1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change limits for group A subgroups for small signal bandwidth test on Table I. Editorial changes throughout the drawing. - lgt 98-02-13 R. MONNIN B Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. Drawing updated to reflect cur
2、rent requirements. - gt 04-02-06 R. MONNIN C Update boilerplate paragraphs. - ro 09-08-03 C. SAFFLE REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/
3、www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, LOW NOISE, WIDEBAND OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL
4、DATE 93-10-12 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-93259 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E420-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS
5、COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are avail
6、able and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 93259 01 M P A Federal stock class designator RHA designator (see 1.2.1) Device
7、 type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA ma
8、rked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 CLC425 Low
9、 noise, wideband operational amplifier converter 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant,
10、 non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1
11、-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI
12、NG SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) 7 V dc Output current (IOUT) 96 mA Common mode input voltage (VCM) VSDifferential input current (IID): 25 mA Power dissipa
13、tion (PD) 1.15 W Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +175C Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) 40C/W Thermal resistance, junction-to-ambient (JA) . 130C/W 1.4 Recommended operating conditions. Supply voltage (VS) .
14、5 V dc Gain range (AV) . 10 to 1000 Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherw
15、ise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1
16、835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Sta
17、ndardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, superse
18、des applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reprod
19、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device class
20、es Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M s
21、hall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF
22、-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Un
23、less otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups sp
24、ecified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space lim
25、itations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PR
26、F-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device
27、classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved so
28、urce of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for d
29、evice class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered
30、to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For devic
31、e class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device c
32、lass M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
33、OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Static and dc tests Input bias current IIN1, 2 01 -20 +20 A 3 -40 +40
34、 Input offset current IIO3/ 1, 2 01 -2.0 +2.0 A 3 -3.4 +3.4 Input offset voltage VIORS= 50 1 01 -800.0 +800.0 V 2, 3 -1000.0 +1000.0 Average input bias current drift TC3/ 2 01 -120 0 nA/C (IIN) 3 -250Average input offset voltage drift TCTA= +125C, -55C 3/ 2 01 -4 +4 V/C (VIO) 3 -8 +8Average input of
35、fset current drift TCTA= +125C, -55C 3/ 2 01 -25 +25 nA/C (IIO) 3 -50 +50 Supply current ISRL= 1, 2 01 16 mA 3 18 Power supply rejection ratio PSRR +VS= +4.0 V to +5.0 V, 1 01 88 dB -VS= -4.0 V to -5.0 V 2 86 3 82 Common mode 3/ rejection ratio CMRR VCM= 1 V 4 01 92 dB 5 90 6 88 See footnotes at end
36、 of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charact
37、eristics - continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Frequency domain tests Small signal bandwidth SSBW -3 dB bandwidth, 4 01 60 MHz VOUT 0.4 VPP5 50 6 65 Large signal bandwidth LSBW -3 dB bandwidth, 3/ 4, 6 01 3
38、0 MHz VOUT 5.0 VPP5 20 Gain flatness peaking high GFPH 0.1 MHz to 30 MHz, 4 01 0.5 dB VOUT 0.4 VPP5, 6 0.7 Gain flatness rolloff GFR 0.1 MHz to 30 MHz, 4 01 0.5 dB VOUT 0.4 VPP5, 6 0.7 Linear phase deviation LPD 0.1 MHz to 30 MHz, 3/ 4, 6 01 1.5 Degrees VOUT 0.4 VPP5 2.5 Distortion and noise tests S
39、econd harmonic distortion HD2 1 VPPat 10 MHz 4, 6 01 48 dBc 5 46 Third harmonic distortion HD3 1 VPPat 10 MHz 4, 6 01 65 dBc 5 60 Noise floor SNF At 1 MHz to 100 MHz 3/ 4, 6 01 -165 dBm 5 -162 (1 Hz) Integrated noise INV At 1 MHz to 100 MHz 3/ 4 01 13 V 5 18 6 13 Input noise voltage VN At 1 MHz to 1
40、00 MHz 3/ 4, 6 01 1.25 nV/Hz 5 1.8 Input noise current ICN At 1 MHz to 100 MHz 3/ 4, 5 01 2.5 pA/Hz 6 4.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CE
41、NTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Timing tests Rise and fall time t
42、R, tF0.4 V step 3/ 9, 11 01 4.7 ns 10 7.0 Slew Rate SR Measured 1 V with 3/ 4, 6 01 250 V/s 5 V step, AV= +20 5 200 Settling time tS2 V step at 0.2% of 3/ 9, 11 01 30 ns the fixed value 10 40 Overshoot OS 0.4 V step 3/ 9 01 10 % 10, 11 12 Performance tests Common mode input resistance RINC3/ 1, 2 01
43、 1.6 M 3 0.6 Differential mode input resistance RIND3/ 1, 2 01 3 k 3 1 Common mode input capacitance CINC3/ 1, 2, 3 01 3 pF Closed loop output resistance ROUT3/ 1, 2 01 10 m 3 50 Output voltage range VOUTRL= 3/ 1, 2 01 -3.7 +3.7 V 3 -3.5 +3.5 VOUTLRL= 100 3/ 1, 2 -3.2 +3.2 3 -2.8 +2.8 Common mode in
44、put voltage range CMIR 3/ 1, 2 01 -3.5 +3.5 V 3 -3.4 +3.4 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
45、 LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Performance tests - continued Output current IOUTSource 3/ 1, 2 01 70 mA 3 60 Sin
46、k 3/ 1, 2 553 40 1/ Unless otherwise specified, VS= 5 V dc, AV= +20, load resistance (RL) = 100 , feedback resistance (RF) = 499 , and gain setting resistance (RG) = 26.1 . 2/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this t
47、able. Negative current shall be defined as conventional current flow out of a device terminal. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAW
48、ING SIZE A 5962-93259 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outline P Terminal number Terminal symbol 1 NC (see note 1) 2 -INPUT 3 +INPUT 4 -VCC5 NC (see note 1) 6 VOUT7 +VCC8 RP(see note 2) NOTES: 1. NC = No connection. 2. The RPis optional. This pin is used to externally adjust the supply cu
