1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. drw 05-12-29 Raymond Monnin REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Rajesh Pithadia DEFENSE SUP
2、PLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Rajesh Pithadia COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, QUADRUPLE BUS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL
3、 DATE 98-05-28 TRANSCEIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-88512 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E159-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8851
4、2 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case out
5、lines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 88512 01 Q E A Federal stock class designator
6、 RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RH
7、A designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number
8、 Circuit function 01 55138 Quadruple bus transceiver 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compli
9、ant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline is as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or
10、 CDIP2-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
11、IZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC) 2/ 7 V Input voltage (VIN) . 5.5 V Driver off-state output voltage. 7 V Low-level output current into the driver output 150 m
12、A Continuous total power dissipation (PD) 1375 mW 3/ Storage temperature range. -65C to +125C Lead temperature 1.6 mm (1/16 inch) from case for 60 seconds 300C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V to 5.5 V High-level input voltage (VIH): Driver or strobe 2 V minim
13、um Receiver 3.2 V minimum Low-level input voltage (VIL): Driver or strobe 0.8 V maximum Receiver 1.5 V maximum High-level output current, (IOH): Receiver output . -400 A Low-level output current (IOL): Driver output 100 mA Receiver output . 16 mA Ambient operating temperature range (TA) . -55C to +1
14、25C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contr
15、act. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBO
16、OKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Buildi
17、ng 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exempt
18、ion has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ All voltage values are with respect to both ground terminals connected together. 3/ For operati
19、on above TA= 25C, the derating factor for case E is 11.0 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM
20、 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect
21、the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physic
22、al dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as speci
23、fied on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Logic diagram. The block or logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electri
24、cal performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests fo
25、r each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of
26、 not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/com
27、pliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance
28、 shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 he
29、rein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-3
30、8535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change
31、for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquir
32、ing activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall
33、 be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSC
34、C FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput clamp voltage Driver or strobe VIKVCC= 4.5 V, IIN= -12 mA 1, 2, 3 01 -1.5 V High-level output voltage Receiver VO
35、HVCC= 4.5 V, VIH(S)= 2 V, VIL(R)= 1.5 V, IOH= -400 A 1, 2, 3 01 2.4 V Low-level output voltage Driver VOLVCC= 4.5 V, VIH(D)= 2 V, VIL(S)= 0.8 V, IOL= 100 mA 1, 2, 3 01 0.45 V Receiver VCC= 4.5 V, VIH(R)= 3.2 V, VIH(S)= 2 V, IOL= 16 mA 0.4 Input current at maximum input voltage Driver or strobe II(ma
36、x)VCC= 5.5 V, VIN= VCC1, 2, 3 01 1 mA High -level input current Driver or strobe IIHVCC= 5.5 V, VIN= 2.4 V 1, 2, 3 01 40 A Receiver VCC= 5 V, VIN(R)= 4.5 V, VIN(S)= 2 V 300 Low-level input current Driver or strobe IILVCC= 5.5 V, VIN= 0.4 V 1, 2, 3 01 -1.6 mA Receiver VCC= 5 V, VIN(R)= 0.45 V, VIN(S)
37、= 2 V -50 A Input current with power off Receiver II(off)VCC= 0 V, VIN= 4.5 V 1, 2, 3 01 1.5 mA Short-circuit output current 2/ Receiver IOSVCC= 5.5 V 1, 2, 3 01 -20 -55 mA Input clamp voltage Driver or strobe VIKVCC= 4.5 V, IIN= -12 mA 1, 2, 3 01 -1.5 V High-level output voltage Receiver VOHVCC= 4.
38、5 V, VIH(S)= 2 V, VIL(R)= 1.5 V, IOH= -400 A 1, 2, 3 01 2.4 V Supply current All driver outputs low ICCVCC= 5.5 V, VIN(D)= 2 V, VIN(S)= 0.8 V 1, 2, 3 01 65 mA All driver outputs high VCC= 5.5 V, VIN(R)= 3.5 V, VIN(S)= 2 V, Receiver outputs open 55 See footnotes at end of table. Provided by IHSNot fo
39、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbo
40、l Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxFunctional test 3/ See 4.4.1b 7, 8A, 8B 01 L H Propagation delay time from driver to driver tPLHRL= 50, CL= 50 pF See figure 4 9 01 24 ns tPHL24 Propagation delay time from strobe to driver tPLHRL=
41、 50, CL= 50 pF See figure 4 9 01 28 ns tPHL32 Propagation delay time from receiver to receiver tPLHRL= 400, CL= 15 pF See figure 4 9 01 15 ns tPHL15 1/ Parenthetical letters D, R, and S used with VINrefer to the driver input, receiver input, and strobe input, respectively. 2/ Not more than one outpu
42、t should be shorted at a time. 3/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic patterns used for fault detection. The test vectors used to verify the truth table shall, at a minimum, test all functions of each input and ou
43、tput. All possible input to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 2 herein. Functional tests shall be performed in sequence as approved by the qualifying activity on qualified devices Provided by IHSNot for ResaleNo reproduction or networ
44、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline E Terminal number Terminal symbol 1 GND 2 1B 3 1R 4 1D 5 2D 6 2R 7 2B 8 GND
45、9 3B 10 3R 11 3D 12 S 13 4D 14 4R 15 4B 16 VCCFIGURE 1. Terminal connections. TRANSMITTING INPUTS OUTPUTS S D B R L H L H L L H L RECEIVING INPUTS OUTPUTS S B D R H H X L H L X H H = High level, L = Low level, X = Dont care FIGURE 2. Truth tables. Provided by IHSNot for ResaleNo reproduction or netw
46、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without
47、license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Notes: 1. Input pulses are supplied by generators having the following characteristics: tw= 100 ns, PRR 1 MHz, tr 10 ns, tf 10
48、ns, ZO 50. 2. CLincludes probe and jig capacitance. 3. When testing driver input (solid line) strobe must be low; when testing strobe input (dashed line) driver input must be high. FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88512 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM
