1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Drawing updated to reflect current requirements. - ro 01-07-05 R. MONNINTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV AAAAAAAAAOF SHETS SHET 123456789PMIC N/A PREPARED BY JOSEPH A. KERBYDEFENSE SUPPLY CENT
2、ER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYRAY MONNINCOLUMBUS, OHIO 43216http:/www.dscc.dla.milTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMICHAEL A. FRYEMICROCIRCUIT, LINEAR, DUAL, SPST ANALOGSWITCH, MONOLITHIC SILICON AND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL D
3、ATE89-12-20AMSC N/AREVISION LEVELASIZEACAGE CODE672685962-90569SHEET1 OF 9DSCC FORM 2233APR 97 5962-E497-01DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROC
4、IRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits inaccordance with MIL-PRF-38535, appendix A.1.2 Pa
5、rt or Identifying Number (PIN). The complete PIN is as shown in the following example:5962-90569 01 E XDrawing number Device type(see 1.2.1)Case outline(see 1.2.2)Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows:Device type Generic number Circui
6、t function01 DG401 Dual, SPST analog switch1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleE GDIP1-T16 or CDIP2-T16 16 Dual-in-line2 CQCC1-N20 20 Square leadless chip carrier1.2.3 Lead finish. Th
7、e lead finish is as specified in MIL-PRF-38535, appendix A.1.3 Absolute maximum ratings.+V to V . 44 V dcGND to V 25 V dcVLto V . (GND 0.3 V) to 44 V dcVIN, VS, VD-2 V to +V (+ 2 V) or 30 mA, whichever occurs first 1/Current, continuous (any terminal) . 30 mACurrent (S or D), pulsed 1 ms, 10 % duty
8、100 mAPower dissipation (PD):Case E 900 mW 2/Case 2 750 mW 2/Storage temperature range -65C to +150CJunction temperature (TJ) +175CThermal resistance, junction-to-case (JC) See MIL-STD-18351/ Signals on SX, DXor INXexceeding +V or V will be clamped by internal diodes. Limit forward diode current tom
9、aximum current ratings.2/ Derate linearly above TA= +75C; for case E, 12 mW/C; for case 2, 10 mW/C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVIS
10、ION LEVELASHEET3DSCC FORM 2234APR 971.4 Recommended operating conditions.Positive supply voltage (+V) . +15 V dcNegative supply voltage (-V) -15 V dcLogic supply voltage (VL) . +5 V dcCharge injection . 60 pCCrosstalk (channel-to-channel) 90 dB 3/Ambient operating temperature range (TA) -55C to +125
11、C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listedin the issue of the Department of
12、 Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited inthe solicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-
13、STD-1835 - Interface Standard Electronic Component Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings.MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the
14、 StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supers
15、edes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that
16、 is produced by a Qualified ManufacturerListing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifyingactivity approval in
17、accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) planmay make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“
18、 certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3/ Crosstalk performance is improved with case outline 2.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5
19、962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET4DSCC FORM 2234APR 973.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be asspecified in MIL-PRF-38535, appendix A and herein.3.2.1 Case outline(s). The case o
20、utline(s) shall be in accordance with 1.2.2 herein.3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics areas specified in table I and shall app
21、ly over the full ambient operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are described in table I.3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendi
22、x A. The part shall be marked with the PINlisted in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). Forpackages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has theoption of not mar
23、king the “5962-“ on the device.3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in complianceto MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark inaccordance with MIL-PRF-38535
24、 to identify when the QML flow option is used.3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as anapproved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior tolisting as
25、an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein.3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be providedwith each lot of microcircui
26、ts delivered to this drawing.3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535,appendix A.3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturersfacility and applicable req
27、uired documentation. Offshore documentation shall be made available onshore at the option of thereviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,appendix A.4.2 Screening. Screening shall be in accordance
28、 with method 5004 of MIL-STD-883, and shall be conducted on all devicesprior to quality conformance inspection. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A or C. The test circuit shall be maintained by the manufacturer under document
29、 revision levelcontrol and shall be made available to the preparing or acquiring activity upon request. The test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified intest method 1015 of MIL-STD-883.(2) TA= +125C, minimum.b.
