1、NOTICE OF REVISION (NOR)This revision described below has been authorized for the document listed.1. DATE(YYMMDD)95-02-10 Form ApprovedOMB No. 0704-0188Public reporting burden for this collection is estimated to average 2 hours per response, including the time for reviewing instructions, searchingex
2、isting data sources, gathering and maintaining the data needed, and completing and reviewing the collection of information. Send commentsregarding this burden estimate or any other aspect of this collection of information, including suggestions for reducing this burden, toDepartment of Defense, Wash
3、ingtion Headquarters Services, Directorate for Information Operations and Reports, 1215 Jefferson DavisHighway, Suite 1204, Arlington, VA 22202-4302, and to the Office of Management and Budget, Paperwork Reduction Project (0704-0188),Washington, DC 20503. PLEASE DO NOT RETURN YOUR COMPLETED FORM TO
4、EITHER OF THESE ADDRESSED. RETURNCOMPLETED FORM TO THE GOVERNMENT ISSUING CONTRACTING OFFICER FOR THE CONTRACT/ PROCURING ACTIVITYNUMBER LISTED IN ITEM 2 OF THIS FORM.2. PROCURINGACTIVITY NO.3. DODAAC4. ORIGINATORb. ADDRESS (Street, City, State, Zip Code)Defense Electronics Supply Center1507 Wilming
5、ton PikeDayton, OH 45444-57655. CAGE CODE672686. NOR NO.5962-R069-95a. TYPED NAME (First, Middle Initial,Last)7. CAGE CODE672688. DOCUMENT NO.5962-905489. TITLE OF DOCUMENTMICROCIRCUIT, DIGITAL, CMOS, SCSI BUS CONTROLLER, MONOLITHICSILICON10. REVISION LETTER11. ECP NO.a. CURRENTInitialb. NEWA12. CON
6、FIGURATION ITEM (OR SYSTEM) TO WHICH ECP APPLIESAll13. DESCRIPTION OF REVISIONSheet 1: Revisions ltr column; add “A“.Revisions description column; add “Changes in accordance with NOR 5962-R069-95“.Revisions date column; add “95-02-10“.Revision level block; add “A“.Rev status of sheets; For sheets 1,
7、 5, 6, 7, 8, 14 add “A“.Sheet 5: Change Supply currrent quiescent I from: 1.0 mA to: 1.5 mACCChange status of revision level to “A“Sheet 6: Change DACK false to ACK true (REQ true), t8, from: 140 ns to: 185 ns Change status of revision level to “A“Sheet 7: Change IOW false to ACK true (REQ true), t8
8、, from: 140 ns to: 185 nsChange status of revision level to “A“Sheet 8: Change DACK false to REQ true (ACK false), t8, from: 140 ns to: 185 ns Change IOW false to REQ true (ACK false), t8, from: 140 ns to: 185 nsChange status of revision level to “A“Sheet 14: Change note from: SCSI bus outputs to: S
9、CSI bus and outputsChange note from: Pins 2-10 to: Pins 2-10, 12-20Change status of revision level to “A“14. THIS SECTION FOR GOVERNMENT USE ONLYa. (X one) X (1) Existing document supplemented by the NOR may be used in manufacture.(2) Revised document must be received before manufacturer may incorpo
10、rate this change.(3) Custodian of master document shall make above revision and furnish revised document.b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENTDESC-ELDCc. TYPED NAME (First, Middle Initial, Last)Monica L. Poelkingd. TITLEChief, Custom Microelectronics Branche. SIGNATUREMonica L. Poe
11、lkingf. DATE SIGNED(YYMMDD)95-02-1015a. ACTIVITY ACCOMPLISHING REVISIONDESC-ELDCb. REVISION COMPLETED (Signature)Thomas M. Hessc. DATE SIGNED(YYMMDD)95-02-10DD Form 1695, APR 92 Previous editions are obsoleteProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
12、S-,-,-REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDREV SHEETREVSHEET15 16 17 18 19 20 21 22 23 24 25REV STATUSOF SHEETSREVSHEET123456789101121314PMIC N/APREPARED BY Thomas M. HessDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDIZEDMILITARYDRAWINGTHIS DRAWING ISAVAILABLEFOR USE BY AL
13、LDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAMSC N/A CHECKED BY Tim H. NohMICROCIRCUIT, DIGITAL, CMOS, SCSI BUS CONTROLLER, MONOLITHIC SILICONAPPROVED BYTim H. NohDRAWING APPROVAL DATE92-06-25SIZEACAGE CODE672685962-90548REVISION LEVEL SHEET 1 OF 25DESC FORM 193JUL 91 5962-E533-92DISTRIBUTIO
14、N STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444SIZEA5962-90548REVISION LEVEL SHEET2DESC FORM 193AJU
15、L 911. SCOPE1.1 Scope. This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two productassurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), anda choice of case outlines and l
