1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate to MIL-PRF-38535 requirements. - LTG 01-04-05 Thomas M. Hess B Update boilerplate to current MIL-PRF-38535 requirements. - CFS 07-08-03 Thomas M. Hess C Correct dimensions A, D, and E for case outline X, Figure1. Update boilerp
2、late to current MIL-PRF-38535 requirements. - PHN 13-03-04 Thomas M. Hess REV C C C SHEET 35 36 37 REV C C C C C C C C C C C C C C C C C C C C SHEET 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14
3、 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Thanh V. Nguyen THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, SERIAL MULTI-MOD
4、E INTELLIGENT TERMINAL, REMOTE TERMINAL AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 99-05-26 ONLY, MONOLITHIC SILICON AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-98587 C SHEET 1 OF 37 DSCC FORM 2233 APR 97 5962-E282-13 Provided by IHSNot for ResaleNo reproduction or netwo
5、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliab
6、ility (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as
7、shown in the following example: 5962 - 98587 01 Q X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devi
8、ces meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 UT69151RTE Serial microcoded mo
9、nolithic multi-mode intelligent terminal, remote terminal only, with +5 V/- 15 V operation 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualifi
10、cation to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 139 Pin grid array Y See figure 1 140 Quad flat pack Z See figure 1 132 Quad flat pack 1.2.5 Lead finish.
11、The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV
12、ISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Storage temperature range (TSTG) -65C to +150C Operating case temperature range (TC) -55C to +125C Transceiver supply voltage range (VCC) -0.3 V dc to +7.0 V dc Logic supply voltage range (VDD) -0.3 V dc to +7.0 V dc Input
13、voltage range (receiver) (VDR) 10 VPL-LMaximum power dissipation (PD) 5 W Logic voltage on any pin range (VI/O) -0.3 V dc to VDD+ 0.3 V dc Logic latch-up immunity (ILU) 150 mA Logic input current (II) 10 mA Peak output current (transmitter) (IO) 1000 mA Maximum junction temperature (TJ) +150C Receiv
14、er common mode input voltage range (VIC) . -5 V dc to +5 V dc Lead temperature (soldering, 5 seconds) . +300C Thermal resistance junction-to-case (JC): 2/ Cases X, Y and Z . 7C/W 1.4 Recommended operating conditions. Supply voltage range (VDD) and (VCC) +4.5 V dc to +5.5 V dc Receiver differential v
15、oltage (VDR) 8 VP-PLogic dc input voltage range (VIN) . 0 V dc to VDDReceiver common mode input voltage (VIC) . 5 V dc Driver peak output current (IO) 700 mA Serial data rate range (SD) 0 to 1 MHz Clock duty cycle (DC) 50 5% Case operating temperature range (TC) -55C to +125C Operating frequency (FI
16、N) . 24 MHz 0.01% 1.5 Digital logic testing for device classes Q and V. Fault coverage measurement of manufacturing logic tests (MIL-STD-883, method 5012) 95.12 percent _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels
17、may degrade performance and affect reliability. This is a stress rating only, and functional operation of the device at these or any other conditions beyond the limits indicated in the operational sections of this specification is not recommended. 2/ Mounting in accordance with MIL-STD-883, method 1
18、012. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specif
19、ication, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-
20、38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit
21、Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094). 2.2 Non-Gove
22、rnment publications. The following document(s) form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE) IEEE Standard 1149.1 - IEEE S
23、tandard Test Access Port and Boundary Scan Architecture. (Applications for copies should be addressed to the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08855-1331). (Non-Government standards and other publications are normally available from the organizations th
24、at prepare of distribute the documents. These documents may also be available in or through libraries or other informational services.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Not
25、hing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modifie
26、d in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and
27、 herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. Th
