1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes made in accordance with NOR 5962-R275-94. 94-09-14 K. A. Cottongim B Changes made in accordance with NOR 5962-R365-97. 97-06-19 K. A. Cottongim C Add device type 03, 04 and CAGE code 88379. Correct note 1 in table I. 98-01-15 K. A. Cotton
2、gim D Corrections to tables I and II. 98-05-14 K. A. Cottongim E Add device types 05 through 07. Add case outlines T and Z. Table I, IIHand IILtests with notes 4 and 6, reverse the minimum and maximum limits. Table I, IIHfor device types 01-04 with note 6 in the conditions column, change the minimum
3、 limit from -0.2 mA to -0.4 mA. Update drawing boilerplate. 02-03-13 Raymond Monnin F Paragraph 4.2 Screening: add subparagraphs 4.2.a.3 and 4.2.c for device types 05, 06, and 07, only. Table I, device types 05 through 07, change min/max test limits for VIH, VIL, IIH(3 places), IIL(3 places), and de
4、vice types 05 and 06, change max test limits for IEE(2 places each). 02-05-24 Raymond Monnin G Add device types 08 and 09. 06-03-28 Raymond Monnin H Updated drawing paragraphs. -sld 11-11-08 Charles F. Saffle J Add device type 10. Add Transceiver positive input supply voltage to paragraphs 1.3 and 1
5、.4. Table I: Condition for VOHand VOLfor device types 08-10, Change “IOL = Max” to “IOL = 8.0 mA”. Remove “IL” test and replace with “ICC1”. Add ICC2 ICC3tests. Remove both IEEtests and replace with IEE1- IEE8. Table I footnote 6/ change “Io” to “CIO” -gc 12-10-16 Charles F. Saffle REV SHEET REV J J
6、 J J J J J J J J J J SHEET 15 16 17 18 19 20 21 22 23 24 25 26 REV STATUS REV J J J J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRA
7、WING CHECKED BY Michael C. Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Gregory Lude MICROCIRCUIT, HYBRID, LINEAR, DUAL REDUNDANT REMOTE TERMINAL UNIT (RTU) DRAWING APPROVAL DATE 91-11-25 AMSC N/A REVISION LEVEL J SIZE A CAGE CODE 6
8、7268 5962-89798 SHEET 1 OF 26 DSCC FORM 2233 APR 97 5962-E488-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 2 DSCC FORM 2234 A
9、PR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to be processed in accordance with MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as
10、 shown in the following example: 5962-89798 01 X X Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 BUS65142, BUS65144 Dual r
11、edundant remote terminal unit (RTU) 02 BUS65143, BUS65145 Dual redundant remote terminal unit (RTU) 03 CT2542, CT2542-FP Dual redundant remote terminal unit (RTU) 04 CT2543, CT2543-FP Dual redundant remote terminal unit (RTU) 05 BU-65142X1 Dual redundant remote terminal unit (RTU), +5/-15 V transcei
12、ver 06 BU-65142X2 Dual redundant remote terminal unit (RTU), +5/-12 V transceiver 07 BU-65142X3 Dual redundant remote terminal unit (RTU), +5/+5 V transceiver 08 BU-63705X1 Dual redundant remote terminal unit (RTU), +5/-15 V transceiver 09 BU-63705X2 Dual redundant remote terminal unit (RTU), +5/-12
13、 V transceiver 10 BU-63705X3 Dual redundant remote terminal unit (RTU), +5/+5 V transceiver 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style T See figure 1 78 Dual-in-line, ceramic, stagger
14、ed pins X See figure 1 78 Dual-in-line, staggered pins Y See figure 1 82 Flat pack Z See figure 1 78 Flat pack 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Logic supply voltage (VL): Device types 01 through 07 5.5 V dc Device types 08, 0
15、9 and 10 6.5 V dc Transceiver, channels A and B, positive input supply voltage (+5 VLA, +5 VLB) Device types 8, 09, and 10 . 7.0 V dc Negative supply voltage (VEE) Device types 05, 06, 08, and 09 . -18.0 V dc Storage temperature -65C to +150C Thermal rise, case to junction(TJ): Device types 01 throu
16、gh 07 13.9C Device types 08, 09 and 10 7.55C Lead temperature (soldering, 10 seconds) +300C Power dissipation (TC= +125C) . Duty cycle dependent (see table I power supplies) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum lev
17、els may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 3 DSCC FORM 2234 APR 97 1.4 Rec
18、ommended operating conditions. Logic supply voltage (VL): Device types 01 through 06, 08, 09 and 10 +4.5 V dc to +5.5 V dc Device type 07 +4.75 V dc to +5.25 V dc Transceiver, channels A and B, positive input supply voltage (+5 VLA, +5 VLB) Device types 8, and 09 . 4.5 V dc to +5.5 V dc Device type
19、10 +4.75 V dc to +5.25 V dc Negative supply voltage (VEE): Device types 01, 03, 05, and 08 . -14.25 V dc to -15.75 V dc Device types 02, 04, 06, and 09 . -11.4 V dc to -12.6 V dc Maximum differential input voltage 40 Vp-p Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.
