DLA SMD-5962-91605-1992 MICROCIRCUITS DIGITAL ADVANCED CMOS PARALLEL D REGISTER WITH ENABLE MONOLITHIC SILICON《硅单块 平行D允许登记 高级互补金属氧化物半导体 数字微型电路》.pdf

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1、REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED SIZE A REY I I I CAGE CODE 5962-91605 67268 * SHEET WV STATUS OF SHEETS PMIC NIA STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A PREPARED BY m distribution is unli

2、mited. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-: SMD-59b2-9Lb05 59 W 9999996 0032734 3 I. SCOPE F.% Scope. This drawing focms a part of a one part - one part number documentation system (see 6.6 herein). TKO ,roduct: assurance cLa.sses consis

3、ting of military high reliability (device classes 8, Q, and M) and space application device classes S and VI, and a choice of case outlines and Lead finishes are available and are reflected in the Fart )P Identifying Number (PIN). Device class M microcircuits represent. non-JAN class B microcircuits

4、 in accordance uijth i ,2.1 of MIL-XD-883, available, a choice of cadiation hardness assurance (RHA) levels are reflected in the PIN. for the use of MIL-STD-883 in conjunction with compCiant nqn-JAN devicesIl. Whert 1.2 m. The PIN shall be as shown in the following example: 5962 91605 _ o1 M I I: f

5、I 1 I B I b Devi ca Federal. RHA stock class designator type class designator (See 1.2.1) (See 1.22) designator / (See 1.2.3) I Device Il / rawing number E I X - t i i LI Case. Lead ouline finish. (See 1.2.4) (see t.2.5) 1.2.1 Radiation hardness assucance CRHA) desianator. Device cla 5e3 il, Ei, and

6、. S RHA marked$devi s shalt me YLL-M-38510 specified. RHA levekc and shall be marked with the appropriate RHk designator. Dev.ice c asses Q and narkd devices shall meet the MIL-2-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-1 indicates a, non-RHA devic

7、e. 1.2.2 Device typeCs). The device typeW shall identify the circuit function as follows: Device type Generic number Circuit function 0% 54AC378 Parallel D register with enable the RHb 1.2.3 Devi.ce class designator. lhe device class designator shall be a single letter identifying the praduct msuran

8、ce teve1 as follows: Device class Device reciuirements documentation M Vendor self-certification to the requirements for nan-JAN class B microcircuits in accordance Kith 1.2.1 af MIL-STD-883 Certificetion and qualification to MIL-M-38510 B or S Q or Certification and qualification to MIL-1-38535 1.2

9、.4 Case outline(c). For device classes M, E, and S, case outline(s) shall meet the requirements in appendix C ,f MIL-M-38510 and as listed below. For device classes Q and V, case outlinecs) shall meet the requirements of YL-38435, appendix C of MIC-M-38510, and as listed below. outline letter, Case

10、outLtne E 0-2 (16-lead, .840“ x ,310“ x .2“), dual-in-line package F F-5 (16-1ead, .440“ x .285“ x .85“), flat package 2 C-2 (20-terminal, .358“ x .158“ x .1O0l1), square chip carrier package STANDADIZED 5 96% 9 1605 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193

11、A JUL 91. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1.2.5 Lead finish. The lead finish shall be as Specified in MIL-M-38510 for classes M, B, and S or MIL-1-38535 for :lasses Q and V. Finish letter “XII shall not be marked on the microcircuit o

12、r its packaging. For use in specifications when lead finishes A, 8, and C are considered acceptable and interchangeable without weference. The “X“ designation is 1.3 Absolute maximum ratings. I/ STANDARD1 ZED SIZE MI LI TARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEV

13、EL Supply voltage range - - - - - - - - - - - - - - - - DC input voltage range - - - - - - - - - - - - - - - DC output voltage range - - - - - - - - - - - - - - Input clamp diode current - - - - - - - - - - - - - - Output clamp diode current - - - - - - - - - - - - - DC output current (per output pi

