1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Add vendor CAGE 75569. Add device type 02. Technical andeditorial changes throughout.91-08-05 M. A. FryeREV SHEETREVSHEETREV STATUSOF SHEETSREV AAAAAAAAAAAAASHET 1234567891011213PMIC N/APREPARED BY Marcia B. KelleherDEFENSE ELECTRONICS SUPPLY CENTER
2、 DAYTON OHIO 45444 STANDARDIZEDMILITARYDRAWINGTHIS DRAWING IS AVAILABLEFOR USE BY ALL DEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAMSC N/ACHECKED BYRay MonninMICROCIRCUIT, FAST, CMOS, OCTALTRANSCEIVER/REGISTER, MONOLITHIC SILICONAPPROVED BYMichael A. FryeDRAWING APPROVAL DATE22 MARCH 1989SIZE
3、ACAGE CODE672685962-88775REVISION LEVELASHEET 1 OF 13DESC FORM 193SEP 87 5962-E1710DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE EL
4、ECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET2DESC FORM 193ASEP 871. SCOPE1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JA
5、N devices“.1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following example:5962-88775 01 L X G0D G0D G0D G0D G0D G0D G0D G0DG0D G0D G0D G0D Drawing number Device type Case outline Lead finish per(1.2.1) (1.2.2) MIL-M-385101.2.1 Device type(s). The device type(s) sha
6、ll identify the circuit function as follows:Device type Generic number Circuit function 01 54FCT646 Octal, three-state, bus transceiver/receiver02 54FCT646A Octal, three-state, bus transceiver/receiver1.2.2 Case outline(s). The case outline(s) shall be as designated in appendix C of MIL-M-38510, and
7、 as follows:Outline letter Case outlineK F-6 (24-lead, .640“ x .420“ x .090“), flat packageL D-9 (24-lead, 1.280“ x .310“ x .200“), dual-in-line package3 C-4 (28-terminal, .460“ x .460“ x .100“), leadless square chip carrier package 1.3 Absolute maximum ratings. 1/Supply voltage -0.5 V dc to +7.0 V
8、dcInput voltage range 2/ -0.5 V dc to V + 0.5 V dcCCOutput voltage range 2/. -0.5 V dc to V + 0.5 V dcCCDC input diode current (I ) -20 mAIKDC output diode current (I ) -50 mAOKDC output current . 100 mAMaximum power dissipation (P ) 3/ . 0.5 WDThermal resistance, junction-to-case (G14 ) . See MIL-M
9、-38510, appendix CJCStorage temperature range -65G28C to +150G28CJunction temperature (T ) . +175G28CJLead temperature (soldering, 10 seconds) +260G28C1/ All voltages referenced to GND.2/ For V 6.5 V dc, the upper bound is limited to V .CC CC3/ Must withstand the added P due to short circuit test; e
10、.g., I .DOSProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET3DESC FORM 193ASEP 871.4 Recommended operating conditions.Supply voltage rang
11、e (V ) . +4.5 V dc minimum to +5.5 V dc maximumCCMaximum low level input voltage (V ) 0.8 V dcILMinimum high level input voltage (V ) . 2.0 V dcIHCase operating temperature (T ) . -55G28C to +125G28CCMinimum setup time, bus to clock (t ) 4.5 nssMinimum hold time, bus to clock (t ) . 2.0 nshMinimum p
12、ulse width (t ) . 6.0 nsw2. APPLICABLE DOCUMENTS2.1 Government specification, standard, and bulletin. Unless otherwise specified, the following specification, standard, andbulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in theso
13、licitation, form a part of this drawing to the extent specified herein.SPECIFICATIONMILITARYMIL-M-38510 - Microcircuits, General Specification for.STANDARDMILITARYMIL-STD-883 - Test Methods and Procedures for Microelectronics.BULLETINMILITARYMIL-BUL-103 - List of Standardized Military Drawings (SMDs
14、).(Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functionsshould be obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this
15、drawing and the references cited herein, the text ofthis drawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for theuse of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as
16、specified herein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified inMIL-M-38510 and herein.3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2.3.2.2 Terminal connections. The terminal connections shall be
