1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make a change to the PDlimit as specified under 1.3. Make changes to HD2, HD3, and VOUTtests as specified under Table I. Changes in accordance with N.O.R. 5962-R164-93. 93-05-21 M.A. FRYE B Make a footnote change to the CMRR test as specified und
2、er Table I. Changes in accordance with N.O.R. 5962-R021-95. 94-10-28 M.A. FRYE C Delete subgroup 4 from final electrical test parameters row as specified under Table II. Changes in accordance with N.O.R. 5962-R116-95. 95-05-04 M.A. FRYE D Delete CAGE 62839 and add CAGE 27014. Editorial changes throu
3、ghout. Redrawn. - ro 00-03-08 R. MONNIN E Drawing updated to reflect current requirements. - ro 03-04-16 R. MONNIN F Update boilerplate paragraphs. - ro 09-07-01 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F OF SHEETS SHEET
4、 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED B
5、Y MICHAEL A. FRYE MICROCIRCUIT, LINEAR, WIDEBAND, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 91-10-11 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-90600 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E370-09 Provided by IHSNot for ResaleNo reproduction or networking permitted
6、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microci
7、rcuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-90600 01 P A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identif
8、y the circuit function as follows: Device type Generic number Circuit function 01 CLC410 Wideband operational amplifier with disable 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 o
9、r CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) 7 V dc Output current (IOUT) 70 mA Common mode input voltage (VCM) . VSDifferential input voltage (VID) 5 V Disable input voltage (DIS pin) +VS
10、Applied output voltage when disabled VSPower dissipation (PD) . 1.2 W Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +175C Storage temperature . -65C to +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) 100C/
11、W 1.4 Recommended operating conditions. Supply voltage (VS) 5 V dc Gain range (AV) 1 to 8 Ambient operating temperature range (TA) . -55C to +125C Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE
12、 SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless ot
13、herwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-S
14、TD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the
15、 Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, sup
16、ersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawin
17、g that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity appr
18、oval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“
19、 or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outli
20、ne. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I
21、 and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-P
22、RF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the
23、 device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when th
24、e QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical per
25、formance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input bias current (noninverting) +IIN1,2 01 -20 +20 A 3 -36 +36 Input bias current (inverting) -IIN1 01 -20 +20 A 2 -30 +30 3 -36 +36 Input offset voltage V
26、IORS= 50 1 01 -5.0 +5.0 mV 2 -9.0 +9.0 3 -8.2 +8.2 Average +input bias current drift TC2/ 2 01 -100 +100 nA/C (+IIN) 3 -200 +200 Average input bias current drift TC2/ 2 01 -100 +100 nA/C (-IIN) 3 -200 +200 Average offset voltage drift TC(VIO) 2/ 2,3 01 -40 +40 V/C Supply current ISNo load 1,2,3 01 1
27、8 mA Power supply rejection ratio PSRR +VS= +4.5 V to +5.0 V, -VS= -4.5 V to 5.0 V 1,2,3 01 45 dB Common mode 2/ rejection ratio CMRR VCM= 1 V 4,5,6 01 45 dB Small signal bandwidth SSBW -3 dB bandwidth, 3/ 4,6 01 150 MHz VOUT40 MHz 3/ 4 01 0.5 dB 5,6 0.7 See footnotes at end of table. Provided by IH
28、SNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test
29、Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Gain flatness rolloff GFR At 0.1 MHz to 75 MHz 3/ 4,6 01 1 dB 5 1.3 Second harmonic distortion HD2 2 VPPat 20 MHz 3/ 4,5 01 -45 dBc 6 -40 Third harmonic distortion HD3 2 VPPat 20 MHz 3/ 4,
30、5,6 01 -50 dBc Noise floor SNF At 1 MHz 2/ 4,6 01 -154 dBm 5 -156 (1 Hz) Integrated noise INV At 1 MHz to 200 MHz 1 01 57 V 2 63 3 54 DISABLE voltage to disable VDIS2/ 1,2,3 01 0.5 V DISABLE voltage to enable VEN2/ 1 01 3.2 V 2 4.0 3 2.3 DISABLE current to disable IDIS2/ 1,2,3 01 250 A DISABLE curre
31、nt to enable IEN2/ 1,2,3 01 60 A Off isolation OSD At 10 MHz 2/ 4,5,6 01 55 dB Disable time TOFF 50 dB attenuation 2/ at 10 MHz 4,5,6 01 1000 ns Enable time TON2/ 4,5,6 01 200 ns Rise and fall time TRS 0.5 V step 2/ 9,10,11 01 2.4 ns TRL 5 V step 2/ 10 See footnotes at end of table. Provided by IHSN
32、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Sy
33、mbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input resistance +RIN2/ 1,2 01 100 k 3 50 Output current IOUT2/ 1,2 01 50 mA 3 30 Output voltage swing VOUTRL= 100 3/ 4,5 01 2.8 V 6 2.3 Slew rate SR Measured 1 V with 2/ 3 V step, AV= +2 4,
34、5,6 01 430 V/s Settling time tS2 V step at 0.1% of 2/ the fixed value 9,10,11 01 13 ns 2 V step at 0.05% of 2/ the fixed value 15 Overshoot OS 0.5 V step 2/ 9,10 01 10 % 11 15 1/ Unless otherwise specified, VS= 5 V dc, AV= +2, load resistance (RL) = 100 , feedback resistance (RF) = 250 , gain settin
35、g resistance (RG) = 250 . 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 3/ Group A sample tested only. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK
36、-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of con
37、formance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and
38、the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,
39、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline P Terminal number Terminal symbol 1 OFFSET ADJUST 2 -INPUT 3 +INPUT 4 -VS5 NC 6 VOUT7 +VS8 DISABLE (DIS ) FIGURE 1. Ter
40、minal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling an
41、d inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria sh
42、all apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, out
43、puts, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are
44、optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests sha
45、ll be as specified in table II herein. b. Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Te
46、st condition B. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accorda
47、nce with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
48、 A 5962-90600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*,2,3 Group A test requirements (method 5005) 1,2,3,4,5,6,9*,10*,11* Groups C and D end-point electrical parameters (method 5005) 1 *
