1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change the device title to reflect the bus hold feature and adjust limits to characterize the performance of the optimized die. Editorial changes throughout jak. 00-04-11 Monica L. Poelking B Update the boilerplate paragraphs to current requireme
2、nts as specified in MIL-PRF-38535. - jak 09-05-06 Thomas M. Hess REV SHEET REV B B B B B SHEET 15 16 17 18 19 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby STANDARD MICROCIRCUIT DRAWING CHECKED BY Charles F. Saffle, J
3、r. DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V 16-BIT REGISTERED TRANSCEIVER WITH BUS HOLD, THREE-STATE OUTPUTS, AND AGENCIES OF
4、 THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 96-09-09 TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-96849 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E280-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I
5、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and spa
6、ce application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example:
7、5962 - 96849 01 Q X A Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 speci
8、fied RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify t
9、he circuit function as follows: Device type Generic number Circuit function 01 54LVTH16952 3.3-volt 16-bit registered transceiver, with bus hold, three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance
10、 level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s).
11、 The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X GDFP1-F56 56 Flat package 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device clas
12、s M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply
13、 voltage range (VCC) -0.5 V dc to +4.6 V dc DC input voltage range (VIN) -0.5 V dc to +7.0 V dc 4/ DC output voltage range applied to any output in the high state or power-off state (VOUT) -0.5 V dc to +7.0 V dc 4/ DC output current (IOL) (per output) +96 mA DC output current (IOH) (per output) . +4
14、8 mA 5/ DC input clamp current (IIK) (VINVCC. 6/ Power dissipation values are derived using the formula PD= VCCICC+ nVOLIOL, where VCCand IOLare as specified in 1.4 above, ICCand VOLare as specified in table I herein, and n represents the total number of outputs. 7/ Unused inputs must be held high o
15、r low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE
16、 DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT O
17、F DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103
18、- List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order
19、 of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Ite
20、m requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as descri
21、bed herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
22、in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table.
23、 The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The block or logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and waveforms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test ci
24、rcuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.2.7 Radiation exposure circuit. The radiation exposure circuit shall be as specified when available. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein
25、, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrica
26、l tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97
27、3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device.
28、For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for
29、 device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 list
30、ed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance sub
31、mitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certifi
32、cate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. .8 Notification of change for device class M. For device class M, n
33、otification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review
34、the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 129 (see
35、 MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical p
36、erformance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Devicetype VCCGroup A subgroups Limits 3/ Unit Min Max Negative input clamp voltage 3022 VIKFor input under test, IIN= -18 mA All 2.7 V 1,2,3 -1.2 V Hi
37、gh level output voltage 3006 VOH1For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOH= -100 A All 2.7 V and 3.6 V 1,2,3 VCC-0.2 V VOH2For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOH= -8 mA All 2.7 V 1,2,3 2.4 VOH3For all inputs affecting output under test
38、, VIH= 2.0 V or VIL= 0.8 V IOH= -24 mA All 3.0 V 1,2,3 2.0 Low level output voltage 3007 VOL1For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= 100 A All 2.7 V 1,2,3 0.20 VOL2For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= 24 mA All 2.7 V 1,2,3 0.50 V
39、OL3For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= 16 mA All 3.0 V 1,2,3 0.40 VOL4For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= 32 mA All 3.0 V 1,2,3 0.50 VOL5For all inputs affecting output under test, VIH= 2.0 V or VIL= 0.8 V IOL= 48 mA All 3.0
40、 V 1,2,3 0.55 V For input under test, VIN= VCCAll 3.6 V 1,2,3 1.0 For input under test, VIN= 5.5 V Control inputs All 0.0 V and 3.6 V 1,2,3 10.0 For input under test, VIN= 5.5 V All 3.6 V 1,2,3 20.0 Input current high 3010 IIH4/ For input under test, VIN= 3.6 V mAn or mBn ports All 3.6 V 1,2,3 1.0 A
41、 For input under test, VIN= 0.0V Control inputs All 3.6 V 1,2,3 -1.0 Input current low 3009 IIL4/ For input under test, VIN= 0.0 V mAn or mBn ports All 3.6 V 1,2,3 -5.0 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-
42、STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC
43、+3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Input bus hold current IHOLDVIN= 0.8 V All 3.0 V 1,2,3 75 VIN= 2.0 V mAn or mBn ports -75 A Three-state output current, power-up IOZPUVOUT= 0.5 V to 3.0 V All 0.0 V to 1.5 V 1,2,3 100.0 A Three-state output cur
44、rent, power-down IOZPDVOUT= 0.5 V to 3.0 V All 1.5 V to 0.0 V 1,2,3 100.0 A Three-state output leakage current high 3021 IOZH5/ VOUT= 3.0 V All 3.6 V 1,2,3 1.0 A Three-state output leakage current low 3020 IOZL5/ VOUT= 0.5 V All 3.6 V 1,2,3 -1.0 A Outputs high All 3.6 V 1,2,3 0.19 mA Outputs low 5.0
45、 Quiescent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0.0 A Outputs disabled 0.19 Quiescent supply current delta, TTL input levels 3005 ICC6/ For input under test VIN= VCC - 0.6 V For all other inputs VIN= VCCor GND All 3.0 V and 3.6 V 1,2,3 0.2 mA Input capacitance 3012 CINTC= +25C
46、, See 4.4.1c VIN= 3.0 V or 0.0 V All 3.0 V 4 12.0 pF Input/output Capacitance 3012 CI/OTC= +25C, See 4.4.1c VOUT= 3.0 V or 0.0 V All 3.0 V 4 15.0 Low level ground bounce noise VOLP7/ VIH= 2.7 V, VIL= 0.0 V TA= +25 C All 3.3 V 4 1200 mV Low level ground bounce noise VOLV7/ See figure 4 See 4.4.1d All
47、 3.3 V 4 -500 High level VCCbounce noise VOHP7/ All 3.3 V 4 1000 High level VCCbounce noise VOHV7/ All 3.3 V 4 -1700 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-96849 DEFENS
48、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.7 V VCC +3.6 V unless otherwise specified Device type VCCGroup A subgroups Limits 3/ Unit Min Max Functional test 3014 8/ VIH= 2.4 V or VIL= 0.4 V See 4.4.1b All 2.7 V and 3.6 V 7,8 L H 3.0 V and 3.6 V 0 150 Clock frequency fCLK CL= 50 pF minimum RL= 500 See figure 5 All
