DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf

上传人:deputyduring120 文档编号:700029 上传时间:2019-01-01 格式:PDF 页数:14 大小:135.04KB
下载 相关 举报
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf_第1页
第1页 / 共14页
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf_第2页
第2页 / 共14页
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf_第3页
第3页 / 共14页
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf_第4页
第4页 / 共14页
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT LINEAR CMOS DUAL 12-BIT 14-BIT SERIAL D A CONVERTERS MONOLITHIC SILICON.pdf_第5页
第5页 / 共14页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make changes to table II and t1, t2, t3, t4, t5, t6 tests as specified in table I. -ro 01-07-25 R. Monnin B Redraw. Update drawing to current requirements. - drw 12-10-04 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B

2、B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Sandra Rooney DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED

3、BY Sandra Rooney APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT/ 14-BIT SERIAL D/A CONVERTERS, MONOLITHIC SILICON DRAWING APPROVAL DATE 95-05-12 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-91647 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E003-13 Provided by IHSNot for Re

4、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consis

5、ting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN

6、. 1.2 PIN. The PIN is as shown in the following example: 5962 - 91647 01 M L A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classe

7、s Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA de

8、vice. 1.2.2 Device type. The device type identifies the circuit function as follows: Device type Generic number Circuit function Integral non-linearity 01 AD7244 14-bit digital-to-analog converter 2 LSB 1.2.3 Device class designator. The device class designator is a single letter identifying the pro

9、duct assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Ca

10、se outline. The case outline are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix

11、A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Posi

12、tive supply voltage (VDD) to AGND -0.3 V to +7.0 V Negative supply voltage (VSS) to AGND . +0.3 V to -7.0 V AGND to DGND -0.3 V to VDD+ 0.3 V Analog output voltage (VOUT) to AGND VSSto VDDVoltage reference output (REF OUT) to AGND -0.3 V to VDD+ 0.3 V Voltage reference input (REF INA, REF INB) to AG

13、ND -0.3 V to VDD+ 0.3 V Digital inputs to DGND -0.3 V to VDD+ 0.3 V Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Power dissipation (PD) to 75C . 550 mW 2/ Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient

14、(JA) 60C/W 1.4 Recommended operating conditions. Positive supply voltage range (VDD) . +4.75 V dc to +5.25 V dc Negative supply voltage (VSS) -4.75 V dc to -5.25 V dc Ambient operating temperature range -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The

15、 following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufactu

16、ring, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Micr

17、ocircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawin

18、g and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extende

19、d operation at the maximum levels may degrade performance and affect reliability. 2/ Derate above +75C by 6 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 432

20、18-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modifi

21、cation in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimension

22、s. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The

23、 terminal connections shall be as specified on figure 1. 3.2.3 Input/output code. The input/output code shall be as specified on figure 2. 3.2.4 Block diagram. The block diagram shall be as specified on figure 3. 3.2.5 Timing diagram. The timing diagram shall be as specified on figure 4. 3.3 Electri

24、cal performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test

25、requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages whe

26、re marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-

27、PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required

28、in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall

29、 be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product

30、 meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M

31、 in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is r

32、equired for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore

33、 documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 80 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction o

34、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise sp

35、ecified Group A subgroups Device type Limits Unit Min Max Supply current IDDCumulative current from the two VDDpins 1, 2, 3 01 28 mA Cumulative current from the two VSSpins 13 Reference input current IREF1, 2, 3 01 1 A Reference input voltage 1/ REF INA, REF INB 1, 2, 3 01 2.85 3.15 V Logic input vo

36、ltage, HIGH VINHVDD= 5.0 V 0.25 V 7, 8 01 2.4 V Logic input voltage, LOW VINLVDD= 5.0 V 0.25 V 7, 8 01 0.8 V Logic input current IINVIN= 0 V to VDD1, 2, 3 01 -10 +10 A Logic input capacitance CINSee 4.4.1d 4 01 10 pF Reference output voltage 2/ REF OUT 1 01 2.99 3.01 V 2, 3 2.98 3.02 Reference load

37、change 2/ REF OUT v.s. I Reference load current change (0-500 A) 1, 2, 3 01 -1 mV Total power dissipation PTDVDD= +5.0 V, VSS= -5.0 V 1, 2, 3 01 205 mW Integral nonlinearity INL 1, 2, 3 01 2 LSB Differential nonlinearity DNL 1, 2, 3 01 1 LSB Bipolar zero error BZE 1, 2, 3 01 10 LSB Positive full-sca

38、le error 3/ PFSE 1, 2, 3 01 10 LSB Negative full-scale error 3/ NFSE 1, 2, 3 01 10 LSB See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO

39、 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Voltage output settling time tSPositive/negative full-scale change,

40、see 4.4.1d 4 01 4 s TFS to TCLK falling edge t14/, 6/, 7/ 9, 10, 11 01 50 ns TCLK falling edge to TFS t24/, 6/, 7/ 9, 10, 11 01 100 ns TCLK cycle time 5/ t34/, 6/, 7/ 9, 10, 11 01 200 ns Data valid to TCLK setup time t44/, 6/, 7/ 9, 10, 11 01 40 ns Data valid to TCLK hold time t54/, 6/, 7/ 9, 10, 11