17、as specified on figure 1.3.2.3 Truth table. The truth table shall be as specified on figure 2.3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE
18、 ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET4DESC FORM 193ASEP 87TABLE I. Electrical performance characteristics.Test Symbol Conditions-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunless otherwise specifiedDeviceTypeGroup AsubgroupsLimits UnitMin MaxHigh level outp
19、utvoltageVOH1V = 4.5 VCCV = 0.8 VILV = 2.0 VIHI OH= -300 AAll 1, 2, 3 4.3 VVOH2IOH= -12 mAAll 1, 2, 3 2.4Low level output voltage VOL1V = 4.5 VCCV = 0.8 VILV = 2.0 VIHIOL= 300 AAll 1, 2, 3 0.2 VVOL2IOL= 48 mAAll 1, 2, 3 0.55Input clamp voltage VIKV = 4.5 V,CCI = -18 mAINAll 1 -1.2 VHigh level input
20、current(except I/O pins)IIH1V = 5.5. V,CCV = 5.5 VINAll 1, 2, 3 5 Alow level input current(except I/O pins)IIL1V = 5.5. V,CCV = GNDINAll 1, 2, 3 -5 AHigh level input currentfor common I/O pinsIIH2V = 5.5. V,CCV = 5.5 VINAll 1, 2, 3 15 ALow level input currentfor common I/O pinsIIL2V = 5.5. V,CCV = G
21、NDINAll 1, 2, 3 -15 AShort circuit outputcurrentIOSV = 5.5 V 1/CCV = GNDOUTAll 1, 2, 3 -60 mAQuiescent powersupply (CMOS inputs)ICCQV G06 0.2 VINor V G07 5.3 VINV = 5.5 V,CCf = 0.0 MHzIAll 1, 2, 3 1.5 mAQuiescent power supplycurrent (TTL inputshigh)G0CICCV = 5.5 V,CCV = 3.4 V 2/INAll 1, 2, 3 2.0 mAS
22、ee footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET5DESC FORM 193ASEP 87TABLE I. Electrical performance charac
23、teristics - Continued.Test Symbol Conditions 1/ 2/-55G28C G06 T G06 +125G28CCV = 5.0 V dc 10%CCunless otherwise specifiedDeviceTypeGroup AsubgroupsLimits UnitMin MaxDynamic powersupply currentICCDV = 5.5 V,CCoutputs open,DIR = GG07 = GND,out bit toggling- 50% duty cycle,V G07 5.3 VINor V G06 0.2 VIN
24、All 3/0.25mA/MHzTotal power supply 4/currentICCV = 5.5 V,CCf = 10 Mhz,Ione bit toggling- 50% dutycycle, DIR = GG07 =GNDV G07 5.3 VINor V ING06 0.2 VAll 1, 2, 3 4.0 mAV G07 3.4 VINor V = GNDIN6.0Functional tests See 4.3.1c All 7, 8Input capacitance CINSee 4.3.1d All 4 10 pFOutput capacitance COUTSee
25、4.3.1d All 4 12 pFPropagation delaytime, Bus to Bust,PLH1tPHL1C = 50 pFLR = 500G36LSee figure 45/01 9, 10, 11 1.0 11.0 ns02 1.0 7.7Propagation delaytime, Clock to BUSt,PLH2tPHL201 9, 10, 11 1.0 10.0 ns02 1.0 7.0Propagation delaytime, SBA to BUS,SAB to BUSt,PLH3tPHL301 9, 10, 11 1.0 12.0 ns02 1.0 8.4
26、Output enable time,Enable to Bus andDIR to A or Bt,PZHtPZL01 9, 10, 11 1.0 15.0 ns02 1.0 10.5Output disable time,GG07 to Bus andDIR to Bust,PHZtPLZ01 9, 10, 11 1.0 11.0 ns02 1.0 7.7See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
27、 IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET6DESC FORM 193ASEP 87TABLE I. Electrical performance characteristics - Continued.1/ Not more than one output should be shorted at one time, and the duration of the short circuit
28、condition should not exceed 1 second.2/ TTL driven inputs, V = 3.4 V; all other inputs at V or GND.IN CC3/ This parameter is not directly testable, but is derived for use in total power supplycalculations.4/ I = I + (G0CI x D x N ) + I (f + f x N )CC CCQ CC H T CCD CP I IG072G07where: D = Duty cycle
29、 for TTL inputs highHN = Number of TTL inputs at DTHf = Input frequency in MHZIN = Number of inputs at fII5/ Minimum limits shall be guaranteed if not tested to the specified limits in table I.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance c
30、haracteristics are asspecified in table I and shall apply over the full (case orambient) operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are described in table I.3.5 Mar
31、king. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listedin 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).3.6 Certificate of compliance. A certificate of compliance shall be requi
