1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, Output response to step transient load change test, (VOTLOAD), at 50% to/from100%, change minimum/maximum limit from 1200 to 1500 mV pk. Update drawing boilerplate. 01-11-29 Raymond Monnin B Table I, Output voltage test, correct subgroup
2、1 maximum limit from 22.25 V to 25.25 V and maximum capacitive load (CL) test, correct conditions column. Update drawing to reflect current requirements. 05-02-22 Raymond Monnin C Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 11-07-12 Charles F.
3、Saffle D Corrected dimensions for symbols D, D2, and L1 for case outline U. Corrected dimensions for symbols D2, L, and L1 for case outline X. Corrected dimensions for symbols D, L, and L1 for case outline Y. Corrected dimensions for symbols D, D2, and L1 for case outline Z. -sld 13-07-18 Charles F.
4、 Saffle REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones THIS DRAWI
5、NG IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, 25 VOLT, SINGLE CHANNEL, DC/DC CONVERTER DRAWING APPROVAL DATE 98-11-16 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-96501 SHEET 1 OF 13 DSCC F
6、ORM 2233 APR 97 5962-E230-13Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawin
7、g documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the
8、PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 96501 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness a
9、ssurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic numbe
10、r Circuit function 01 AFL27025S/CH DC/DC converter, 100 W, 25 V output 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qu
11、alification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level
12、is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flo
13、w, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the dev
14、ice acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may hav
15、e a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The c
16、ase outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 12 Y case configuration with leads bent upwards X See figure 1 12 Straight leads with end mounting through holes Y See figure 1 12 Straight leads with side mo
17、unting through holes Z See figure 1 12 Y case configuration with leads bent downwards 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range -0.5 V dc to +500 V dc Lead temperature (soldering, 10 seconds) +300C Storage temperat
18、ure range . -65C to +135C 1.4 Recommended operating conditions. Input voltage range +160 V dc to +400 V dc Output power 2/ 100 W Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards,
19、 and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEF
20、ENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents
21、are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this dra
22、wing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance
23、 and affect reliability. 2/ Derate output power linearly above case temperature +125C to 0 at +135C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVIS
24、ION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designat
25、ed in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device c
26、lass. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1
27、Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristic
28、s are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s).
29、 Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the
30、 device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guar
31、anteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to suppl
32、y to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-3853
33、4 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM
34、plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained
35、 by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spe
36、cified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of th
37、e manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteris
38、tics. Test Symbol Conditions -55C TC +125C VIN= 270 V dc 5 %, CL= 0 unless otherwise specified Group A Subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 0 1 01 24.75 25.25 V 2,3 24.50 25.50 Output current 1/ IOUTVIN= 160, 270, and 400 V dc 1,2,3 01 4.0 A Output ripple voltage 2/ VRI
39、PVIN= 160, 270, and 400 V dc, B.W. = 20 Hz to 10 MHz 1,2,3 01 80 mV p-p Line regulation 3/ VRLINEVIN= 160, 270, and 400 V dc, IOUT= 0, 2, and 4 A 1,2,3 01 60 mV Load regulation 3/ VRLOADVIN= 160, 270, and 400 V dc, IOUT= 0, 2, and 4 A 1,2,3 01 250 mV Input current IINIOUT= no load 1 01 15 mA 2,3 17
40、Enable 1, (pin 4) shorted to Input return (pin 2) 1,2,3 3 Enable 2, (pin 12) shorted to Output return (pin 8) 1,2,3 5 Input ripple current 2/ IRIPIOUT= 4 A, B.W. = 20 Hz to 10 MHz 1,2,3 01 80 mA p-p Efficiency EFFIOUT = 4 A 1,2,3 01 82 % Isolation ISO Input to output or any pin to case (except pin 3
41、) at 500 V dc, TC= +25C 1 01 100 M Maximum capacitive load 4/ CLNo effect on dc performance, TC= +25C 4 01 10,000 F Power dissipation load fault PD Overload 5/ 1,2,3 01 30 W Short circuit 30 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without l
42、icense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96501 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C VIN= 270 V dc 5 %, CL= 0 unless otherwi
43、se specified Group A Subgroups Device type Limits Unit Min Max Current limit point 6/ ICLVOUT= 90 % VNOM1 01 4.6 5.0 A 2 4.2 4.6 3 5.0 5.6 Switching frequency FS4,5,6 01 500 600 kHz Sync frequency range FSYNC4,5,6 01 500 700 kHz Output response to step transient load changes 7/ VOTLOAD50% to/from 10
44、0% 4,5,6 01 -1500 +1500 mV pk 10% to/from 50% -1200 +1200 Recovery time, step transient load changes 7/ 8/ TTLOAD50% to/from 100% 4,5,6 01 400 s 10% to/from 50% 400 Output response to transient step line changes 4/ 9/ VOTLINEInput step 160 V to/from 400 V dc 4,5,6 01 -500 +500 mV pk Recovery time tr
45、ansient step line changes 4/ 8/ 9/ TTLINEInput step, 160 V to/from 400 V dc 4,5,6 01 500 s Turn on overshoot VTonosEnable 1 and 2 on. (Pins 4 and 12 high or open) 4,5,6 01 250 mV pk Turn on delay 10/ TonDEnable 1 and 2 on. (Pins 4 and 12 high or open) 4,5,6 01 140 ms Load fault recovery 4/ TrLF4,5,6
46、 01 140 ms 1/ Parameter guaranteed by line and load regulation tests. 2/ Bandwidth guaranteed by design. Tested for 20 kHz to 10 MHz. 3/ All electrical tests are performed with remote sense leads connected to the output lead at the output load. 4/ Parameter shall be tested as part of design characte
47、rization and after design or process changes. Thereafter, parameters shall be guaranteed to the limits specified in table I. 5/ An overload is that condition with a load in excess of the rated load but less than that necessary to trigger the short circuit protection and is the condition of maximum p
48、ower dissipation. 6/ Current limit point is that condition of excess load causing output voltage to drop 90% of nominal. 7/ Load step transition time 10 microseconds. 8/ Recovery time is measured from the initiation of the transient to where VOUThas returned to within 1 percent of VOUTat 50 percent load. 9/ Input step transition time 100 microseconds. 10/ Turn on delay is measured with an input voltage rise time of between 100 and 500 volts per millisecond. Provided by IHSNot for ResaleNo reproduction o