41、 01 100 ns LDAC pulse width t64/, 7/ 9, 10, 11 01 40 ns 1/ Recommended input range; REF INA = REF INB = 3.0 V during testing. 2/ For capacitive loads greater than 50 pF a series resistor is required. 3/ Measured with respect to REF IN and includes bipolar offset error. 4/ VDD= 5.00 0.25 V, VSS= -5.0

42、0 0.25 V, AGND = DGND = 0 V, tr= tf= 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V. 5/ TCLK mark/space ratio is 40/60 to 60/40. 6/ See figure 4. 7/ These values used as setup conditions for functional testing. A passing device is indicated by proper function. Provided by IHSNot fo

43、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline L Terminal number Terminal symbol 1 LDACA 2 TFSA 3 D

44、TA 4 TCLKA 5 DGND 6 TP1 7 VDD8 AGND 9 VOUTB10 VSS11 TP2 12 REF INB 13 LDACB 14 TFSB 15 DTB 16 TCLKB 17 DGND 18 TP3 19 VDD20 AGND 21 VOUTA22 VSS23 REF OUT 24 REF INA FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAND

45、ARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 DAC latch contents Analog output 1/ MSB LSB VOUT(V) 01 1111 1111 1111 +2.999634 V 01 1111 1111 1110 +2.99268 V 00 0000 0000 0001 +0.000366 V 00 0000 0000 0000 0 V

46、 11 1111 1111 1111 -0.000366 10 0000 0000 0001 -2.999634 V 10 0000 0000 0000 -3 V 1/ Assuming REF IN = +3 V. FIGURE 2. Input/output code table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND A

47、ND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3

48、990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 FIGURE 4. Timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-91647 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 11 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be

展开阅读全文
相关资源
猜你喜欢
  • ASTM E2970-2015 Standard Practice for Specifying Color by the Natural Colour System (NCS)《采用自然色彩系统 (NCS) 规定颜色的标准实施规程》.pdf ASTM E2970-2015 Standard Practice for Specifying Color by the Natural Colour System (NCS)《采用自然色彩系统 (NCS) 规定颜色的标准实施规程》.pdf
  • ASTM E2971-2014 Standard Test Method for Determination of Effective Boron-10 Areal Density in Aluminum Neutron Absorbers using Neutron Attenuation Measurements《使用中子衰减测量法测定铝中子吸收剂中的有.pdf ASTM E2971-2014 Standard Test Method for Determination of Effective Boron-10 Areal Density in Aluminum Neutron Absorbers using Neutron Attenuation Measurements《使用中子衰减测量法测定铝中子吸收剂中的有.pdf
  • ASTM E2971-2016 Standard Test Method for Determination of Effective Boron-10 Areal Density in Aluminum Neutron Absorbers using Neutron Attenuation Measurements《采用中子衰减测量法测定铝中子吸收剂中的有.pdf ASTM E2971-2016 Standard Test Method for Determination of Effective Boron-10 Areal Density in Aluminum Neutron Absorbers using Neutron Attenuation Measurements《采用中子衰减测量法测定铝中子吸收剂中的有.pdf
  • ASTM E2972-2015 Standard Guide for Production Testing and Value Assignment of In-House Reference Materials for Metals Ores and Other Related Materials《金属 矿石以及其他相关材料用内部参考材料的生产 试验和价值.pdf ASTM E2972-2015 Standard Guide for Production Testing and Value Assignment of In-House Reference Materials for Metals Ores and Other Related Materials《金属 矿石以及其他相关材料用内部参考材料的生产 试验和价值.pdf
  • ASTM E2973-2015 Standard Digital Reference Images for Inspection of Aluminum and Magnesium Die Castings《检查铝和镁压铸件的标准数字参考图像》.pdf ASTM E2973-2015 Standard Digital Reference Images for Inspection of Aluminum and Magnesium Die Castings《检查铝和镁压铸件的标准数字参考图像》.pdf
  • ASTM E2975-2014 Standard Test Method for Calibration of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准的标准试验方法》.pdf ASTM E2975-2014 Standard Test Method for Calibration of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准的标准试验方法》.pdf
  • ASTM E2975-2015 Standard Test Method for Calibration of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准的标准试验方法》.pdf ASTM E2975-2015 Standard Test Method for Calibration of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准的标准试验方法》.pdf
  • ASTM E2975-2016 Standard Test Method for Calibration or Calibration Verification of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计检定或检定校准的标准试验方法》.pdf ASTM E2975-2016 Standard Test Method for Calibration or Calibration Verification of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计检定或检定校准的标准试验方法》.pdf
  • ASTM E2975-2016e1 Standard Test Method for Calibration or Calibration Verification of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准或校准检定的标准试验方法》.pdf ASTM E2975-2016e1 Standard Test Method for Calibration or Calibration Verification of Concentric Cylinder Rotational Viscometers《同心圆筒旋转粘度计校准或校准检定的标准试验方法》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1