28、e block diagram shall be as specified on figure 3. 3.2.4 Boundary scan instruction codes. The boundary scan instruction codes shall be as specified on figure 4. 3.2.5 Timing waveforms. The timing waveforms shall be as specified on figure 5. Provided by IHSNot for ResaleNo reproduction or networking
29、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified h
30、erein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The elec
31、trical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer ha
32、s the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V sha
33、ll be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance su
34、bmitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein . 3.7 Certificate of conformance. A certificate of conformance as required
35、 for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. 3.11 IEEE 1149.1 compliance. These devices shall be compliant to IEEE 1149.1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA
36、NDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 4.5 V VDD 5.5 V -55C TC +125C unless otherwise specified Device type Group A
37、 subgroups Limits Unit Min Max Low level input voltage VIL1All 1, 2, 3 0.8 V Low level input voltage, TCK input only VIL2All 1, 2, 3 0.7 V High level input voltage VIHAll 1, 2, 3 2.2 V Low level input voltage 2/ VILCAll 1, 2, 3 0.3 VDDV High level input voltage 2/ VIHCAll 1, 2, 3 0.7 VDDV Low level
38、output voltage VOLIOL= 4.0 mA All 1, 2, 3 0.4 V IOL= 1.0 A 3/ 0.05 High level output voltage VOHIOH= 4.0 mA All 1, 2, 3 2.4 V IOH= 1.0 A 3/ VDD-0.05 Input leakage current IINTTL inputs VIN= VDDor VSSAll 1, 2, 3 -10 +10 A Inputs with pull-up resistors VIN= VDD-10 +10 VIN= VSS-167 -27 Three-state outp
39、ut leakage current, TTL loaded outputs, single-drive buffer IOZVO= VDDor VSSAll 1, 2, 3 -10 +10 A Short-circuit output current, TTL output loads, single-drive buffer IOS4/ 5/ VDD= 5.5 V, VO= 0 V VDD= 5.5 V, VO= VDDAll 1, 2, 3 -100 +100 mA Input capacitance CINf = 1 MHz at 0 V See 4.4.1c All 4 45 pF
40、Output capacitance COUTAll 4 45 Bidirectional capacitance 6/ CIOAll 4 45 Quiescent current 7/ IDDQf = 0 MHz RTE All 1, 2, 3 1.0 mA Standby operating current IDDSf = 24 MHz All 1, 2, 3 40 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without li
41、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 4.5 V VDD 5.5 V -55C TC +125C unless other
42、wise specified Device type Group A subgroups Limits Unit Min Max Common mode input voltage 3/ VICDirect-coupled stub; input 1.2 VPP, 200 ns rise/fall time 25 ns, f = 1 MHz All 1, 2, 3 -5 5 V VCCsupply current ICCVCC= 5.0 V 0% duty cycle (non-transmitting) All 1, 2, 3 55 mA 25% duty cycle 8/ 250 50%
43、duty cycle (f = 1 MHz) 8/ 410 87.5% duty cycle (f = 1 MHz) 8/ 650 100% duty cycle (f = 1 MHz) 8/ 855 Input threshold voltage (no response) VTHTransformer-coupled stub; input a f = 1MHz, rise/fall time 200 ns at (Receiver output 0 1 transition) 3/ All 1, 2, 3 0.20 VPPL-LInput threshold voltage (no re
44、sponse) Direct-coupled stub; input at f = 1MHz, rise/fall time 200 ns at (Receiver output 0 1 transition) All 1, 2, 3 0.28 Input threshold voltage (response) Transformer-coupled stub; input at f = 1MHz, rise/fall time 200 ns at (Receiver output 0 1 transition) 3/ All 1, 2, 3 0.86 14.0 Input threshol
45、d voltage (response) Direct-coupled stub; input at f = 1MHz, rise/fall time 200 ns at (Receiver output 0 1 transition) All 1, 2, 3 1.20 20.0 3/ Common mode rejection ratio CMRR All 1, 2, 3 Pass/Fail 15/ N/A Output voltage swing per MIL-STD-1553B VOTransformer-coupled stub, Point A; Input f = 1MHz, R
46、L= 70 3/ All 1, 2, 3 18 27 VPPL-LOutput voltage swing per MIL-STD-1553B Direct-coupled stub, Point A; Input f = 1 MHz, RL= 35 6.0 9 Output voltage swing per MIL-STD-1553A Point A, input f = 1 MHz, RL= 35 6.0 20 Output noise voltage differential 8/ VNSTransformer-coupled stub, Point A; Input f = DC t
47、o 10 MHz, RL= 70 All 1, 2, 3 14 mV-RMSLLDirect-coupled stub, Point A; Input f = DC to 10 MHz, RL= 35 5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-98587 DEFENSE SUPPLY CENTE
48、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 4.5 V VDD 5.5 V -55C TC +125C unless otherwise specified Device type Group A subgroups Limits Unit Min Max Output symmetry 16/ VOSTransformer-coupled stub, Point A; RL= 70, measurement taken 2.5 s after end of transmission 3/ All 1, 2, 3 -250 +250 mV PPL-LDirect-coupled stub, Point A; RL= 35, measurement taken 2.5 s after end of transmission -90 +90 O
