1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Replace reference to MIL-STD-973 with reference to MIL-PRF-38535. Delete 1.5, make change to 4.4.1b, and add 4.4.1c. - ro 06-07-18 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC
2、N/A PREPARED BY LARRY E. SHAW DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY TUAN D. NGUYEN COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY RAYMOND MONNIN AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPR
3、OVAL DATE 97-07-30 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, OCTAL BUFFERS AND LINE DRIVERS WITH THREE STATE OUTPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-97559 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E391-06 Provided by IHSNot for ResaleNo reproduc
4、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting o
5、f high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2
6、PIN. The PIN is as shown in the following example: 5962 - 97559 01 Q S X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and
7、V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.
8、2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54AS244A Octal buffers and line drivers with three state outputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assur
9、ance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline
10、(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style S GDFP2-F20 or CDFP3-F20 20 Flat pack R GDIP1-T20 or CDIP2-T20 20 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as
11、 specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 4321
12、8-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC) 7.0 V dc DC input voltage (VI) . 7.0 V dc Voltage applied to a disabled 3-state output . 5.5 V dc Storage temperature range . -65C to +150C Operating free-air temperature range (TA) -55C
13、 to +125C Maximum power dissipation (PD) 495 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . +2.0 V Maximum low level inp
14、ut voltage (VIL) +0.8 V Maximum high level output current (IOH) -12 mA Maximum low level output current (IOL) +48 mA Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handb
15、ooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF
16、 DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents
17、are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the ref
18、erences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation a
19、t the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSC
20、C FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not a
21、ffect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and
22、physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be
23、as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unl
24、ess otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specif
25、ied in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitat
26、ions, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38
27、535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device clas
28、ses Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source
29、 of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for devic
30、e class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to t
31、his drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device cl
32、ass M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class
33、 M devices covered by this drawing shall be in microcircuit group number 9 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
34、43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxHigh level output voltage VOHVCC= 4.5 V to 5.5 V, 2/ IOH= -2 mA 1,2,3 01 VCC-
35、 2 V VCC= 4.5 V, 2/ IOH= -3 mA 2.4 VCC= 4.5 V, 2/ IOH= -12 mA 2.4 Low level output voltage VOLVCC= 4.5 V, 2/ IOL= 48 mA 1,2,3 01 0.55 V Input clamp voltage VIKVCC= 4.5 V, II= -18 mA 1,2,3 01 -1.2 V High level input current IIHVCC= 5.5 V, VI= 2.7 V 1,2,3 01 20 A Low level input current IILVCC= 5.5 V,
36、 A inputs, VI= 0.4 V 1,2,3 01 -1 mA VCC= 5.5 V, VI= 0.4 V, all other inputs -0.5 Input current IIVCC= 5.5 V, VI= 7 V 1,2,3 01 0.1 mA Output current IOVCC= 5.5 V, 3/ VO= 2.25 V 1,2,3 01 -50 -150 mA Supply current ICCHVCC= 5.5 V, outputs high 1,2,3 01 34 mA ICCLVCC= 5.5 V, outputs low 90 ICCZVCC= 5.5
37、V, outputs disabled 54 Off state output leakage current IOZHVCC= 5.5 V, VO= 2.7 V 1,2,3 01 50 A IOZLVCC= 5.5 V, VO= 0.4 V -50 Functional tests VCC= 4.5 V, 5.5 V, see 4.4.1b 7,8 01 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
38、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgr
39、oups Device type Limits Unit Min MaxPropagation delay time, tPLHVCC= 4.5 V to 5.5 V, 4/ 9,10,11 01 2 9 ns A to Y tPHLCL= 50 pF, R1= 500 , R2= 500 1 7 Outputs enable time, tPZHVCC= 4.5 V to 5.5 V, 4/ 9,10,11 01 1 10 ns OE to Y tPZL CL = 50 pF, R1 = 500 , R2= 500 2 8 Output disable time, tPHZVCC= 4.5
40、V to 5.5 V, 4/ 9,10,11 01 1 6.5 ns OE to Y tPLZ CL = 50 pF, R1 = 500 , R2= 500 1 10.5 1/ Unused inputs that do not directly control the pin under test must be put at +2.5 V or -0.4 V. No unused inputs shall exceed 5.5 V or go less than 0.0 V. No inputs shall be floated. 2/ All outputs must be tested
41、. In the case where only one input at VILmaximum or VIHminimum produces the proper state, the test must be performed with each input being selected as the VILmaximum or VIHminimum input. 3/ The output conditions have been chosen to produce a current that closely approximates one half of the true sho
42、rt circuit output current, IOS. Not more than one output will be tested at one time and duration of the test condition shall not exceed one second. 4/ Propagation delay limits are based on single output switching. Unused inputs = 3.5 V or -0.3 V. Provided by IHSNot for ResaleNo reproduction or netwo
43、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines R, S, and 2 Terminal number Terminal symbol 1 1 OE 2 1A1 3 2Y4 4 1A2 5 2Y3
44、 6 1A3 7 2Y2 8 1A4 9 2Y1 10 GND 11 2A1 12 1Y4 13 2A2 14 1Y3 15 2A3 16 1Y2 17 2A4 18 1Y1 19 2 OE 20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTE
45、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 INPUTS OUTPUT OE A Y L H H L L L H X Z FIGURE 2. Truth table. See notes at end of figure 3. FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without
46、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. Waveform 1 is for an output with internal conditions such that the output i
47、s low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. 3. When measuring propagation delay items of 3-state outputs, switch S1 is open. 4. All input pulses have the following char
48、acteristics: PRR 1 MHz, tr= tf= 2 ns, duty cycle = 50%. 5. The outputs are measured one at a time with one transition per measurement. FIGURE 3. Test circuit and switching waveforms Continued. 4/ 5/ Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-97559 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Samplin
