1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change in accordance with N.O.R. 5962-R238-94. 94-07-27 M. A. FRYE B Add case outline X. Editorial changes throughout. Redrawn 95-07-10 M. A. FRYE C Drawing updated to reflect current requirements. -ro 01-11-26 R. MONNIN D Five year review requir
2、ement. -rrp 08-08-19 R. HEBER REV SHET REV SHET REV STATUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAJESH PITHADIA COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil
3、 THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL FRYE MICROCIRCUIT, LINEAR, DUAL PRECISION CHOPPER STABILIZED OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94-06-08 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5
4、962-94600 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E290-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 223
5、4 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN).
6、When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94600 01 M G X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4
7、) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA
8、levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LTC1051 Dual, precision, chopper stabilized operational amplifier 02 LTC
9、1051A Dual, precision, chopper stabilized operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD
10、-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Packag
11、e style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line X See figure 1 8 Can 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted wit
12、hout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Total supply voltage (+VSto VS) . 18 V Input voltage (VIN) . (+VS+ 0.3 V) to (-VS 0.3 V)
13、Output short circuit duration . Indefinite Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) : Cases G and P . See MIL-STD-1835 Case X . 70C/W Thermal resistance, junction-to-ambient (JA) : Cases G and X . 150C/W Case P .
14、 100C/W 1.4 Recommended operating conditions. Supply voltage (VS) . 4.75 V to 16 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawin
15、g to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883
16、- Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/a
17、ssist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precede
18、nce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliab
19、ility. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The
20、individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The indi
21、vidual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and
22、 herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performa
23、nce characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements
24、. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking o
25、f the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. M
26、arking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-3
27、8535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required
28、 from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q
29、and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A
30、 shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawin
31、g. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.1
32、0 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
33、SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VS= 5 V Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Inpu
34、t offset voltage 2/ VIOTA= +25C 1 All -5 +5 V +VS= +5 V, -VS= 0 V, TA= +25C -5 +5 Average input offset 2/ drift VIO1,2,3 All -0.05 +0.05 V/C +VS= +5 V, -VS= 0 V -0.05 +0.05 Input bias current IIB1 01 -65 +65 pA 02 -50 +50 2,3 01 -450 +450 02 -500 +500 +VS= +5 V, -VS= 0 V, VCM= 0 V, TA= +25C 1 All -5
35、0 +50 Input offset current IIO1 01 -125 +125 pA 02 -100 +100 2,3 01 -175 +175 02 -150 +150 +VS= +5 V, -VS= 0 V, VCM= 0 V, TA= +25C 1 All -80 +80 Common mode rejection ratio CMRR VCM= -VSto +2.7 V 1 All 114 dB 2,3 110 Differential common mode rejection ratio CMRR TA= +25C 1 01 112 dB See footnotes at
36、 end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance cha
37、racteristics Continued. Test Symbol Conditions -55C TA +125C VS= 5 V Group A subgroups Device type Limits 1/ Unit unless otherwise specified Min Max Power supply rejection ratio PSRR VS= 2.375 to 7.5 V 1,2,3 01 116 dB 02 120 Large signal voltage gain AVVOUT= 4 V, RL= 10 k 4,5,6 01 116 dB 02 120 Maxi
38、mum output voltage swing VOUTRL= 10 k 1,2,3 01 -4.5 4.5 V 02 -4.7 4.7 Supply current ISNo load 1 01 4.0 mA 02 2.0 2,3 01 5.0 02 2.5 +VS= +5 V, -VS= 0 V, 1,2,3 01 -3 +3 no load 02 -1.5 +1.5 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, i
39、s used in this table. Negative current shall be defined as conventional current flow out of a device terminal. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD M
40、ICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Case outline X FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
41、 DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline X Symbol Dimensions Notes Inches Millimeters Min Max Min Max A .165 .185 4.19 4.70 b1 .016 .021 .41 .53 2 b2 .016 .024 .41 .61 D .335 .370 8.51 9.40 D1 .305
42、 .335 7.75 8.51 D2 .110 .160 2.79 4.06 e .230 BSC 5.84 BSC F - .040 - 1.02 k .028 .034 .71 .86 k1 .027 .045 .69 1.14 3 L .500 .750 12.70 19.05 2 L1 - .050 - 1.27 2 Q .010 .045 .25 1.14 45 BSC 45 BSC 4 Notes 1,5,6 NOTES: 1. The U.S. government preferred system of measurement is the metric SI system.
43、However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Diameter is uncontrolled in L1 and beyond .500 from the reference plane. 3. Measured from maximum d
44、iameter of the product. 4. is the basic spacing from the centerline of the tab to terminal 1. 5. Leads having a maximum diameter .019 inches measured in gauging plane .054 + .001 - .000 inches below the base plane of the product shall be within .007 of their true position relative to a maximum width
45、 tab. 6. This style package may be measured by direct methods or by gauge. FIGURE 1. Case outline continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
46、 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outlines G, P, and X Terminal number Terminal symbol 1 OUTPUT A 2 -INPUT A 3 +INPUT A 4 -VS5 +INPUT B 6 -INPUT B 7 OUTPUT B 8 +VSFIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or netw
47、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94600 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection proc
48、edures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL
