1、 EIA STANDARD TP-03D Altitude Immersion Test Procedure for Electrical Connectors EIA-364-03D (Revision of EIA-364-03C) September 2015 Electronic Components Industry Association EIA-364-03D ANSI/EIA-364-03D-2015 Approved: September 25, 2015 NOTICE EIA Engineering Standards and Publications are design
2、ed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of
3、such Standards and Publications shall not in any respect preclude any member or nonmember of ECIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than ECIA
4、 members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by ECIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, ECIA does not assume any liability to any patent owner, nor does it a
5、ssume any obligation whatever to parties adopting the Standard or Publication. This standard is based upon the major technical content of International Electrotechnical Commission standard 60512-14-5 (was IEC 512-7, test 14e), immersion at low air pressure, 2006-03, first edition. It conforms in all
6、 essential respects this IEC standard. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the appl
7、icability of regulatory limitations before its use. (From Standards Proposal No. 5345.01 formulated under the cognizance of the CE-2.0 Committee on EIA National Connector and Sockets Standards.) Published by Electronic Components Industry Association 2015 EIA Standards & Technology Department 2214 R
8、ock Hill Road, Suite 265 Herndon, VA 20170 PLEASE ! DONT VIOLATE THE LAW! This document is copyrighted by the ECIA and may not be reproduced without permission. Organizations may obtain permission to reproduce a limited number of copies through entering into a license agreement. For information, con
9、tact: IHS 15 Inverness Way East Englewood, CO 80112-5704 or call USA and Canada (1-877-413-5186), International (303-397-7956) i CONTENTS Clause Page 1 Introduction . 1 1.1 Scope . 1 2 Test resources 1 2.1 Equipment . 1 2.1.1 Altitude chamber . 1 2.1.2 Test container 1 3 Test specimen 2 3.1 Descript
10、ion 2 3.2 Preparation 2 4 Test procedure . 2 4.1 Mounting . 2 4.2 Altitude immersion cycling . 2 4.3 Final measurements . 3 5 Details to be specified . 3 6 Test documentation . 4 ii (This page left blank) EIA-364-03D Page 1 TEST PROCEDURE No. 03D ALTITUDE IMMERSION TEST PROCEDURE FOR ELECTRICAL CONN
11、ECTORS (From EIA Standards Proposal No. 5345.01, formulated under the cognizance of the EIA CE-2.0 Committee on National Connector and Socket Standards, and previously published as EIA-364-03C) 1 Introduction 1.1 Scope This standard establishes a test method to determine the ability of the connector
12、-to-wire and interface area seals of a mated connector assembly to perform satisfactorily during and subsequent to simulated rapid descents from high altitude with attendant moisture condensation. 2 Test resources 2.1 Equipment 2.1.1 Altitude chamber Altitude immersion test chamber shall consist of
13、a suitable sealed chamber having a means of visual observation of connector assembly under test with necessary vacuum pump equipment to maintain a reduced pressure of 25.4 millimeters (1 inch) of mercury (3.4 kilopascals) or lower if required by the referencing document. The chamber shall have provi
14、sions for electrical connections. 2.1.2 Test container The test container for positioning connector assembly shall have dimensions that are a minimum of 50.8 millimeters (2 inches) wide, 228.6 millimeters (9 inches) long and 76.2 millimeters (3 inches) deep. A salt solution shall be placed in the co
15、ntainer to a depth that will completely cover the connector at all times during the altitude immersion test. The salt solution shall be prepared by dissolving (5 1) parts by weight of sodium chloride (e.g., non-iodized commercial table salt) in 95 parts by weight of distilled water. No material shal
16、l be added to, and no contaminant shall be present in the container or solution that would tend to prevent wetting of the test specimen by the solution. EIA-364-03D Page 2 3 Test specimen 3.1 Description The test specimen shall consist of one fully assembled, mated electrical connector with the spec
17、ified number of contacts, proper wire type size and end preparation and sealing plugs and other hardware as required by the referencing document. 3.2 Preparation Care shall be taken to ascertain that the wires are free of pinholes that would permit leakage of the solution into the connector or breat
