1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE 31757. Change table II. Update document. Editorial changes throughout. 93-01-19 K. A. Cottongim B Make corrections to figure 4. Add case outlines X and Y. Rewrite entire document. 93-08-04 K. A. Cottongim C Changes in accordance w
2、ith NOR 5962-R036-94. 93-11-12 K. A. Cottongim D Added class K devices as device types 03 and 04. Redrew entire document. -sld 98-06-19 K. A. Cottongim E Updated drawing to reflect the current requirements of MIL-PRF-38534. -sld 03-05-15 Raymond Monnin F Updated drawing. -gz 09-04-21 Joseph D. Roden
3、beckTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Donald R. Osborne COLUM
4、BUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGH SPEED, DUAL CHANNEL, OPTOCOUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 89-12-05 AMSC N/A REVISION LEVEL F SIZE
5、A CAGE CODE 67268 5962-89571 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E285-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SH
6、EET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice o
7、f radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: For class H devices: 5962-89571 01 P X Drawing number Device type Case outline Lead finish (see 1.2.2) (see 1.2.4) (see 1.2.5) For class K devices: 5962 - 89571 03 K P X Feder
8、al RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA leve
9、ls and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HCPL-5431, 66115-103 Dual channel optocoupler with common supply voltag
10、e and ground connections 02 HCPL-6431, 66136-001 Dual channel optocoupler with separate supply voltage and ground connections 03 HCPL-543K, 66115-301 Dual channel optocoupler with common supply voltage and ground connections 04 HCPL-643K, 66136-301 Dual channel optocoupler with separate supply volta
11、ge and ground connections 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listin
12、g (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non
13、-space high reliability devices are required. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 G Re
14、duced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Gro
15、up A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that
16、 the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in
17、 MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3
18、 Absolute maximum ratings. 1/ Supply voltage range (VCC) 0.0 V dc to 7.0 V dc Average forward current (IFAVG) 10 mA Peak forward current (IFPK) 20 mA 2/ Reverse input voltage (VR) . 3.0 V dc Average output current (IO). 25 mA Output voltage range (VO). -0.5 V dc to +10 V dc Power dissipation (PD): E
19、ach channel 130 mW Total package 400 mW Storage temperature range. -65C to +150C Lead temperature (soldering, 10 seconds). +260C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC): Case outlines P and 2 . See MIL-STD-1835 Case outlines X and Y. 28C/W Case temperature +170C 1
20、.4 Recommended operating conditions. Supply voltage range (VCC). +4.75 V dc to +5.25 V dc High level input current range (IF(ON) 6.0 mA to 10 mA Low level input voltage (VF(OFF) 0.7 V dc maximum Ambient operating temperature range (TA). -55C to +125C 1/ Stresses above the absolute maximum ratings ma
21、y cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Peak forward input current pulse width 50 s at 5.0 percent duty factor. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
22、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
23、of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883
24、- Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at htt
25、p:/assist.daps.dla.mil/quicksearch/ from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes preced
26、ence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compl
27、iance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the perfor
28、mance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construc
29、tion, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Positive logic truth table(
30、s). The positive logic truth table(s) shall be as specified on figure 3. 3.2.4 Propagation delay time test circuit and waveform. The test circuit for propagation delays shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
31、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in tabl
32、e I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shal
33、l be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein s
34、hall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be
35、 maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compli
36、ance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered t
37、o this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described
38、herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteri
39、stics. Limits Test Symbol Conditions 1/ -55C TC +125C 4.75 V dc VCC 5.25 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Logic low output voltage 2/ VOLIOL= 8.0 mA 1,2,3 All 0.5 V Logic high output voltage 2/ VOHIOH= -4.0 mA 1,2,3 All 2.4 V Output leakage current 2/ IOHHVO
40、= 5.25 V, VF= 0.7 V 1,2,3 All 100 A 01,03 52 ICCLVCC= 5.25 V, IF= 10 mA 1,2,3 02,04 26 mA 01,03 52 Supply current 3/ ICCHVCC= 5.25 V, VF= 0.7 V 1,2,3 02,04 26 mA Input forward voltage 2/ VFIF= 10 mA 1,2,3 All 1.0 1.85 V Input reverse breakdown voltage VRIR= 10 A 1,2,3 All 3.0 V Input-output insulati
41、on 4/ leakage current II-ORelative humidity = 45%, t = 5.0 s, VI-O= 1500 V dc TA= +25C 1 All 1.0 A Logic high common mode transient immunity 2/ 5/ 6/ CMH VCM= 50 VP-P, IF= 0 mA 9,10,11 All 500 V/s Logic low common mode transient immunity 2/ 5/ 6/ CML VCM= 50 VP-P, IF= 6.0 mA 9,10,11 All 500 V/s Prop
42、agation delay time to high to low level output 2/ tPHLSee figure 3 9,10,11 All 60 ns Propagation delay time to low to high level output 2/ tPLHSee figure 3 9,10,11 All 60 ns Pulse width distortion 2/ PWD PWD = tPHL - tPLH9,10,11 All 35 ns 1/ 0.0 V VF(OFF) 0.7 V, 6.0 mA IF(ON) 10.0 mA, unless otherwi
43、se specified. 2/ Applies to each channel. 3/ ICCLand ICCH: Device types 01 and 03 limit applies to both channels, device types 02 and 04 limit applies to each channel. 4/ This is a momentary withstand test, not an operating condition. Device types 01 and 03 are tested with pins 1 trough 4 shorted to
44、gether and pins 5 trough 8 shorted together. Device types 02 and 04 are tested with terminals 1, 2, 3, 19, and 20 shorted together and terminals 7 through 15 shorted together. 5/ CMHis the maximum rate of rise of the common voltage that can be sustained with the output voltage in the logic high stat
45、e (i. e., VOUT 2.0 V). CMLis the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (i.e., VOUT 0.8 V). 6/ Parameters shall be tested as part of device initial characterization and after process changes. Parameters shall be guaranteed
46、 to the limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89571 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET
47、7 DSCC FORM 2234 APR 97 Case outline X Symbol Millimeters Inches Min Max Min Max A 4.57 .180 A1 1.40 1.65 .055 .065 b 0.41 0.51 .016 .020 c 0.18 0.33 .007 .013 D 9.40 9.91 .370 .390 e 2.29 2.79 .090 .110 E 9.65 9.91 .380 .390 E1 8.13 .320 L 1.07 1.32 .042 .052 S 0.89 1.27 .035 .050 NOTES: 1. The U.S
48、. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Pin 1 is indicated by a dot marked on top of the package. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking pe