14、n) - - - - - - - - - DC Vcc or GND current (per output pin) - - - - - - - Storage temperature range - - - - - - - - - - - - - - Maximum power dissipation (PD) - - - - - - - - - - - Lead temperature (soldering, 10 seconds)- - - - - - - Thermal resistance, junction-to-case (OJc) - - - - - Junction tem

15、perature (T,) 2/ - - - - - - - - - - - - 1.4 Recommended operating conditions. I/ -Supply voltage range Wee) 31 - - - - - - - - - - - - Input voltage range - - - - - - - - - - - - - - - - - Output voltage range- - - - - - - - - - - - - - - - - Case operating temperature range (TC) - - - - - - - - In

16、put rise or fall times: Minimum setup time, data (Dn) to clock (CP), (tsl): vcc = 3.0 v to 5.5 I - - - - - - - - - - - - - - iC = +25oc, v = 3.0 v - - - - - - - - - - - - - - TC = -55“C, +$25“C, Vcc = 3.0 V - - - - - - - - - =+250c,v =L,.v- Tc = -55“C, +$55“C, Vcc = 4.5 V - - - - - - - - - Minimum h

17、old time, Dn to CP, (thl): T = +25oc, v = 3.0 v - - - - - - - - - - - - - - TC = -55C, +$hoc, Vcc = 3.0 V - - - - - - - - - T = +25oc, v = 4.5 v- Tc = -55C, +#5“C, Vcc = 4.5 V - - - - - - - - - =+250, =.ov- TC = -55C, +$5“C, Vcc = 3.0 V - - - - - - - - - rC = +25oc, v = 4.5 v - Tc = -55“C, t$25“C, V

18、c 3 4.5 V - - - - - - - - - Minimum hold time, E to fP, (th2): T = +25oc, v = 3.0 v - - - _- - - - - - - - - - TC = -55“C, +$,$5C, Vcc = 3.0 V - - - - - - - - - T = +25oc, v = 4.5 v - - - - - - - - - - - - - - TC = -551C t$55“C, Vcc = 4.5 V - - - - - - - - - Minimum setup time, clock enable (E) to C

19、P, (tS2): 5962-91605 SHEET 3 -0.5 V dc to t6.0 V d -0.5 V d to Vcc t 0.5 V d -0.5 V dc to Vcc t 0.5 V dC I20 rnA 120 mA I50 mA I50 mA -65C to +15OoC 500 mW +300“C See MIL-EI-38510, appendix C t175“C t3.0 V dc to t5.5 V dc 0.0 V dc to Vcc 0.0 V dc to V GC -55C to +I25 C O to 8 ns/V 4.0 ns 4.0 ns 4.0

20、ns 4.0 ns 4.0 ns 4.0 ns 4.0 ns 4.0 ns 2.5 ns 2.5 ns 2.5 ns 2.5 ns 4.0 ns 4.0 ns 4.0 ns 4.0 ns - I/ Unless otherwise specified, all voltages are referenced to GND. - 21 Maximum junction temperature shall not be exceeded except for allowable short duration burn-in - 3/ Operation from 2.0 V dc to 3.0 V

21、 dc is provided for compatibility with data retention and screening conditions in accordance with method 5004 of MIL-STD-883. battery backup systems. with the following conditions: percent Vcc at -20 pA, VOL 5 30 percent Vcc at 20 3: Data retention implies no input transifions and no stored data los

22、s VIH 2 70 percent V VIL 5 30 percent Vcc, VoH 2 70 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i SMD-57b2-7LbO5 57 m 7477776 00L273b 7 = Maximum clock frequency (fMAX): Tc = +2sC, V TC = +2soC, TC * -55C, + Soc, V = 4.5 V T

