1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A TABLE I. Input offset voltage match test, group A subgroup column, delete subgroups 1, 2, 3, and substitute subgroups 4, 5, 6. Changes in accordance with N.O.R. 5962-R058-93. - ro 93-02-10 M. A. FRYE B Drawing updated to reflect current requireme
2、nts. Redrawn. - ro 00-07-17 R. MONNIN C Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 11-06-16 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED
3、 BY RICK C. OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, LOW N
4、OISE, HIGH SPEED, DUAL OPERATIONAL AMPLIFIER MONOLITHIC SILICON DRAWING APPROVAL DATE 90-05-11 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-90568 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E242-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
5、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38
6、535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90568 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Devi
7、ce type Generic number Circuit function 01 OP-237A Dual, low-offset, low noise, high speed operational amplifier 02 OP-237C Dual, low-offset, low noise, high speed operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descri
8、ptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) 22 V dc Input voltage range (VIN) Equal to supply voltage Output short circuit durat
9、ion Indefinite Differential input current 25 mA 2/ Differential input voltage range . 0.7 V dc Maximum power dissipation (PD) . 500 mW 3/ Lead temperature (soldering, 60 seconds) . +300C Storage temperature range (TJ) -65C to +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 _ 1/ Un
10、less otherwise specified, all voltages are referenced to ground. 2/ The inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise. If differential input voltage exceeds 0.7 V, the input current should be limited to 25 mA. 3/ For TAgreater than
11、 106C, derate linearly at 11.3 mw/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operat
12、ing conditions. Supply voltage (VS) 4.5 V dc to 18 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified her
13、ein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microc
14、ircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksear
15、ch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this documen
16、t, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built
17、 to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifyin
18、g activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as describe
19、d herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3
20、.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as speci
21、fied in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reprodu
22、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA+125C VS= 15 V Grou
23、p A subgroups Device type Limits Unit unless otherwise specified Min Max Input offset voltage 1/ VIO1 01 80 V 02 180 2,3 01 180 02 350 Average input offset 2/ voltage drift TC VIO1,2,3 01 1.0 V/C 02 1.8 Input offset current IIO1 01 35 nA 02 75 2,3 01 50 02 135 Input bias current IIB1 01 40 nA 02 80
24、2,3 01 60 02 150 Power supply rejection ratio PSRR VS= 4 V to 18 V, 1 01 10 V/V RS= 50 02 20 VS= 4.5 to 18 V, 2,3 01 16 RS= 50 02 51 Common mode rejection ratio CMRR VCM= 11 V, RS= 50 1 01 114 dB 02 100 VCM= 10 V, RS= 50 2,3 01 108 02 94 Input voltage range 3/ IVR 1 All 11.0 V 2,3 10.0 See footnotes
25、 at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance character
26、istics Continued. Test Symbol Conditions -55C TA+125C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Power consumption PDEach amplifier, TA= +25C 1 01 140 mW 02 170 Input offset voltage match VOS4 01 80 V 02 300 5,6 01 180 02 480 Average noninverting bias curre
27、nt +IB+IB= (+IB(A)+ +IB(B) / 2 1 01 40 nA 02 90 2,3 01 60 02 170 Noninverting offset current +IOS+IOS= +IB(A)- IB(B)1 01 60 nA 02 130 2,3 01 90 02 250 Inverting offset current -IOS-IOS= -IB(A)- -IB(B)1 01 60 nA 02 130 2,3 01 90 02 250 Gain bandwidth 2/ product GBW f = 10 kHz, AVCL 5, 4/ 4 All 35 MHz
28、 TA= +25C Large signal voltage AVOLVO= 10 V, RL 2 k 4 01 3000 V/mV 02 2000 5,6 01 1000 02 800 VO= 10 V, RL 600 4 01 1000 02 800 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-9
29、0568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C VS= 15 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Output voltage swin
30、g VOPRL 2 k 4 01 12 V 02 11.5 5,6 01 11.5 02 10.5 RL 600 4 All 10 Slew rate SR RL 2 k, AVCL= 5, TA= +25C 7 All 10 V/s Input noise voltage density EnfO= 10 Hz, TA= +25C 7 01 6.0 nV / 02 9.0 Hz fO= 1,000 Hz, TA= +25C 01 3.9 02 4.6 Input noise current InfO= 10 Hz, TA= +25C 7 01 4.5 pA / 02 5.66 Hz fO=
31、1,000 Hz, TA= +25C 01 0.7 02 0.99 1/ Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. VIOis excluded from PDA. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 3/ Guaranteed by CMRR test.
32、 4/ The symbol AVCLstands for the closed-loop voltage gain. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97
33、 Device types 01 and 02 Case outline C Terminal number Terminal symbol 1 NULL (A)2 NULL (A) 3 -IN (A) 4 +IN (A) 5 -VS(B) 6 OUT (B) 7 +VS(B) 8 NULL (B) 9 NULL (B) 10 -IN (B) 11 +IN (B) 12 -VS(A) 13 OUT (A) 14 +VS(A) NULL = no connection NOTE: The VSsupply terminals are both connected to the common su
34、bstrate and must be tied to the same voltage. Both VSpins should be used. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990
35、REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not
36、 feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be
37、 replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
38、6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificat
39、e of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and revie
40、w. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and ins
41、pection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall a
42、pply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inpu
43、ts, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-
44、in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Te
45、sts shall be as specified in table II herein. b. Subgroups 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90568 DLA LAND AND MARITIME
46、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004
47、) 1*,2,3,4 Group A test requirements (method 5005) 1,2,3,4,5,6,7 Groups C and D end-point electrical parameters (method 5005) 1,2,3 * PDA applies to subgroup 1 (except VIOis excluded from PDA). 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II her
48、ein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, mi
