1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R263-92. 92-08-31 M. A. Frye B Incorporate rev. A NOR. Update drawing to reflect current requirements. drw 03-09-29 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET RE
2、V STATUS REV B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Marcia B. Kelleher DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEP
3、ARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, 8-CHANNEL LATCHABLE MULTIPLEXER, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-06-13 SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-87689 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E554-03 DISTRIB
4、UTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET
5、2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87689
6、01 V A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 DG528 8-channel latchable multiplexer 1.2.2 Case outline. The case outline are as
7、 designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style V GDIP1-T18 or CDIP2-T18 18 dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage between V+ and V- . 44 V dc
8、 Supply voltage between V- and GND 25 V dc Digital inputs between VS, VD, and V- -2 V to (V+ + 2 V) or 20 mA Current (any terminal except S or D) . 30 mA Continuous current, S or D 20 mA Peak current, S or D (Pulsed at 1 ms, 10 percent duty cycle maximum) 40 mA Thermal resistance, junction to ambien
9、t (JA) . +75C/W Thermal resistance, junction to case (JC). See MIL-STD-1835 Storage temperature -65C to +150C Lead temperature (soldering, 60 seconds) +300C Power dissipation (PD) . 900 mW Derate 12 mW/C above TA= +75C 1.4 Recommended operating conditions. Ambient operating temperature (TA) -55C to
10、+125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government speci
11、fication, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Stand
12、ards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Elec
13、tronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Ord
14、er Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and r
15、egulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Quali
16、fied Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-P
17、RF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark
18、in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be
19、 in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Timing diagrams. The timing diagrams shall be as specified on figure 3. Provided by IHSNot for ResaleN
20、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, t
21、he electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are describ
22、ed in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages where marking of the entire SMD PIN nu
23、mber is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “
24、C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDB
25、K-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of co
26、nformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent,
27、 and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedu
28、res shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MI
29、L-STD-883. (1) Test condition A, C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation,
30、as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of th
31、e manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance ch
32、aracteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxAnalog signal range VANALOG1, 2, 3 01 -15 +15 V Drain-source “ON” resistance RDS(ON)VD= 10 V, VAL= 0.8 V, IS= -200 A, VAH= 2.4 V, 1 01 400 Sequence each switch ON 2, 3 5
33、00 Source “OFF” leakage current IS(OFF)VS= 10 V, VD= 10 V, VEN= 0 V 1 01 -1 +1 nA 2, 3 -50 +50 Drain “OFF” leakage current ID(OFF)VS= 10 V, VD= 10 V, VEN= 0 V 1 01 -10 +10 nA 2, 3 -200 +200 Drain “ON” leakage current ID(ON)VS= (all) = VD= 10 V, VAL= 0.8 V, VAH= 2.4 V, 1 01 -10 +10 nA 2/ Sequence eac
34、h switch ON 2, 3 -200 +200 Logic input current, input voltage high IAHVA= 2.4 V 1 01 -10 A 2, 3 -30 VA= 15 V 1 +10 2, 3 +30 Logic input current, input voltage low IALVEN=0 V, 2.4 V, RS = 0 V, 1 01 -10 A VA(all) = 0 V 2, 3 -30 Positive supply current ICC+ VEN=0 V, VA(all) = 0 V 1 01 2.5 mA 2, 3 4 Neg
35、ative supply current ICC- VEN=0 V, VA(all) = 0 V 1 01 -1.5 mA 2, 3 -4 Functional test See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER
36、 COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxSwitching time tTHL, tTLHSee figure 3 9
37、01 1 s 10, 11 1.5 Enable and write turn ON time tON(EN, WR ) See figure 3 9 01 1 s 10, 11 1.5 Enable and reset turn OFF time tOFF(EN, RS ) See figure 3 9 01 1 s 10, 11 1.5 1/ V+ = 15 V, V- = -15 V, GND = 0 V, WR = 0 V, RS = 2.4 V; period of reset ( RS ) pulse must be at least 50 s during or after po
38、wer ON. 2/ ID(ON)is leakage from driver into “ON” switch. Device type 01 Case outline V Terminal number Terminal symbol 1 WR 2 A03 EN4 V- 5 S16 S27 S38 S49 D10 S811 S712 S613 S514 V+ 15 GND 16 A217 A118 RS FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking per
39、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 A2A1A0EN WR RS On Switch X X X X g66g3475 1 Maintains previous switch condition X X X X X 0 None (latches cleare
40、d) X X X 0 0 1 None 0 0 0 1 0 1 1 0 0 1 1 0 1 2 0 1 0 1 0 1 3 0 1 1 1 0 1 4 1 0 0 1 0 1 5 1 0 1 1 0 1 6 1 1 0 1 0 1 7 1 1 1 1 0 1 8 FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689
41、 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Transition time and test circuit. FIGURE 3. Timing diagrams. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
42、 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 Enable tON/tOFFtime. FIGURE 3. Timing diagrams - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW
43、ING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 Write turn-on time tON( WR ). FIGURE 3. Timing diagrams - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA
44、RD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 11 DSCC FORM 2234 APR 97 Reset turn-off time tOFF( RS ). FIGURE 3. Timing diagrams - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen
45、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87689 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL B SHEET 12 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table
46、 I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10*, 11* Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subg
47、roups 10 and 11, if not tested, shall be guaranteed to the limits specified in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply
48、. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control