23、C = +25OC, v 3.0 V - - e - = 3.0 V I - - - - - - - - - ., - - - TC = -5S0C, +k$SC, Vcc = 3.0 V Minimum CP high, Low pufse width, : fC = REVSION%EVEL E SHEET DESC -FORM 19h YUL .91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3. REQUIREMENTS 3.1 Th

24、e individual item requirements for device class M shall be in accordance with 1.2.1 of MIL-STD-883, llProvisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein, The individual item requirements for device classes B and S shall be in accordance with

25、MIL-M-38510 and as specified herein. included in this SMD. MIL-1-38535, the device manufacturers Quality Management (QM) plan, and as specified herein. specified in MIL-M-38510 for device classes M, 8, and S and MIL-1-38535 for device classes Q and V and herein. Item requirements. For device classes

26、 B and S, a full electrical characterization table for each device type shall be The individual item requirements for device classes Q and V shall be in accordance with 3.2 Desinn, construction, and physical dimensions. The design, construction, and physical dimensions shall be as 3.2.1 Case outline

27、(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. 3.2.3 Truth table. 3.2.4 Laic diagram. 3.3 Electrical performance characteristics and postirradiation parameter limits. The terminal connections shall be as specified on figure 1. The truth table shall be

28、as specified on figure 2. The logic diagram shall be as specified on figure 3. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. The electrical

29、 tests for each subgroup are defined in table 1. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein.

30、Marking for device class M shall be in accordance with MIL-STD-883 (see 3.1 herein). MIL-BUL-103. Q and V shall be in accordance with MIL-1-38535, In addition, the manufacturerls PIN may also be marked as listed in Marking for device classes B and S shall be in accordance with MIL-M-38510. Marking f

31、or device classes SIZE 5962-91605 A 3.5.1 Certificatioh/compliance mark. The Compliance mark for device class M shall be a “C“ as required in MIL-STD-883 (see 3.1 herein). in MIL-M-38510. The certification mark for device classes B and S shall be a “J“ or “JAN“ as required The certification mark for

32、 device classes GI and V shall be a “QML“ as required in MIL-1-38535. 3.6 Certificate of compliance. For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-BUL-103 (see 6.7.3 herein). classes Q and V, a certi

33、ficate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.7.2 herein). certificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers

34、 product meets, for device class M the requirements of MIL-STD-883 (see 3.1 herein), or for device classes Q and V, the requirements of MIL-1-38535 and the requirements herein. For device The 3.7 Certificate of conformance. A certificate of conformance as required for device class M in MIL-STD-883 (

35、see 3.1 herein) or device classes B and S in MIL-M-38510 or for device classes Q and V in MIL-1-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DESC-ECS of change of product (see 6.2

36、herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-480. DAYTON, OHIO 45444 REVISION LEVEL SHEET 5 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-93b05 59 999999b 0032738

37、 O H 3.9 lerification and review for device blass M. For device class M, DESCI DECCs agent, and the acquiring activity retain the option tb review the manufacturers facility and applicable required dbcumentation. Offshore documentation shall be hde aJaiCable brishoPC! at the bpfiorr of the revewer.

38、this rawirig shall be in microcircuit group number 411 (see MIL-M-3851UI appendix E). 3.10 hicracircuit group bssiqnment for device classbe 8s cpecifid in table ILA herein. 2.2 Additional crSteria for device classes B and 9. a. The 3burn-in test durationl test conditfan and test temperature OP appro

39、ves alternatives shall be as specified 5n the device manufacturers 4M plan Sn accordance with ?FlrL-l-S8535. The :burh-.Sn test circuit lshall be submitted to DESC-ECS with the certlfcate of compliancemd MILITARY -DRAWING E fDEFENSE ELECTRONICS SUPPLY CENTER ISAYTON, OHIO -45444 , REV;ESLON%I;EVEL i

40、 SHEET Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Test High level output voltage Low level output voltage iymbol I OH OL See footnotes at end of table. TABLE I. Electrical performance characteristics. I I I Conditions i Group A i Limits i Unit I