32、red from a manufacturer in order to be listed as anapproved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-ECS prior tolisting as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see3.1
33、herein) and the requirements herein.3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be providedwith each lot of microcircuits delivered to this drawing.3.8 Notification of change. Notification of change to DESC-ECS shall be required in a
34、ccordance with MIL-STD-883 (see 3.1herein).3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturersfacility and applicable required documentation. Offshore documentation shall be made available onshore at the option of thereviewer.4. QU
35、ALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with section 4 of MIL-M-38510 tothe extent specified in MIL-STD-883 (see 3.1 herein).4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducte
36、d on all devicesprior to quality conformance inspection. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D using the circuit submitted with the certificate of compliance (see 3.6 herein).(2) T = +125G28C, minimum.AProvided by I
37、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET7DESC FORM 193ASEP 87Device type 01 AND 02Case outlines K, L 3Terminal number Terminal symbol12345678
38、910111213141516171819202122232425262728CPABSABDIRA1A2A3A4A5A6A7A8GNDB8B7B6B5B4B3B2B1GG07SBACPBAVCC-NCCPABSABDIRA1A2A3NCA4A5A6A7A8GNDNCB8B7B6B5B4B3NCB2B1GG09SBACPBAVCCPin names DescriptionA1 - A8 Data register A inputsData register B outputsB1 - B8 Data register B inputsData register A outputsCPAB,CP
39、BAClock pulse inputsSAB, SBA Transmit/receive inputsDIR, GG07 Output enable inputsFIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-
40、88775REVISION LEVELASHEET8DESC FORM 193ASEP 87Inputs Data I/O OperationGG07 DIR CPAB CPBA SAB SBA A1 - A8 B1 - B8HHXXH or LG62H or LG62XXXXInput Input IsolationStore A and B dataLLLLXXXH or LXXLHOutput Input Real time B datato A BusStored B data to A BusLLHHXH or LXXLHXXInput Output Real time A data
41、to B BusStored A data to B BusL = Low voltage levelH = High voltage levelX = IrrelevantG62 = Low-to-high transitionFIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYT
42、ON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET9DESC FORM 193ASEP 87FIGURE 3. Logic diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVEL
43、ASHEET10DESC FORM 193ASEP 87NOTES:1. Diagram shown for input control enable, low and input control disable, high.2. Pulse generator for all pulses: t G06 2.5 ns; t G06 2.5 ns.fr3. The outputs are measured one at a time with one transition per measurement.FIGURE 4. Switching waveforms and test circui
44、ts.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET11DESC FORM 193ASEP 87Definitions:R = Load resistor see ac characteristics for value.
45、LC = Load capacitance includes jig and probe capacitance:LSee ac characteristics for values.R = Termination should be equal to Z of pulse generators.T OUTFIGURE 4. Switching waveforms and test circuit - Continued.Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
46、om IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-88775REVISION LEVELASHEET12DESC FORM 193ASEP 87TABLE II. Electrical test requirements.MIL-STD-883 test requirementsSubgroups(per method5005, table I)Interim electrical parameters(method 5004)- - -Fina
47、l electrical test parameters(method 5004)1*, 2, 3, 7,8, 9, 10, 11Group A test requirements(method 5005)1, 2, 3, 4, 7,8, 9, 10,11Groups C and D end-pointelectrical parameters(methgod 5005)1, 2, 3* PDA applies to subgroup 1.b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parametertests prior to burn-in are optional at the discretion of the manufacturer.4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883including groups