30、 Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parametertests prior to burn-in are optional at the discretion of the manufacturer.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND
31、ARDMICROCIRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions 1/-55C TA +125Cunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxDrain-sourc
32、e ONresistancerDSIS= -10 mA, VD= 10 V,101 35(ON) +V = +13.5 V, -V = -13.5 V 2,3 45Delta drain-source ONresistancerDS(ON)IS= -10 mA,VD= 5 V, 0 V, -5 V,101 3+V = +16.5 V, -V = -16.5 V 2,3 5Source OFF leakagecurrentISVD= -15.5 V, VS= +15.5 V,101 0.25 nA(OFF) +V = +16.5 V, -V = -16.5 V 2 20VD= +15.5 V,
33、VS= -15.5 V,1 0.25+V = +16.5 V, -V = -16.5 V 2 20Drain OFF leakagecurrentIDVD= -15.5 V, VS= +15.5 V,101 0.25 nA(OFF) +V = +16.5 V, -V = -16.5 V 2 20VD= +15.5 V, VS= -15.5 V,1 0.25+V = +16.5 V, -V = -16.5 V 2 20Channel ON leakagecurrentID(ON) + VS= VD= 15.5 V,101 0.4 nAIS(ON)+V = +16.5 V, -V = -16.5
34、V 2 40Low level inputcurrentIILVINunder test = 0.8 V,all other inputs = 2.4 V1,2 01 1.0 AHigh level inputcurrentIIHVINunder test = 2.4 V,all other inputs = 0.8 V1,2 01 1.0 ATurn on timetONRL = 300 , CL= 35 pF9 01 150 ns10,11 275See footnotes at end of table.Provided by IHSNot for ResaleNo reproducti
35、on or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics Continued.Test SymbolConditions 1/-55C TA +125Cunless oth
36、erwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxTurn off timetOFFRL = 300 , CL= 35 pF9 01 100 ns10 25011 175Positive supply current +I V+ = +16.5 V, -V = -16.5 V, 1 01 +1.0 AVIN= 0 V or 5 V2,3 +5.0Negative supply current -I V+ = +16.5 V, -V = -16.5 V, 1 01 -1.0 AVIN= 0 V or 5 V2,3 -5.0Lo
37、gic supply currentILV+ = +16.5 V, -V = -16.5 V, 1 01 +1.0 AVIN= 0 V or 5 V2,3 +5.0Ground currentIGNDV+ = +16.5 V, -V = -16.5 V, 1 01 -1.0 AVIN= 0 V or 5 V2,3 -5.01/ Unless otherwise specified, +V = 15 V, -V = -15 V, and VL= 5 V.4.3 Quality conformance inspection. Quality conformance inspection shall
38、 be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 4, 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitt
39、ed.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET7DSCC FORM 2234APR 97Device type 01Case outlines E 2TerminalnumberTerminal symbol
40、1D1NC2NCD13N NC4NC5N NC6NC7N NC8D2NC9S2NC10IN2D211 +V NC12VLS213 GNDIN214 -V +V15IN1VL16S1NC17 - GND18 - -V19 -IN120 -S1NC = No connectionFIGURE 1. Terminal connections.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA
41、5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET8DSCC FORM 2234APR 97TABLE II. Electrical test requirements.MIL-STD-883 test requirements Subgroups(in accordance withMIL-STD-883, method 5005,table I)Interim electrical parameters(method 5004)1Final electrical test
42、 parameters(method 5004)1*,2,3,9Group A test requirements(method 5005)1,2,3,9,10*,11*Groups C and D end-pointelectrical parameters(method 5005)1* PDA applies to subgroup 1.* Subgroups 10 and 11, if not tested, shall be guaranteed to thelimits specified in table I.4.3.2 Groups C and D inspections.a.
43、End-point electrical parameters shall be as specified in table II herein.b. Steady-state life test conditions, method 1005 of MIL-STD-883.(1) Test condition A or C. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to the prepar
44、ing or acquiring activity upon request. The test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specifiedin test method 1005 of MIL-STD-883.(2) TA= +125C, minimum.(3) Test duration: 1,000 hours, except as permitted by method 1005
45、 of MIL-STD-883.5. PACKAGING5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.6. NOTES6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications(original equipment), design ap
46、plications, and logistics purposes.6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing.6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of r
47、ecord forthe individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-90569DEFENSE SUPPLY CENTER COLUMBUSCOLUMBU
48、S, OHIO 43216-5000REVISION LEVELASHEET9DSCC FORM 2234APR 976.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system applicationrequires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used fo
49、rcoordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)should contact DSCC-VA, telephone (614) 692-0544.6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone(614) 692-0547.6.6 Approved s
