1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R129-92. tvn 92-02-21 Monica L. Poelking B Changes in accordance with NOR 5962-R031-96. tn 96-01-16 Michael A. Frye C Update to reflect latest changes in format and requirements. Editorial changes throughout. -
2、les 04-08-23 Raymond MonninTHE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Tim H. Noh COLUMBUS,
3、 OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL, OCTAL AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-05-16 STORAGE REGISTERS, MONOLITHIC SILICON AM
4、SC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90503 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E390-04 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43
5、218-3990 REVISION LEVEL C SHEET 2 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5
6、962-90503 01 2 A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function 01 54LS396 Octal storage registers 1.2.2 Case outlines. The case outlines a
7、re as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Su
8、pply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range -1.5 V dc at 18 mA to +7.0 V dc Storage temperature range -65C to +150C Maximum power dissipation (PD) . 220 mW 1/ Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-cas
9、e (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Maximum input clamp current (IIC) -18 mA Maximum high level output current (IOH) . -400 A Maximum low level output current (IOL) +4 mA Case operating temperature range (TC) . -55C to +12
10、5C Minimum setup time (ts) . 20 ns Minimum hold time (th) . 5 ns Minimum width of clock pulse (tw) . 20 ns Maximum clock frequency (fclock) 30 MHz _ 1/ Maximum power dissipation is defined as VCCX ICC, and must withstand the added PDdue to short circuit output test e.g., IOS. DSCC FORM 2234 APR 97 P
11、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and hand
12、books. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits,
13、 Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Sta
14、ndard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a con
15、flict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item r
16、equirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transition
17、al certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements h
18、erein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, a
19、nd physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figu
20、re 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performanc
21、e characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. DSCC FORM 22
22、34 APR 97 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535
23、, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device.
24、 3.5.1 Certification/compliance mark. A compliance indicator C shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator C shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow o
25、ption is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply
26、shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawin
27、g. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offsho
28、re documentation shall be made available onshore at the option of the reviewer. DSCC FORM 2234 APR 97 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-
29、3990 REVISION LEVEL C SHEET 5 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level input voltage VIH1, 2, 3 All 2 V Low level input voltage VILData 1, 2, 3 All 0.7 V G 1, 3 All 0.
30、7 2 0.6 High level output voltage VOHVCC= 4.5 V, VIH= 2.0 V, VIL= 0.7 V IOH = -400 A 1, 2, 3 All 2.5 V Low level output voltage VOLVCC= 4.5 V, VIH= 2.0 V, VIL= 0.7 V, IOL= 4 mA 1, 2, 3 All 0.4 V Input clamp voltage VICVCC= 4.5 V, IIN = -18 mA 1, 2, 3 All -1.5 V High level input current IIH1VCC= 5.5
31、V, Clock input 1, 2, 3 All 200 A VIN= 7.0 V Other inputs 100 IH2VCC= 5.5 V, Clock input 1, 2, 3 All 40 A VIN= 2.7 V Other inputs 20 Low level input current IILVCC= 5.5 V, Clock input 1, 2, 3 All -800 A VIN= 0.4 V Other inputs -400 Short circuit output current IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 Al
32、l -20 -100 mA Supply current ICCVCC= 5.5 V All inputs = 4.5 V All outputs open 1, 2, 3 All 40 mA Functional tests See 4.3.1c 2/ 7, 8 All Propagation delay time tPLHVCC= 5.0 V, 9 All 30 ns from clock or strobe tPHLCL= 15 pF, 3/ 30to output tPLHRL= 2 k, 10, 11 All 42 PHLSee figure 3 42 Propagation del
33、ay time tPLHVCC= 5.0 V, 9 All 33 ns from clock or strobe tPHLCL= 50 pF, 3/ 33 to output tPLHRL= 2 k, 10, 11 All 46 PHLSee figure 3 46 1/ Not more than one output will be tested at one time and the duration of the test condition shall not exceed one second. 2/ Functional tests shall be conducted at i
34、nput test conditions of GND VIL VOLand VOH VIH VCC. 3/ Testing may be performed at either CL= 15 pF or CL= 50 pF, however, the manufacturer must guarantee that the microcircuits meet the switching limits specified for a 50 pF load. DSCC FORM 2234 APR 97 Provided by IHSNot for ResaleNo reproduction o
35、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines E 2 Terminal number Terminal symbol 1 2Q1 NC 2 1Q1 2Q13 D1 1Q14 2Q2
36、 D1 5 1Q2 2Q26 D2 NC7 CLK 1Q2 8 GND D29 D3 CLK10 1Q3 GND 11 2Q3 NC12 D4 D313 1Q4 1Q3 14 2Q4 2Q315 G D4 16 VCCNC 17 - - - 1Q4 18 - - - 2Q4 19 - - - G 20 - - - VCCNC = No connection FIGURE 1. Terminal connections. Inputs Outputs Data Byte 1 Byte 2 Strobe G Clock D1 D2 D3 D4 1Q1 1Q2 1Q3 1Q4 2Q1 2Q2 2Q3
37、 2Q4 H X X X X X L L L L L L L L L a b c d a b c d 1Q1n1Q2n1Q3n1Q4n H = High level voltage L = Low level voltage = Transition from low to high level X = Irrelevant 1Q1n, 1Q2n, 1Q3n, 1Q4n= The level of 1Q1, 1Q2, 1Q3, and 1Q4, respectively before the most recent transition of the clock. FIGURE 2. Trut
38、h table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capaci
39、tance. 2. All input pulses have the following characteristics: PRR 1 MHz, ZOUT 50, tr 15 ns, and tf 6 ns. 3. The outputs are measured one at a time with one input transition per measurement. FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking pe
40、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A
41、. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test cir
42、cuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifie
43、d in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MI
44、L-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10*, 11* Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10*, 11* Groups C and D
45、end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 i
46、ncluding groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of
47、 the truth table. DSCC FORM 2234 APR 97 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90503 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 4.3.2 Groups C and D inspections
48、. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125