41、 I I I I ;ifid I Min I Max I unless otheriise sp = v minimum “Yr VIIHmaxi mum, IOH = -bOpA I/ VIN = VIH minimum or VI maximum, IOH = -h.o mA I/ IOH = -54 mA I/ VIN = VfH minimum or VI maximum, IOH = -bo mA I/ VIN = VIH minimum or VSb “i;? IOL = VIN = V mnimum IHmaximum, io!? mA I/ VIN = VIH mnimum m

42、axi mum, IOL mA I/ VIN = V minimum IHmaximum, 0=“lb mA I/ icc = 3.0 V i 1, 2, 3 1 2.9 1 IV L u I I I I icc = 4.5 v I I 4.4 I I L I I I I I icc = 5.5 v I I 5.4 I I I I I I Icc = 3.0 V I I 2-4 I I I I I I i I I tcc = 4.5 v I I I I Jcc = 5.5 v I L I i i u I I I I 3-7 I I I I I I I I I 4-7 I I w I I I t

43、cc = 5.5 v 1 1 3.85 i i I I l I i i I I I I I I L u I I I I Ycc = 4.5 v I I I 0.1 I L w I I I I l 0-1 I ilcc = 5.5 v 1 I L u I I I I I I I I I I I I I I vcc = 4.5 v I I I 0.5 I I I I I I I I I I I 0-5 I vcc = 5.5 v I I L w I I I I vcc = 5.5 v I I I I I I I I I I I 0.1 I v Ycc = 3.0 V I I, 2, 3 I I I

44、 I Ycc = 3.0 V I I 1.65 I STANDARDIZED 5962-91605 MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. SMD-5962-73b05 57 977777b 0032740 7 Test iigh level input

45、voltage -QW level input voltage Input leakage current Qui es cent current Input apaci tance Power dissipation capacitance Funct iona 1 t estc TABLE I. plectrical performance characteristics - Continued. 1 I I I I I “IH I I ! Conditions 1 Group A -55OC 5 TC 5 +12SoC I subgroups unless otherwise speci

46、fied I z/ IV, = 3.0 V 1 1, 2, 3 I I J L I 1 IVcc = 4.5 v I I I IVcc = 5.5 v I Li Min 2.1 - - 3.15 3.85 I “IL I 1 I 1 I I I I 1 I IVcc = 3.9 v 1 J I. I I IVcc = 4.5 v I 1 1 I 1 ycc = 5.5 v I I I 2/ 1, 2, 3 I I. I I pl, = 5.5 v I I 1 I I Ycc = 5.5 v I, 2, 3 I 1 I I I 1 I I I I I I I fiL IVIN = 0.0 v 1

47、, I I 1 I I I I I I I I I I IN ISee I 4.4.1 I I 14 I I I I I I (Tested at Vcc 3.0 V and Irepeated et Vcc = 4.5 V land 5.5 V, see 4.4.ld pD Isee 4.4.16 3/ I I I I I I l 4 7, 8 its i Unit 1 flax I I IV 1 I I 1 1 I I I 0,9 i V I I 1.35 i I I 1.65 I I l -1.0 I PA I I 4.5 I pF I 28 I PF I I I I I See foo

48、tnotes at end of table. STANDARDIZED SIZE 5962-91605 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER QAKTON, OHZO 45444 REVISION. LEVEL SHEET 8 DEW FORM 193A JUL 91 L Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-t TABLE I. Electrical performance characteristics - Continued. I I I l I Test i Symbol i Conditions I Group A I Li -55OC 5 TC 5 t125C Isubgroups unless otherwise specified I I Min I I I I I I I 1 I 1.0 time, CP to Qn I I I I I I 1.0 U I I IPLH I I I I I I I IV, = 3.0 V I 9 I 1.0 Propagation delay ItpHL !C

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