16、ead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class Mmicrocircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883in conjunction with compliant non-JAN devices“. When available, a c
17、hoice of radiation hardness assurance (RHA) levels are reflectedin the PIN.1.2 PIN. The PIN shall be as shown in the following example:5962 - 91548 01 M X X | | | | | | | | | | | | Federal RHA Device Device Case Lead stock class designator type class outline finishdesignator (See 1.2.1) (See 1.2.2)
18、designator (See 1.2.4) (See 1.2.5) / (See 1.2.3) / Drawing number1.2.1 Radiation hardness assurance (RHA) designator. Device classes M, B, and S RHA marked devices shall meet theMIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marke
19、ddevices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicatesa non-RHA device.1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows:Device type Generic number Circuit function Frequency01 L5380
20、 SCSI Bus controller 2 MHz02 L53C80 SCSI Bus controller 2 MHz1.2.3 Device class designator. The device class designator shall be a single letter identifying the product assurance level as follows:Device class Device requirements documentationM Vendor self-certification to the requirements for non-JA
21、N class Bmicrocircuits in accordance with 1.2.1 of MIL-STD-883B or S Certification and qualification to MIL-M-38510Q or V Certification and qualification to MIL-I-385351.2.4 Case outline(s). For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510and a
22、s listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C ofMIL-M-38510, and as listed below.Outline letter Case outlineQ D-5 (40-Lead, 2.096“ x .620“ x .225“) dual-in-line packageX C-5 (44-terminal, .662“ x .662“ x .120“) leadless chip carrie
23、rY D-14 (48-Lead, 2.435“ x .620“ x .225“) dual-in-line packageProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444SIZEA5962-90548REVISION LEVEL SHEET3DESC FORM 193AJUL 911.2.
24、5 Lead finish. The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q andV. Finish letter “X“ shall not be marked on the microcircuit or its packaging. The “X“ designation is for use in specifications when leadfinishes A, B, and C are considered acc
25、eptable and interchangeable without preference.1.3 Absolute maximum ratings. 1/ Storage temperature . -65G28C to +150G28C V supply voltage respect to ground . -0.5 V to +7.0 V CCOutput voltage . 0.0 to V CCInput voltage . 0.0 to 5.5 V I Low level output current (SCSI bus) . 48 mA OLI Low level outpu
26、t current (other pins) . 8 mA OLI High level output current (other pins) -4 mA OHThermal resistance, junction-to-case (G14 ) See MIL-M-38510, appendix CJCPower dissapation (P ) 55 mW DLead temperature (soldering, 10 seconds) 275G28C 1.4 Recommended operating conditions.Supply voltage . 4.50 V G06 V
27、G06 5.50 V CCCase operating temperature . -55G28C to +125G28C 1.5 Digital logic testing for device classes Q and V. Fault coverage measurement of manufacturinglogic tests (MIL-STD-883, test method 5012) . XX percent 2/ 2. APPLICABLE DOCUMENTS2.1 Government specifications, standards, bulletin, and ha
28、ndbook. Unless otherwise specified, the following specifications, standards,bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specifiedin the solicitation, form a part of this drawing to the extent specified herein.SPECIFICATI
29、ONSMILITARYMIL-M-38510 - Microcircuits, General Specification for.MIL-I-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSMILITARYMIL-STD-480 - Configuration Control-Engineering Changes, Deviations and Waivers.MIL-STD-883 - Test Methods and Procedures for Microelectronic
30、s.BULLETINMILITARYMIL-BUL-103 - List of Standardized Military Drawings (SMDs).1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extendedoperation at the maximum levels may degrade performance and affect reliability.2/ Values will be added when they become availa
31、ble.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444SIZEA5962-90548REVISION LEVEL SHEET4DESC FORM 193AJUL 91HANDBOOKMILITARYMIL-HDBK-780 - Standardized Military Drawings.