20、1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPE
21、CIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Mic
22、rocircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the eve
23、nt of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The indivi
24、dual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. T
25、he manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device fo
26、r the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal conn
27、ections and pin functions. The terminal connections and pin functions shall be as specified on figure 2. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 R
28、EVISION LEVEL J SHEET 4 DSCC FORM 2234 APR 97 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full
29、specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38
30、534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test
31、data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revisio
32、n level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original c
33、opy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered
34、 to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as describe
35、d herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control a
36、nd shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in
37、accordance with table I of method 1015 of MIL-STD-883. (3) Burn-in test shall be for 320 hours. (For device types 05 through 10, only.) b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at
38、 the discretion of the manufacturer. c. 100% Nondestructive bond pull test. (For device types 05 through 10, only.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798 DLA LAND AND MARITIME COLUMBUS, OHIO 4
39、3218-3990 REVISION LEVEL J SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Receiver Differential input impedance ZINdiff DC to 1 MHz 2/ 1,2,3 All 4 k Di
40、fferential input voltage VINdiff 2/ 1,2,3 All 40 Vp-p Input threshold VTHDirect coupled (across 35 load) 4,5,6 All 1.2 Vp-p Transformer coupled (across 70 load) 0.86 Common mode rejection ratio CMRR DC to 2 MHz 2/ 3/ 1,2,3 All 40 dB Common mode voltage CMV DC to 2 MHz 2/ 3/ 1,2,3 All -10 +10 V dc Tr
41、ansmitter Differential output voltage VOUT diff Direct coupled (across 35 load) 4,5,6 All 6.0 9.0 Vp-p Transformer coupled (across 70 load) 18.0 27.0 Output rise and fall time tr , tfTransformer coupled (across 70 load) 10 to 90 percent of full waveform peak to peak. In accordance with MIL-STD-1553.
42、 9,10,11 All 100 300 ns Output noise NOUTDirect coupled 4,5,6 01-07 5 mV RMS Transformer coupled 2/ 3/ 14 mV RMS Direct coupled 08-10 10 mV p-p (differential) Logic High level input voltage VIHVL= 5.5 V 1,2,3 01-04 2.4 V VL= 5.25 V 05-07 2.0 VL= 5.5 V 12/ 08-10 2.0 Low level input voltage VILVL= 5.5
43、 V 1,2,3 01-04 0.7 V VL= 5.25 V 05-07 0.8 VL= 4.5 V 12/ 08-10 0.8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION
44、LEVEL J SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Logic - Continued. High level input current 4/ IIH VL= 5.5 V, VIH= 2.7 V 1,2,3 01-04
45、 -0.2 -0.04 mA VL= 5.25 V, VIH= 2.7 V 05-07 -200 -50 A High level input current IIH VL= 5.5 V, VIH= 2.7 V 5/ 1,2,3 01-04 -20 +20 A 6/ -0.4 -0.02 mA VL= 5.25 V, VIH= 2.7 V 5/ 05-07 -10 +10 A 6/ -160 -20 A VL= 5.5 V, VIH= 2.7 V 7/ 08-10 -10 +10 A 8/ -400 -20 A Low level input current 4/ IIL VL= 5.5 V,
46、 VIL= 0.4 V 1,2,3 01-04 -0.4 -0.08 mA VL= 5.25 V, VIL= 0.4 V 05-07 -360 -100 A Low level input current IIL VL= 5.5 V, VIL= 0.4 V 5/ 1,2,3 01-04 -20 +20 A 6/ -0.4 -0.04 mA VL= 5.25 V, VIL= 0.4 V 5/ 05-07 -10 +10 A 6/ -250 -50 A VL= 5.5 V, VIL= 0 V 7/ 08-10 -10 +10 A 8/ -600 -60 A High level output vo
47、ltage VOHVL= 4.5 V, IOH= -0.4 mA 1,2,3 01-04 2.7 V VL= 4.75 V, IOH= -4.0 mA 05-07 4.0 VL= 4.5 V, IOH= -8.0 mA 12/ 08-10 4.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89798
48、 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Logic - Continued. Low level output voltage 9/ VOLVL= 4.5 V, IOL= 2.0 mA 1,2,3 01-04 0.4 V VL= 4.75 V, IOL= 4.0 mA 05-07 0.5 Low level output voltage 6/ VOLVL= 4.5 V, IOL= 4.0 mA 1,2,3 01-04 0.4 V VL= 4.75 V, IOL= 4.0 mA 05-07 0.5 Low level output voltage VOL VL= 4.5 V, IOL= 8.0 mA 12/ 1,2,3 08
