1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 02-02-21 R. MONNIN B Update drawing paragraphs to current MIL-PRF-38535 requirements. -rrp 10-03-22 C. SAFFLE REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5
2、 6 7 8 9 10 11 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH R. PITHADIA APPROVED BY M
3、ICHAEL A. FRYE MICROCIRCUIT, LINEAR, CMOS, DUAL MICROPOWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-04-13 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-94604 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E456-09 Provided by IHSNot for ResaleNo reproduction or networking
4、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability
5、(device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as
6、shown in the following example: 5962 - 94604 01 M P A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devi
7、ces meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s
8、). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LMC6061 CMOS dual micropower operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device c
9、lass Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as
10、 designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by
11、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (+VSto -VS) 16
12、 V Current at output pin 30 mA Current at input pin 10 mA Current at power supply pin . 40 mA Differential input voltage VSVoltage at input/output pin . (+VS) + 0.3 V (-VS) - 0.3 V Output short circuit to +VS. 2/ Output short circuit to -VS3/ Storage temperature range -65C to +150C Maximum power dis
13、sipation (PD) 2.6 mW Lead temperature (soldering, 10 seconds) +260C Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA) . 111C/W 1.4 Recommended operating conditions. Supply voltage range (+VS) . 4.5 V to 15.5 V Am
14、bient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these doc
15、uments are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Co
16、mponent Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700
17、 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Do not connect output to +VS, when -VSis greater than 13 V
18、 or reliability will be adversely affected. 3/ Applies to both single supply and spilt supply operation. Continuous short circuit operation at elevated ambient temperature can result in exceeding the maximum allowed junction temperature at +150C. Output currents in excess of 30 mA over long term may
19、 adversely affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of preced
20、ence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirem
21、ents. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein
22、. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF
23、-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein . 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance
24、characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. Th
25、e electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of th
26、e entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marki
27、ng for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535
28、, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required fro
29、m a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and
30、V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A sha
31、ll be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3
32、.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Mi
33、crocircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 73 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZ
34、E A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset vo
35、ltage VIO1 01 350 V 2,3 750 Input bias current IIB1 01 25 pA 2,3 100 Input offset current IIO1 01 25 pA 2,3 100 Common mode rejection ratio CMRR VCM= 0 V and 12 V, 1 01 75 dB +VS= 15 V 2,3 70 Power supply rejection ratio +PSRR +VS= 5 V and 15 V, 1 01 75 dB VOUT= 2.5 V 2,3 70 -PSRR -VS= -10 V and 0 V
36、, 1 84 VOUT= 2.5 V 2,3 70 Input common mode voltage range VCM+VS= 5 V and 15 V for 1 01 +VS-2.3 V CMRR 60 dB 2,3 +VS-2.6 Output current 2/ IOUT+VS= 5 V, VOUT= 0 V, 1 01 16 mA sourcing 2,3 8 +VS= 5 V, VOUT= 5 V, 1 16 sinking 2,3 7 See footnotes at end of table. Provided by IHSNot for ResaleNo reprodu
37、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C
38、 TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output current 2/ IOUT+VS= 15 V, VOUT= 0 V, 1 01 15 mA sourcing 2,3 9 +VS= 15 V, VOUT= 13 V, 1 24 sinking 2,3 7 Supply current IS+VS= +15 V, VOUT= 7.5 V, 1 01 30 A 2,3 40 +VS= +5 V, VOUT= 1.5 V, 1 24 2,3 35 Large
39、signal voltage gain AV+VS= 15 V, RL= 100 k, 3/ 4 01 400 V/mV VOUT= 7.5 V to 11.5 V, sourcing 5,6 200 +VS= 15 V, RL= 25 k, 3/ 4 400 VOUT= 7.5 V to 11.5 V, sourcing 5,6 150 +VS= 15 V, RL= 100 k, 3/ 4 180 VOUT= 2.5 V to 7.5 V, sinking 5,6 70 +VS= 15 V, RL= 25 k, 3/ 4 100 VOUT= 2.5 V to 7.5 V, sinking 5
40、,6 35 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Elec
41、trical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage swing (rail to rail) VOUT+VS= 5 V, 4 01 4.990 .010 V RL= 100 k to 2.5 V 5,6 4.970 .030 +VS= 5 V, 4 4.975 .020 RL= 25 k to
42、2.5 V 5,6 4.955 .045 +VS= 15 V, 4 14.975 .025 RL= 100 k to 7.5 V 5,6 14.955 .050 +VS= 15 V, 4 14.900 .050 RL= 25 k to 7.5 V 5,6 14.800 .200 Slew rate +SR +VS= 15 V 4/ 4 01 20 V/ms 5,6 8 -SR +VS= 15 V 5/ 4 20 5,6 8 Gain bandwidth GBW 4 01 80 kHz 5,6 75 1/ Unless otherwise specified, +VS= 5 V, -VS= 0
43、V, VCM= 1.5 V, VOUT= 2.5 V, and RL 1 M. 2/ Do not short circuit output to +VS, when +VSis greater than 13 V or reliability will be adversely affected. 3/ VCM= 7.5 V and RLconnected to 7.5 V. 4/ Output from 0 V to 10 V, measure VOUTbetween 5.5 V to 8.0 V. 5/ Output from 10 V to 0 V, measure VOUTbetwe
44、en 6.0 V and 3.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline P
45、Terminal number Terminal symbol 1 NC 2 -INPUT 3 +INPUT 4 -VS5 NC 6 VOUT7 +VS8 NC NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-94604 DEFENSE SUPPLY CENTER
46、COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) p
47、lan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF
48、-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintaine
