25C 2, 3 -38 mA 1, 2 250 High level input current IIH1-0.662 V at +125C -0.852 V at -55C A1, B2, A3,and B4 3 410 A 1, 2 520 IIH
41、2B1, A2, B3,and A4 3 835 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0.3 A Functional test See 4.3.1c 7 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
42、IZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max Case 2 Rapid test
43、s 3/ VIHVIL-0.796 -1.950 1 -1.024 -0.796 -0.667 -1.950 2 -0.876 -0.667 High level output voltage VOHOutputs terminated through 100 to -2 V, -0.857 -1.950 3 -1.076 -0.857 V -0.796 -1.950 1 -1.950 -1.585 -0.667 -1.950 2 -1.950 -1.571 Low level output voltage VOLVCC= 0.0 V, VEE= -5.2 V 2/ -0.857 -1.950
44、 3 -1.950 -1.615 V -1.124 -1.485 1 -1.024 -0.796 -0.976 -1.470 2 -0.876 -0.667 High level threshold output voltage VOHA-1.176 -1.515 3 -1.076 -0.857 V -1.124 -1.485 1 -1.950 -1.585 -0.976 -1.471 2 -1.950 -1.571 Low level threshold output voltage VOLA-1.176 -1.515 3 -1.950 -1.615 V 1 -34 Power supply
45、 drain current 4/ IEEVEE= -5.46 V, VCC= 0.0 V, VIH= -0.796 V at +25C 2, 3 -38 mA 1, 2 250 High level input current IIH-0.667 V at +125C -0.857 V at -55C A1, B2, A3,and B4 3 410 A 1, 2 205 B1, A2, B3,and A4 3 335 A 1, 3 0.5 Low level input current IILVEE= -4.94 V, VIL= -1.950 V, VCC= 0.0 V 2 0.3 A Fu
46、nctional test See 4.3.1c 7 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87504 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234
47、 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, 2 and X AC tests 9 0.30 1.50 10 0.60 1.65 Transition time tTLH, tTHLVEE= -2.94 V, VCC= 2.0 V, CL 5 pF, 11 0.30 1.40 ns
48、 9 0.50 1.70 10 0.55 1.80 Propagation delay time, A, B to Y, Y tPHHRL= 100 See figure 4 11 0.40 1.55 ns 9 0.40 1.60 10 0.45 1.75 tPLL11 0.40 1.60 ns 9 0.40 1.40 10 0.45 1.75 PLH11 0.40 1.40 ns 9 0.55 1.90 10 0.45 1.90 tPHL11 0.40 1.70 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 50
