1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct notes to tests in table I and figure 1. Update drawing requirements to MIL-PRF-38534. 01-06-14 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-06-18 Raymond Monnin C Updated drawing paragraphs. -sld 12-02-13 Charl
2、es F. Saffle REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWING
3、 IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 90-VOLT SYNCHRO TO DIGITAL CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-01-19 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-92054 SHEET 1 OF 11 DSCC FORM 22
4、33 APR 97 5962-E159-124 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing do
5、cuments five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.
6、 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 92054 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assur
7、ance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Ci
8、rcuit function Frequency Accuracy 1 LSB BIT/VEL 01 SDC-14612II-112 14-bit, 90 V S/D converter 400 Hz 4 min VEL 02 SDC-14612IIT-112 14-bit, 90 V S/D converter 400 Hz 4 min BIT 03 SDC-14614II-112 14-bit, 90 V S/D converter 60 Hz 4 min VEL 04 SDC-14614IIT-112 14-bit, 90 V S/D converter 60 Hz 4 min BIT
9、05 SDC-14617II-112 16-bit, 90 V S/D converter 400 Hz 4 min VEL 06 SDC-14617IIT-112 16-bit, 90 V S/D converter 400 Hz 4 min BIT 07 SDC-14619II-112 16-bit, 90 V S/D converter 60 Hz 4 min VEL 08 SDC-14619IIT-112 16-bit, 90 V S/D converter 60 Hz 4 min BIT 09 SDC-14617II-114 16-bit, 90 V S/D converter 40
10、0 Hz 2 min VEL 10 SDC-14617IIT -114 16-bit, 90 V S/D converter 400 Hz 2 min BIT 11 SDC-14619II-114 16-bit, 90 V S/D converter 60 Hz 2 min VEL 12 SDC-14619IIT-114 16-bit, 90 V S/D converter 60 Hz 2 min BIT 1.2.3 Device class designator. This device class designator shall be a single letter identifyin
11、g the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest r
12、eliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This leve
13、l uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of th
14、e other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D
15、 Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
16、 5962-92054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 36 Dual-in-line 1.2.5 L
17、ead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . +7.0 V dc Negative supply voltage (VEE) -7.0 V dc Reference input voltage . 130 V rms Digital input voltage range . -0.3 V dc to +7.0 V dc Power dissipation, TA= +125
18、C (PD) . 550 mW Thermal resistance junction-to-case (qJC) 8.0 C/W Thermal resistance junction-to-ambient (qJA) . 20 C/W Storage temperature range -65 C to +150 C Lead temperature (soldering, 10 seconds) +300 C 1.4 Recommended operating conditions. Positive supply voltage (VCC) . +4.75 V dc to +5.25
19、V dc Negative supply voltage (VEE) -4.75 V dc to -5.25 V dc Reference input voltage range . 10 V rms to 130 V rms Reference input carrier frequency range: Device types 01, 02, 05, 06, 09, and 10 . 360 Hz to 5000 Hz Device types 03, 04, 07, 08, 11, and 12 . 47 Hz to 1000 Hz Signal input voltage range
20、 . 81 V rms to 99 V rms Ambient operating temperature range (TA) -55 C to +125 C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specifie
21、d, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard f
22、or Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the St
23、andardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supers
24、edes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability.Provided by IHSNot for ResaleNo reprodu
25、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device cla
26、sses D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate,
27、modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class.
28、3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connectio
29、ns shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specifie
30、d operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The
31、 device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (va
32、riables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level
33、control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) sub
34、mitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this
35、 drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein
36、. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall
37、 be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAor TCas specified in acc
38、ordance with table I of method 1005 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or
39、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55 C TA +125 C VCC= +5 V dc, VEE=
40、 -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution 1/ RES 7,8A,8B 01-04 14 Bits 05-12 16 Output accuracy 2/ AOUT 7,8A,8B 01-04 -4 +4 LSB 05-08 -13 +13 09-12 -7 +7 Accuracy repeatability 2/ 3/ AR 7,8A,8B All -1.0 +1.0 LSB Reference input voltage range 3/
41、VIN14,5,6 All 10 130 V rms Reference input impedance 3/ ZIN1Single ended 4,5,6 All 270 kW Differential 540 Reference input common mode range 3/ VCM14,5,6 All -200 +200 V pk Signal input common mode range 3/ VCM24,5,6 All -180 +180 V pk Signal input impedance 3/ ZIN2 Line-to-line 4,5,6 All 80 kW Line
42、-to-ground 123 Digital output low voltage 1/ VOLIOL= -1.6 mA 1,2,3 All 0.4 V Digital output high voltage 1/ VOHIOH= 0.4 mA 1,2,3 All 2.8 V Output leakage current 3/ IOZ1,2,3 All -60 +60 mA Digital input high voltage 1/ VIHDigital inputs INH, EL, and EM. VIN= 2.0 V 1,2,3 All pass/ fail See footnotes
43、at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-92054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteri
44、stics - Continued. Test Symbol Conditions -55 C TA +125 C VCC= +5 V dc, VEE= -5 V dc unless otherwise specified Group A subgroups Device type Limits Unit Min Max Digital input low voltage 1/ VILDigital inputs INH, EL, and EM. VIN= 0.8 V 1,2,3 All pass/ fail Digital input current 1/ IINInternal pull-
45、up 4,5,6 All -10 mA Inhibit voltage 1/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 1/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01 through 04, and bits 9 through 16 for device ty
46、pes 05 through 12. 7,8A,8B All 0.8 V Disable voltage 1/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 14 for device types 01 through 04, and bits 9 through 16 for device types 05 through 12. 7,8A,8B All 2.0 V Positive supply voltage ICCVCC= +5.25 V 1,2,
47、3 All +17 mA Negative supply voltage IEEVEE= -5.25 V 1,2,3 All -17 mA Analog velocity output voltage VOUT4/ 7,8A,8B All 3.24 4.00 V Bandwidth 1/ BW 7,8A,8B 01,02, 05,06,09,10 72 134 Hz 03,04,07,08,11,12 10 20 1/ These parameters are tested on a go-no-go basis only or in conjunction with other measur
48、ed parameters and are not directly testable. 2/ Output accuracy is measured at angles from 0 , to 180 , in 15 increments, and at 225 , 270 , and 315 . 3/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 4/ Analog output voltage is tested at 8 revolutions per second (rps) for device types 01 and 02, 1 rps for device types 03 and 04, 2 rps for
