1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R019-96. - JAK 95-12-18 Monica L. Poelking B Update boilerplate to current MIL-PRF-38535 requirements. - MAA 08-12-17 Thomas M. Hess C Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. -
2、LTG 13-09-24 Thomas M. Hess REV SHEET REV C C C SHEET 15 16 17 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAW
3、ING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLOCK ENABLE, TTL COMPATIBLE INPUTS, MONOLITH
4、IC SILICON DRAWING APPROVAL DATE 94-05-23 REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93148 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E579-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93148 DLA LAND AND
5、 MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes a
6、re available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93148 01 M R A Federal stock class designator RHA designator (see 1.2.1
7、) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device cla
8、ss M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01
9、 54ABT377 Octal edge-triggered D-type flip-flop with clock enable, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the
10、 requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive de
11、signator Terminals Package style R GDIP1 -T20 or CDIP2 -T20 20 Dual-in-line S GDFP2-F20 or CDFP3-T20 20 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M
12、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93148 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage ran
13、ge (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to +5.5 V dc 4/ DC input clamp current (IIK) (VIN 0.0 V) . -18 mA DC output clamp current (IOK) (VOUT 0.0 V) . -50 mA DC output current (IOL) (per output) . +96 mA Maximu
14、m power dissipation (PD ) 500 mW Storage temperature range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) +4.5 V
15、dc to +5.5 V dc Input voltage range (VIN) +0.0 V dc to VCCOutput voltage range (VOUT). +0.0 V dc to VCCMinimum high level input voltage (VIH) . +2.0 V Maximum low level input voltage (VIL) +0.8 V Maximum high level output current (IOH) -24 mA Maximum low level output current (IOL) +48 mA Maximum inp
16、ut rise or fall rate (t/V) . 5 ns/V Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all vo
17、ltages are referenced to GND. 3/ The limits of the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The input and output voltage ratings may be exceeded provided that the input and output current ratings are observed. Provided b
18、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93148 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and
19、handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circu
20、its, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 -
21、 Standard Microcircuit Drawings. (Copies of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Order of precedence. In the event of a conflict between the text of this d
22、rawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q
23、 and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be
24、 in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535,
25、 appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Block or Log
26、ic diagram. The block or logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as s
27、pecified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperatu
28、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCI
29、RCUIT DRAWING SIZE A 5962-93148 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD
30、PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device
31、 class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A.
32、 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufactu
33、rer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q
34、and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A
35、 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that af
36、fects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made a
37、vailable onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 127 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted withou
38、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93148 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VC
39、C +5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOH1For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -3 mA All 4.5 V 1, 2, 3 2.5 V VOH2For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -
40、3 mA All 5.0 V 1, 2, 3 3.0 VOH3For all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOH= -24 mA All 4.5 V 1, 2, 3 2.0 Low level output voltage 3007 VOLFor all inputs affecting output under test, VIN= 2.0 V or 0.8 V IOL= +48 mA All 4.5 V 1, 2, 3 0.55 V Off-state leakage current IOFFFor inp
41、uts or output under test, VINor VOUT= 4.5 V All other pins at 0.0 V All 0.0 V 1 100 A High-state leakage current ICEXFor output under test VOUT= 5.5 V outputs at high logic state All 5.5 V 1, 2, 3 +50 A Negative input clamp voltage 3022 VIC-For input under test IIN= -18 mA All 4.5 V 1, 2, 3 -1.2 V I
42、nput current high 3010 IIHFor input under test VIN= VCCAll 5.5 V 1, 2, 3 +2.0 A Input current low 3009 IILFor input under test VIN= GND All 5.5 V 1, 2, 3 -2.0 A Output current 3011 IO 4/ VOUT= 2.5 V All 5.5 V 1, 2, 3 -50 -180 mA Quiescent supply current delta, TTL input levels 3005 ICC5/ For input u
43、nder test VIN= 3.4 V For all other inputs, VIN= VCCor GND All 5.5 V 1, 2, 3 2.5 mA Quiescent supply current, output high 3005 ICCHVIN= VCCor GND IOUT = 0.0 A All 5.5 V 1, 2, 3 250 A Quiescent supply current, output low 3005 ICCLVIN= VCCor GND IOUT = 0.0 A All 5.5 V 1, 2, 3 30 mA Input capacitance 30
44、12 CINTC= +25C, See 4.4.1b All 5.0 V 4 10.5 pF Output capacitance 3012 CI/OTC= +25C, See 4.4.1b All 5.0 V 4 17.0 pF See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93148 DLA LAN
45、D AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +4.5 V VCC +5.5 V unless otherwise specified Device type VCCGroup A subgroups
46、 Limits 3/ Unit Min Max Low level ground bounce noise VOLP6/ VIH= 3.0 V,VIL= 0.0 V TA= +25C See 4.4.1c See figure 4 All 5.0 V 4 700 mV VOLV6/ 4 -1200 High level VCCbounce noise VOHP6/ VIH= 3.0 V,VIL= 0.0 V TA= +25C See 4.4.1c See figure 4 All 5.0 V 4 1450 mV VOHV6/ 4 -700 Functional test 3014 7/ VIH
47、= 2.0 V,VIL= 0.8 V Verify output VOUTSee 4.4.1d All 4.5 V 7, 8 L H VIH= 2.0 V,VIL= 0.8 V Verify output VOUTSee 4.4.1d All 5.5 V 7, 8 L H Clock frequency fCLOCK8/ CL= 50 pF minimum RL= 500 See figure 5 All 5.0 V 9 0 150 MHz CL= 50 pF minimum RL= 500 See figure 5 All 4.5 V and 5.5 V 10, 11 0 150 Pulse
48、 duration CLK high or low tw 8/ CL= 50 pF minimum RL= 500 See figure 5 All 5.0 V 9 3.3 ns All 4.5 V and 5.5 V 10, 11 3.3 Setup time high or low nD to CLK tS1 8/ CL= 50 pF minimum RL= 500 See figure 5 All 5.0 V 9 2.0 ns All 4.5 V and 5.5 V 10, 11 2.5 Setup time high or low CLKEN to CLK tS2 8/ CL= 50 pF minimum RL= 500 See figure 5 All 5.0 V 9 3.0 ns All 4.5 V and 5.5 V 10, 11 3.0 Hold time high or low nD from CLK th1 8/ CL= 50 pF minimum RL= 500 See figure 5 All 5.0 V 9 1.8 ns All 4.5 V and 5.5 V 10, 11 1.8 Hold time high or low CLKEN from CLK th2 8/ CL= 50 pF minimum RL= 500