32、(Copies of the specifications, standards, bulletin, and handbook required by manufacturers in connection with specific acquisitionfunctions should be obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the tex
33、t of this drawing and the references cited herein, the text of thisdrawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. The individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compl
34、iant non-JAN devices“ and as specified herein. The individual itemrequirements for device classes B and S shall be in accordance with MIL-M-38510 and as specified herein. For device classes B andS, a full electrical characterization table for each device type shall be included in this SMD. The indiv
35、idual item requirements for deviceclasses Q and V shall be in accordance with MIL-I-38535, the device manufacturers Quality Management (QM) plan, and as specifiedherein.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified inMIL-M-
36、38510 for device classes M, B, and S and MIL-I-38535 for device classes Q and V and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.3 Block or logic diagram. The bloc
37、k or logic diagram shall be as specified on figure 2.3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be specified when available.3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electricalperformance charac
38、teristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operatingtemperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical testsfor each subgroup are defined
39、 in table I.3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. Marking for device class M shall be in accordance withMIL-STD-883 (see 3.1 herein). In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103. Marking for deviceclasses B and S shall be in accor
40、dance with MIL-M-38510. Marking for device classes Q and V shall be in accordance withMIL-I-38535.3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see 3.1herein). The certification mark for device classes B and S shall be a “J“ or
41、 “JAN“ as required in MIL-M-38510. The certification markfor device classes Q and V shall be a “QML“ as required in MIL-I-38535.3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order to be listedas an approved source of supply in
42、 MIL-BUL-103 (see 6.7.3 herein). For device classes Q and V, a certificate of compliance shall berequired from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). The certificateof compliance submitted to DESC-ECC prior to listing as an approved
43、 source of supply for this drawing shall affirm that themanufacturers product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V,the requirements of MIL-I-38535 and the requirements herein.3.7 Certificate of conformance. A certificate of conform
44、ance as required for device class M in MIL-STD-883 (see 3.1 herein) or deviceclasses B and S in MIL-M-38510 or for device classes Q and V in MIL-I-38535 shall be provided with each lot of microcircuits deliveredto this drawing.3.8 Notification of change for device class M. For device class M, notifi
45、cation to DESC-ECC of change of product (see 6.2 herein)involving devices acquired to this drawing is required for any change as defined in MIL-STD-480.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDIZEDMILITARY DRAWINGDEFENSE ELECTRONICS SU
46、PPLY CENTER DAYTON, OHIO 45444SIZEA5962-90548REVISION LEVEL SHEET5DESC FORM 193AJUL 91TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/-55G28C G06 T G06 +125G28CC4.5 V G06 V G06 5.5 VCCunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxElectrical characteristicLow level input voltage VIL1, 2, 3 All 0.0 0.8 VHigh level input voltage VIH1, 2, 3 All 2.0 VCCVLow level output voltage(SCSI bus)VOLV = Min, I = 48 mACC OL1, 2, 3 All 0.5 VLow level output voltage(other pins)VOLV = Min, I = 8 maCC OL1, 2, 3 All 0.5 VHigh lev
