1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R110-93. 93-03-22 K. A. CottongimB Changes in accordance with NOR 5962-R157-03. 93-05-11 K. A. CottongimC Added case outline Z. Redrew entire document. 95-06-15 K. A. CottongimD Added RadHard and class K device
2、s. Added RadHard requirements. Redrew entire document. -sld 97-10-29 K. A. CottongimE Table I; Changed the min and max limits for Radhard levels L,R device type 02 for the following tests +VOUT, -VOUT. Changed the max limits for VRLINE, VRLOAD, IIN, and Eff. For the IRIPtest separate subgroups 1,2,3
3、 to subgroup 1 for device type 01 max limit of 60 mAp-p and for subgroups 2 and 3 the max limit of 100 mA. For the IRIPtest separate subgroups 1,2,3 to subgroup 1 for device type 02 max limit of 80 mAp-p and for subgroup 2 and 3 the max limit of 120 mAp-p. 98-02-03 K. A. CottongimF Made correction t
4、o paragraph 4.3.5.a. Updated paragraph 1.2.3 to define the five class levels. Made changes to table I format. -sld01-03-05 Raymond MonninG Made changes to XREG, VOTLOADand TTLOAD in table I. Made additionsto footnotes 3/ and 5/ for table I. -gjc02-09-25 Raymond MonninH Table I; TTLOAD. Take out redu
5、ndant values for +VOUTand VOUT.For TTLOAD , 200s Max. on device type 01 was erroneously listed for +VOUTand VOUT. Correct value is 500 s.03-10-14 Raymond MonninJ Correct case outline X. For symbol D change max value from 1.455 to 1.460 and for symbol E change max value from 1.125 to 1.130. Update dr
6、awing to reflect current requirements. gc04-08-23 Raymond MonninK Added paragraph 1.5 and note 2. Added paragraph 3.2.3. Table I,add note for enhanced low dose rate effects. Paragraph 4.3.5.a, correct paragraph to add component tested dose rate. -sld07-01-11 Joseph RodenbeckL Add RHA level P to devi
7、ce type 02 in paragraphs 1.3, 1.5, 4.3.5 (table), table I, and SMD bulletin. -gz07-06-05 Robert M. HeberM Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 09-07-30 Charles F. Saffle REV SHEET REV M SHEET 15 REV STATUS REV M M M M M M M M M M M M M M
8、 OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Gregory Lude MICR
9、OCIRCUIT, HYBRID, LINEAR, 15 VOLT, DUAL CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-07-02 AMSC N/A REVISION LEVEL M SIZE A CAGE CODE 67268 5962-91614 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E378-09 Provided by IHSNot for ResaleNo reproduction or netwo
10、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3
11、 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 -
12、 91614 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-385
13、34 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MHF+2815D/883,MHF+2815DF/883 DC-DC converter, 15 W
14、, 15 V output 02 SMHF2815D,SMHF2815DF DC-DC converter, 15 W, 15 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as
15、qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This leve
16、l is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming f
17、low, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the d
18、evice acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may h
19、ave a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outlin
20、e(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-line Z See figure 1 8 Flange package 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum rati
21、ngs. 1/ Input voltage range -0.5 V dc to +50 V dc Power dissipation (PD): Device types 01 and 02 (non-RHA) 6 W Device type 02 (RHA levels P, L and R) 8.5 W Output power . 15.34 W Lead soldering temperature (10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating condition
22、s. Input voltage range +16 V dc to +40 V dc Case operating temperature range -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rad(Si)/s): Device type 02 (RHA levels P, L and R) 100 krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and hand
23、books. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuit
24、s, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microci
25、rcuit Drawings. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rat
26、e effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rad(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
27、DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 4 DSCC FORM 2234 APR 97 (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D
28、, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption h
29、as been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufac
30、turers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the m
31、odification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The cas
32、e outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control a
33、nd shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range.
34、3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with th
35、e PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initia
36、l quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and
37、 be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufactu
38、rers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and
39、 inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permit
40、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 28 V dc 0.5 V, CL=0
41、, unless otherwise specified Group A subgroups Device types Limits Unit Min Max Output voltage +VOUTIOUT= 500 mA 1 01,02 14.85 15.15 V dc 2,3 01,02 14.70 15.30 P,L,R 1,2,3 02 14.25 15.75 -VOUT1 01,02 -14.78 -15.23 2,3 01,02 -14.63 -15.38 P,L,R 1,2,3 02 -14.18 -15.82 Output current 3/ IOUTVIN= 16 V d
42、c to 40 V dc 1,2,3 01 0.0 0.900 A 02 0.0 0.700 P,L,R 1,2,3 02 0.0 0.700 VOUTripple voltage (VOUT) VRIPIOUT= 500 mA, B.W. = 10 kHz to 2MHz 1,2 01 80 mV p-p 02 175 3 01 120 02 275 P,L,R 1,2,3 02 350 VOUTline regulation +VOUT-VOUTVRLINEIOUT= 500 mA, VIN= 16 V dc to 40 V dc 1,2,3 01,02 50 mV P,L,R 1,2,3
43、 02 100 1,2,3 01,02 100 P,L,R 1,2,3 02 200 VOUTload regulation +VOUT-VOUTVRLOADIOUT= 0 to 500 mA, both outputs changed simultaneously 1,2,3 01,02 50 mV P,L,R 1,2,3 02 100 1,2,3 01 100 02 150 P,L,R 1,2,3 02 300 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking
44、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 2
45、8 V dc 0.5 V, CL= 0, unless otherwise specified Group A subgroups Device types Limits Unit Min Max Cross regulation (-VOUT) 4/ XREG50% IOUT= 500 mA, +IOUT= 50% to 10%, -IOUT= 50% 1 01 6 % 50% IOUT= 500 mA, -IOUT= 50% to 10%, +IOUT= 50% 6 50% IOUT= 500 mA, +IOUT= 70%, -IOUT= 30% 1 02 6 P,L,R 10 50% I
46、OUT= 500 mA, +IOUT= 30%, -IOUT= 70% 1 02 6 P,L,R 10 Input current IINIOUT= 0 A, inhibit pin (pin 1) = 0 V 1,2,3 01,02 12 mA P,L,R 02 15 IOUT= 0 A, inhibit pin (pin 1) = open 01,02 50 P,L,R 02 100 IINripple current IRIPIOUT= 500 mA, LIN= 2 H, B. W. = 10 kHz to 10 MHz 1 01 60 mA p-p 2,3 01 100 1 02 80
47、 2,3 02 120 P,L,R 1,2,3 02 150 Efficiency Eff IOUT= 500 mA 1 01,02 76 % 2,3 01,02 74 P,L,R 1,2,3 02 70 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91614 DEFENSE SUPPLY CENTE
48、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL M SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC+125C VIN= 28 V dc 0.5 V, CL= 0, unless otherwise specified Group A subgroups Device types Limits Unit Min Max Isolation ISO Input to output, input to case, or output to case, 500 V dc, TC= +25C 1 01,02 100 M P,L,R 02 100 Short circuit internal power diss
