1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 01-07-10 R. Monnin B Redraw. Update drawing to the current format. - drw 12-08-01 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7
2、 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Dan Wonnell DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Sandra Rooney APPROVED BY Mic
3、hael A. Frye MICROCIRCUIT, DIGITAL-LINEAR, ANALOG MULTIPLEXER, MONOLITHIC SILICON DRAWING APPROVAL DATE 93-07-07 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90635 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E428-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without l
4、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and
5、 space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examp
6、le: 5962 - 90635 01 M V A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 s
7、pecified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types identify t
8、he circuit function as follows: Device type Generic number Circuit function 01 ADG528A 8 channel analog multiplexer 02 ADG529A Dual 4 channel analog multiplexer 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device cl
9、ass Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outlines. The case outlines are as desi
10、gnated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style V GDIP1-T18 or CDIP2-T18 18 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appen
11、dix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/
12、Supply voltage range (VDDto VSS) 44 V dc VDDto GND +25 V dc VSSto GND -25 V dc Analog input voltage at S, D VSS 2 V dc to VDD+ 2 V dc or 20 mA, whichever occurs first Continuous current, S or D 20 mA Pulsed current S or D ( 1 ms duration, 10 % duty cycle) . 40 mA Digital input voltage at A, EN, WR ,
13、 RS VSS 4 V dc to VDD+ 4 V dc or 20 mA, whichever occurs first Power dissipation (PD) at +75C . 470 mW 2/ Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Operat
14、ing voltage range: VDD . +10.8 V dc to +16.5 V dc VSS -10.8 V dc to -16.5 V dc Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to
15、 the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Te
16、st Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assi
17、st.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Not
18、hing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.
19、 2/ Above +75C, derate at 6 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item
20、requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described h
21、erein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MI
22、L-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. T
23、he truth tables shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the
24、full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In additi
25、on, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marki
26、ng for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The
27、compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1
28、herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of suppl
29、y for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for
30、 device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (s
31、ee 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufact
32、urers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 82 (see MIL-PRF-3853
33、5, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteris
34、tics. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Dual supply section. 1/ Analog signal range VRANGE1, 2, 3 All VSSVDDV Switch resistance RON-10 V VS +10 V, IDS= 1 mA 1 All 450 2, 3 600 VDD= +15 V (5 %), VSS= -15 V (5 %) 1 300 2,
35、3 400 Off input leakage current IS(OFF)V1 = 10 V, V2 = 10 V 1 All 1 nA 2, 3 50 Off output leakage current ID(OFF)V1 = 10 V, V2 = 10 V 1 All 1 nA 2, 3 01 100 02 50 On channel leakage current ID(ON)V1 = 10 V, V2 = 10 V 1 All 1 nA 2, 3 01 100 02 50 Differential off output leakage current IDIFFV1 = 10 V
36、, V2 = 10 V 1, 2, 3 02 25 nA Input high voltage VINH1, 2, 3 All 2.4 V Input low voltage VINL1, 2, 3 All 0.8 V Input current, high or low IINLor IINHVIN= 0 V to VDD1, 2, 3 All 1 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
37、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device t
38、ype Limits Unit Min Max Dual supply section continued. 1/ Digital input capacitance CIN4 All 8 pF Transition delay time tTRANSV1 = 10 V, V2 = 10 V, RL= 1 M, CL= 35 pF 2/ 9 All 300 ns 10, 11 400 Open time tOPENRL= 1 k, CL= 35 pF 2/ 9 All 25 ns 10, 11 10 On delay time tONRL= 1 k, CL= 35 pF 2/ 9 All 30
39、0 ns 10, 11 400 Off delay time tOFFRL= 1 k, CL= 35 pF 2/ 9 All 300 ns 10, 11 400 Write pulse width tWSee figure 3 2/ 9 All 100 ns 10, 11 130 Address, enable setup time tSSee figure 3 2/ 9, 10, 11 All 100 ns Address, enable hold time tHSee figure 3 2/ 9, 10, 11 All 10 ns Reset pulse width tRSSee figu
40、re 3 2/ 9, 10, 11 All 100 ns Off isolation VS= 7 V rms, f = 100 kHz, VEN= 0.8 V, RL= 1 k, CL= 35 pF 4 All 50 dB Positive supply current IDDVIN= VINLor VINH1, 2, 3 All 1.5 mA Negative supply current ISSVIN= VINLor VINH1, 2, 3 All 0.2 mA See footnotes at end of table. Provided by IHSNot for ResaleNo r
41、eproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +1
42、25C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Single supply section. 3/ Analog signal range VRANGE1, 2, 3 All GND VDDV Switch resistance RONGND VS +10 V, IDS= 0.5 mA 1 All 700 2, 3 1000 Off input leakage current IS(OFF)V1 = +10 V / GND, V2 = GND / +10 V 1 All 1 nA
43、2, 3 50 Off output leakage current ID(OFF)V1 = +10 V / GND, V2 = GND / +10 V 1 All 1 nA 2, 3 01 100 02 50 On channel leakage current ID(ON)V1 = +10 V / GND, V2 = GND / +10 V 1 All 1 nA 2, 3 01 100 02 50 Differential off output leakage current IDIFFV1 = +10 V / GND, V2 = GND / +10 V 1, 2, 3 02 25 nA
44、Input high voltage VINH1, 2, 3 All 2.4 V Input low voltage VINL1, 2, 3 All 0.8 V Input current, high or low IINLor IINHVIN= 0 V to VDD1, 2, 3 All 1 A Digital input capacitance CIN4 All 8 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without li
45、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90635 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgrou
46、ps Device type Limits Unit Min Max Single supply section continued. 3/ Transition delay time tTRANSV1 = +10 V/GND, 2/ V2 = GND/+10 V, 9 All 450 ns RL= 1 M, CL= 35 pF 10,11 600 Open time tOPENRL= 1 k, CL= 35 pF 2/ 9 All 25 ns 10,11 10 On delay time tONRL= 1 k, CL= 35 pF 2/ 9 All 450 ns 10,11 600 Off
47、delay time tOFFRL= 1 k, CL= 35 pF 2/ 9 All 450 ns 10,11 600 Write pulse width tWSee figure 3 2/ 9 All 100 ns 10,11 130 Address, enable setup time tSSee figure 3 2/ 9,10,11 All 100 ns Address, enable hold time tHSee figure 3 2/ 9,10,11 All 10 ns Reset pulse width tRSSee figure 3 2/ 9,10,11 All 100 ns
48、 Off isolation VS= 3.5 V rms, f = 100 kHz, VEN= 0.8 V, RL= 1 k, CL= 15 pF 4 All 50 dB Positive supply current IDDVIN= VINLor VINH1,2,3 All 1.5 mA Functional tests FT See paragraph 4.4.1d 7,8 All 1/ For dual supply section, unless otherwise specified, VDD= +10.8 V to +16.5 V, VSS= -10.8 V to -16.5 V. 2/ For subgroups 10 and 11, parameter is guaranteed to the specified limit but not tested. 3/ For single supply sect
