1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. rrp 02-11-07 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Dan Wonnell DEFENSE SUPPLY CENTER COLUMBUS
2、STANDARD MICROCIRCUIT DRAWING CHECKED BY Sandra Rooney COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, ANALOG-TO-DIGITAL CONVERTER, 10-BIT, 75 MHz, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF
3、DEFENSE DRAWING APPROVAL DATE 94-09-07 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-91581 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E056-03 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted wi
4、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device clas
5、ses Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in th
6、e following example: 5962 - 91581 01 Q X X Federal stock class designator RHA designator (see 1.2.1) Devicetype (see 1.2.2) Device class designator Caseoutline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the
7、MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device
8、 type(s) identify the circuit function as follows: Device type Generic number Circuit function Differential nonlinearity 01 AD9060S A/D converter, 10-bit, 75 MSPS 1.5 LSB 02 AD9060T A/D converter, 10-bit, 75 MSPS 1.25 LSB 1.2.3 Device class designator. The device class designator is a single letter
9、identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL
10、-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 68 Square gullwing lead chip carrier Y See figure 1 68 Square leadless chip carrier 1.2.5 Lead finish. The lead finish
11、is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
12、 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VS) +6 V dc Negative supply voltage (-VS) -6 V dc Analog IN -2 V dc to +2 V dc ENCODE , ENCODE 0 V dc to -VS+VREF, -VREF, 3/4REF, 1/2REF, 1/4REF. -2 V dc to +2 V dc 3/4REF, 1/2REF, 1
13、/4REFcurrent . 10 mA Digital output current . 20 mA Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC): Cases X and Y 2.6C/W Thermal resistance, junction-to-ambient (JA): Cases X and Y . 20C/W Storage temperature range . -65C to +150C Lead soldering temperature (10 seconds) +3
14、00C 1.4 Recommended operating conditions. Positive supply voltage (+VS) +5 V dc Negative supply voltage (-VS) -5.2 V dc Operating temperature range -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form
15、 a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF D
16、EFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standar
17、d Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedenc
18、e. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maxim
19、um rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPL
20、Y CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Q
21、uality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Desig
22、n, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with
23、1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parame
24、ter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The p
25、art shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the
26、device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification
27、mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38
28、535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compli
29、ance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7
30、 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device c
31、lass M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-PRF-38535, appendix A. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retai
32、n the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircui
33、t group number 57 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97
34、TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C +VS= +5 V, -VS= -5.2 V VSENSE= 1.75 V 1/ unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution RES 2/ 1, 2, 3 All 10 Bits 01 1.25 1 02 1.0 01 1.5 Differential nonlinearity DNL 2, 3
35、 02 1.25 LSB 01 2.0 1 02 1.5 01 2.5 Integral nonlinearity INL 2, 3 02 2.0 LSB 1 1 Input bias current IB3/ 2, 3 All 2 mA Input resistance RIN1 All 2 k 1 22 56 Reference ladder resistance RRL2, 3 All 14 66 Reference ladder offset voltage VORL1, 2, 3 All 90 mV Input voltage logic high VIH1, 2, 3 All -1
36、.1 V Input voltage logic low VIL1, 2, 3 All -1.5 V Input current logic high IIH1, 2, 3 All 300 A Input current logic low IIL1, 2, 3 All 300 A Output voltage logic high VOH1, 2, 3 All -1.1 V Output voltage logic low VOL1, 2, 3 All -1.5 V Positive supply current +IS1, 2, 3 All 500 mA 1 180 Negative su
37、pply current -IS2, 3 All 190 mA 1 3.3 Power dissipation PD2, 3 All 3.5 W Power supply rejection ratio PSRR 4/ 1, 2, 3 All 10 mV/V Effective number of bits ENOB fIN= 2.3 MHz 5/ 4 All 8.7 Bits fIN= 2.3 MHz 5/ 6/ 54 fIN= 10.3 MHz 5/ 6/ 51 Signal-to-noise ratio SNR1fIN= 29.3 MHz 5/ 6/ 4 All 44 dB fIN= 2
38、.3 MHz 5/ 6/ 54 fIN= 10.3 MHz 5/ 6/ 51 Signal-to-noise ratio (without harmonics) SNR2fIN= 29.3 MHz 5/ 6/ 4 All 46 dB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENS
39、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C +VS= +5 V, -VS= -5.2 V VSENSE= 1.75 V 1/ unless otherwise specified Group A subgroups Device type Limits U
40、nit Min Max fIN= 2.3 MHz 5/ 61 fIN= 10.3 MHz 5/ 55 Harmonic distortion HD fIN= 29.3 MHz 5/ 4 All 47 dBc Conversion rate FS9 All 75 MSPS Output delay time tOD7/ 9 All 2 9 ns Output rise time tOR9 All 3 ns Output fall time tOF9 All 3 ns Output time skew tOS7/ 9 All Pulse width (high) tPWH9 All 6 ns Pu
41、lse width (low) tPWL9 All 6 ns 1/ 3/4REF, 1/2REF, and 1/4REFreference ladder taps are driven from dc sources at +0.875 V, 0 V, and 0.875 V, respectively. 2/ No missing codes guaranteed over the full operating ambient temperature range. 3/ Measured with ANALOG IN = +VSENSE. 4/ Measured as the ratio o
42、f the worst-case change in transition voltage of a single comparator for a 5% change in +VSor VS. 5/ ENCODE = 60 MHz. 6/ RMS signal to rms noise with analog input signal 1 dB below full scale at specified frequency. 7/ Output delay measured at worst-case time from 50% point of the rising edge of ENC
43、ODE to 50% point of the slowest rising or falling edge of D0 D9. Output skew measured as worst-case difference in output delay among D0 D9.4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-3
44、8535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening.
45、For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all dev
46、ices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the
47、 preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified
48、in table II herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case X FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91581 DEFENSE SUPPLY CENTER COLUMBUS COLUMB
