1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R235-92. 92-07-24 M. A. FRYE B Changes in accordance with N.O.R. 5962-R166-93. 93-06-11 M. A. FRYE C Drawing updated to reflect current requirements. - ro 01-01-16 R. MONNIN D Five year review requirement. -
2、rrp 08-07-23 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E
3、. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, WIDEBAND, BUFFER AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-02-27 AMSC N/A REVISION L
4、EVEL D SIZE A CAGE CODE 67268 5962-89975 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E306-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO
5、N LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following exam
6、ple: 5962-89975 01 P X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 CLC110 Wideband buffer amplifier 02 EL2072 Wideband buffer amp
7、lifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximu
8、m ratings. Supply voltage (VS) . 7 V dc Output current (IOUT) 70 mA Power dissipation (PD): Device type 01 . 1.2 W Device type 02 . 1.2 W Junction temperature (TJ) . +175C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-ambient
9、 (JA) 100C/W Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage (VS) . 5 V dc Ambient operating temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAN
10、DARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of thi
11、s drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-
12、STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at
13、 http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes
14、 precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices an
15、d as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers
16、 approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications
17、shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL
18、-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical perf
19、ormance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5
20、 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufactur
21、er has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 22
22、34 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxDC electrical characteristics Input bias current IIN1,2 All -50 +50 A 3 -100 +100 Output offset voltage VOO1 All -8.0 +8.0
23、 mV 2 -13.0 +13.0 3 -16.0 +16.0 Average input bias current drift TC3/ 2 All -300 +300 nA/C (IIN) 3 -700 +700 Average offset voltage drift TC3/ 2 01 -50 +50 V/C (VIO) 3 -100 +100 2 02 -100 +100 3 -250 +250 Supply current ICCNo load 1,2,3 All 20 mA Power supply rejection ratio PSRR +VS= +4.5 V to +5.0
24、 V, -VS= -4.5 V to 5.0 V 1,2,3 01 45 dB +VS= +4.5 V to +6.0 V, -VS= -4.5 V to 6.0 V 02 45 Integral endpoint linearity ILIN2 V full scale 3/ 1 All 0.4 %FS 2 0.3 3 0.8 Small signal gain AVRL= 100 3/ 1 All 0.96 V/V 2,3 0.95 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or
25、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C
26、 unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max DC electrical characteristics continued. Input resistance +RIN3/ 1 All 100 k 2 200 3 50 Output impedance (dc) ROUT3/ 1 All 3.0 2,3 3.5 Input capacitance CINSee 4.3.1c, TA= +25C 4 All 2.2 pF Output voltage swing VOSRL= 1
27、00 4/ 4,5 01 -3.2 +3.2 V 6 -3.0 +3.0 RL= 100 4/ 4,5 02 -3.2 +3.2 6 -3.0 +3.0 Output current IOUTRL= 100 3/ 4,5 01 -50 +50 mA 6 -40 +40 RL= 100 3/ 4,5 02 -50 +50 6 -45 +45 AC electrical characteristics Small signal bandwidth SSBW -3 dB bandwidth, 3/ 4,6 All 400 MHz VOUT 0.5 VPP5 300 Large signal band
28、width LSBW -3 dB bandwidth, 3/ 4 All 55 MHz VOUT= 5 VPP5,6 50 Linear phase deviation LPD At 200 MHz, 3/ 4,6 All 1.5 Degrees VOUT 0.5 VPP5 2.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
29、 SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Ma
30、xAC electrical characteristics continued. Gain flatness peaking high GFPH At 0.1 MHz to 200 MHz, 4 All 0.5 dB VOUT 0.5 VPP5 3/ 0.6 6 3/ 0.8 Gain flatness rolloff GFR At 0.1 MHz to 200 MHz, 4 All 0.8 dB VOUT 0.5 VPP5 3/ 1.2 6 3/ 1.0 Group delay GD At 200 MHz, 3/ 4,6 All 1.0 ns VOUT 0.5 VPP5 1.2 Disto
31、rtion section 2nd harmonic distortion HD2 2 VPPat 20 MHz, 4 01 -55 dBc VOUT= 2 VPP5 3/ -55 6 3/ -48 2 VPPat 50 MHz, 3/ 4,5 -55 VOUT= 2 VPP6 -48 2 VPPat 20 MHz, 4 02 -50 VOUT= 2 VPP5 3/ -50 6 3/ -48 2 VPPat 50 MHz, 4 -45 VOUT= 2 VPP5 3/ -45 6 3/ -40 See footnotes at end of table. Provided by IHSNot f
32、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol
33、 Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxDistortion section continued. 3rd harmonic distortion HD3 2 VPPat 20 MHz, 4 01 -55 dBc VOUT= 2 VPP5,6 3/ -55 2 VPPat 50 MHz, 3/ 4,6 -50 VOUT= 2 VPP5 -45 2 VPPat 20 MHz, 4 02 -55 VOUT= 2 VPP5,6
34、 3/ -55 2 VPPat 50 MHz, 3/ 4,6 -50 VOUT= 2 VPP5 -45 Equivalent input noise section Noise floor NF At 1 MHz to 200 MHz 3/ 4,6 01 -155 dBm 5 -154 (1 Hz) At 100 kHz to 200 MHz 3/ 4,6 02 -155 5 -154 Integrated noise INV At 1 MHz to 200 MHz 4 01 57 V 5 3/ 63 6 3/ 57 At 100 kHz to 200 MHz 3/ 4,6 02 57 5 6
35、3 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electric
36、al performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min MaxTime domain response section Slew rate SR AV= +1, 3/ 4 01 500 V/s VOUT= 4 VPP, measured at 1 VPP5,6 450 AV= +1, 3/ 4,6 02 500 VOUT= 4 VPP,
37、measured at 2 VPP5 450 Rise and fall time TRS 0.5 V step 3/ 9,11 All 1.0 ns 10 1.4 TRL 5 V step 3/ 9 7.5 10,11 8.5 Settling time TSP 2 V step at 0.2 % of 3/ the fixed value 9,10,11 All 10 ns Overshoot OS 0.5 V step 3/ 9 All 10 % 10,11 15 1/ Unless otherwise specified, VS= 5 V dc, load resistance (RL
38、) = 100 , and source resistance (RS) = 50 . 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this table. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4/ Group A sample tested only. Provided by IH
39、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89975 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compliance indicator “C”
40、shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate o
41、f compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the require
42、ments of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC
43、-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the optio
44、n of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformanc
45、e inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon reque
46、st. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interi
47、m electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria s
48、hall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initial test and after process or design changes which may affect input capacitance. Provided by IHSNot for Resa
