1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to current requirements. Editorial changes throughout. - gap 06-10-02 Raymond Monnin REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CE
2、NTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Thomas M. Hess COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ECL, LOW POWER QUINT EXCLUSIVE OR/NOR GATE, AND AGENCIES OF THE DEPARTMENT
3、 OF DEFENSE DRAWING APPROVAL DATE 94-04-22 MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-94590 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E523-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
4、IZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A cho
5、ice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94590 01 M X X Federal stock c
6、lass designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the
7、 appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device
8、type Generic number Circuit function 01 100307 Low power quint exclusive OR/NOR Gate 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the req
9、uirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive design
10、ator Terminals Package style X GDIP5-T24 or CDIP6-T24 24 dual-in-line package Y See figure 1 24 quad-flat package 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproducti
11、on or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Negative supply voltage range (VEE) -7.0 V dc to +0.5 V dc
12、DC input voltage range (VIN) VEEto +0.5 V dc DC input current range (IIN) -30 mA to +5.0 mA Maximum dc output current (IOUT) -50 mA Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +175C Maximum power dissipation (PD) 500 mW Thermal
13、 resistance, junction-to-case (JC): Case X See MIL-STD-1835 Case Y 28 C/W 1.4 Recommended operating conditions. Negative supply voltage range (VEE) -5.7 V dc minimum to -4.2 V dc maximum High level input voltage range (VIH) -1.165 V dc minimum to -0.870 V dc maximum Low level input voltage range (VI
14、L) . -1.830 V dc minimum to -1.475 V dc maximum Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unle
15、ss otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits.
16、MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or www
17、.dodssp.daps.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in
18、 this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provid
19、ed by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual it
20、em requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item r
21、equirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for d
22、evice classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table. The truth tab
23、le shall be as specified on figure 3. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 4. 3.2.5 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter
24、 limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subg
25、roups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to s
26、pace limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance wit
27、h MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For
28、 device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an app
29、roved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein
30、or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits de
31、livered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. F
32、or device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M.
33、Device class M devices covered by this drawing shall be in microcircuit group number 33 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COL
34、UMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C -5.7 V VEE -4.2 V Group A subgroups Limits Unit Unless otherwise specified Min Max 1, 2 -1025 -870 High level output voltage VOH VEE= -4.2 V, -5
35、.7 V VIH= -0.87 V 3 -1085 -870 mV 1, 2 -1830 -1620 Low level output voltage VOL VIL= -1.83 V Loading 50 to -2.0 V 3 -1830 -1555 mV 1, 2 -1035 High level threshold output voltage VOHC VEE= -4.2 V, -5.7 V VIH= -1.165 V 3 -1085 mV 1, 2 -1610 Low level threshold output voltage VOLC VIL= -1.475 V Loading
36、 50 to -2.0 V 3 -1555 mV Negative power supply drain currentIEE VEE= -5.7 V, -4.2 V 1, 2, 3 -75 -25 mA Low level input current IILVEE= -4.2 V VIN= -1.83 V 1, 2, 3 0.5 A 1, 2 250 D2n3 350 1, 2 350 High level input current IIHVEE= -5.7 V VIN= -0.87 V D1n3 500 A Functional tests VEE= -4.2 V, -5.7 V VIN
37、= -1.165 V, VIL= -1.830 V See 4.4.1b 7, 8 11 0.3 2.1 9 0.4 1.9 Propagation delay time, D2n to On/ nO tPLH1tPHL1VEE= -4.2 to -5.7 V 10 0.4 2.4 ns 11 0.3 1.9 9 0.4 1.8 Propagation delay time, D1n to On/ nO tPLH2tPHL210 0.4 2.2 ns 11 0.8 2.9 9 0.9 2.8 Propagation delay time, Dn to F output tPLH3tPHL310
38、 0.9 3.4 ns 11 0.20 1.70 9 0.30 1.60 Transition time, On/ nO 1/ tTLHtTHL10 0.20 1.70 ns 1/ This parameter is provided as design information only (Not tested but guaranteed). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWIN
39、G SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Case Y Millimeters Inches Dimension Min Max Min Max Notes A 2.16 .085 b 0.41 0.46 .016 .018 c 0.10 0.15 .004 .006 D 22.10 28.45 .870 1.120 D1 9.4 10.16 .370 .400 4 E 22.10 28.4
40、5 .870 1.120 E1 9.40 10.16 .370 .400 4 e 1.14 1.40 .045 .055 L 6.35 9.14 .250 .360 Q 0.89 1.27 .035 .050 5 S 1.91 .075 NOTES: 1. The preferred unit of measurement is millimeters. However, this item was designed using inch-pound units of measurements. In case problems involving conflicts between the
41、metric and inch-pound units, the inch-pound units shall rule. 2. Lead number 1 is identified by a tab located on the lead. 3. Lead numbers are shown for reference only and do not appear on package. 4. Dimensions D1 and E1 allow glass meniscus. 5. Dimension Q shall be measured at the point of exit of
42、 the lead from the body. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 D
43、evice Type 01 01 Case outline X Y Terminal Connection Terminal symbol Terminal Symbol 1 OeD1d2 eOD1e3 OdD2e4 dOOe5 FeO6 VCC Od7 VCCA dO8 cOF9 OcVCC 10 bOVCCA 11 Ob cO12 aOOc13 Oa bO14 D1aOb 15 D2aaO16 D1bOa 17 D2bD1a18 VEE D2a19 D1cD1b20 D2cD2b21 D2dVEE 22 D1dD1c23 D1eD2c24 D2eD2dFIGURE 2. Terminal
44、connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 INPUTS OUTPUTS D1n D2n On nO0 0 0 1 0
45、 1 1 0 1 0 1 0 1 1 0 1 F = (D1a + D2a) + (D1b + D2b) + (D1c + D2c) + (D1d + D2d) + (D1e + D2e) FIGURE 3. Truth table. FIGURE 4. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUP
46、PLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. VCC= VCCA= +2.0 V, VEE= -2.5 V 2. L1, L2 and L3 = equal length 50 impedance lines. 3. RT= 50 terminator internal to scope. 4. Decoupling 0.1 F from GND to VCCand VEE. 5. All unused outputs are load
47、ed with 50 to GND. 6. CL= fixture and stray capacitance 3 pF. FIGURE 5. Test circuit and switching waveforms Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
48、 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