18、hing with the chamber pressure changes. It shall be verified that wires provided for connection to the connector shells are actually electrically connected to the preceding shell. Maximum resistance from the wire end to the furthest point on the connector shell shall not exceed 1 ohm. It shall be ve
19、rified that the connector halves are fully coupled. No material shall be added to, and no contaminant shall be present on the test specimen that would tend to prevent wetting of the test specimen by the solution. 4 Test procedure 4.1 Mounting The test specimen shall be placed in the container in the
20、 chamber in such a manner that the connector assembly will be entirely immersed in the salt solution. The uppermost point of the connector shall be 25.4 millimeters (1 inch) maximum below the surface of the solution. Unless otherwise specified in the referencing document, the wires of a test specime
21、n designed without a backshell shall be aligned to maintain grommet seal with the free end brought out of the test solution. A connector test specimen designed with a backshell shall be a fully loaded connector with a 90 unsealed backshell. If a connector specimen is not designed for a 90 backshell,
22、 a straight unsealed backshell shall be used. Unless otherwise specified in the referencing document, termination of the wires of the test specimen shall be unsealed and within the sealed chamber as specified. The wires shall be arranged so as to prevent any voltage breakdown or low insulation resis
23、tance that might incorrectly indicate connector failure. 4.2 Altitude immersion cycling The chamber shall be sealed. The chamber pressure shall be reduced from room ambient to 25.4 millimeters, +0.0 millimeters, - 5 millimeters (1 inch +0.0 inch, -0.2 inch) of mercury, 3.4 kilopascals, +0.0 kilopasc
24、als, -0.6 kilopascals (equivalent to 75,000 feet of altitude), within 5 minutes and shall be maintained at this level for 30 minutes minimum. The chamber pressure shall be increased to room ambient within one minute, and shall be maintained at room ambient pressure for 30 minutes minimum. The forego
25、ing shall constitute one cycle. Two additional cycles shall be performed (three cycles total). The connector shall remain fully immersed in the salt solution during the three cycles and for the subsequent measurements specified herein. EIA-364-03D Page 3 4.3 Final measurements 4.3.1 Insulation resis
26、tance test After the third cycle and while still in the salt solution, the insulation resistance test shall be performed, in accordance with EIA-364-21. 4.3.2 Dielectric withstanding voltage test After the insulation resistance test and while the connector is still in the salt solution, a dielectric
27、 withstanding voltage test shall be performed, in accordance with EIA-364-20. The test voltage shall be applied for 5 seconds minimum unless otherwise specified. 4.3.3 Connector examination After the altitude immersion test, the test specimen shall be removed from the chamber and washed in distilled
28、 or tap water. The test specimen shall then be patted or wiped with suitable towels and dried by being exposed to room ambient conditions for 20 hours to 24 hours, or by placing in a circulating air oven, at 48.9 C 2.8 C (120 F 5 F) for 2 hours to 3 hours. The connector shall then be uncoupled and b
29、oth halves shall be examined using the unaided eye for evidence of the following: 4.3.3.1 Evidence of foreign deposits on the interface or contacts. 4.3.3.2 Deterioration of moisture seal. 4.3.3.3 Evidence of dielectric breakdown across interface of connector. 4.3.3.4 Evidence of moisture on the int
30、erface or contacts. 5 Details to be specified The following details shall be specified in the referencing document: 5.1 Wire type and size 5.2 Number of contacts and sealing plugs 5.3 Connector accessories, support hardware to be installed on connector specimen during test 5.4 Connector specimen pre
31、paration EIA-364-03D Page 4 5.5 Insulation resistance minimum allowable limit 5.6 Dielectric withstanding voltage including maximum leakage current and test voltage application time if other than 5 seconds 5.7 Number of specimens to be tested 6 Test documentation Documentation shall contain the deta
32、ils specified in clause 5 (when provided), and the following: 6.1 Title of test 6.2 Specimen description including fixturing, if applicable 6.3 Test equipment used, and date of last and next calibration 6.4 Test procedure 6.5 Values and observations 6.5.1 Chamber pressure, temperature and duration o
33、f each cycle 6.5.2 Insulation resistance values 6.5.3 Dielectric withstanding test results 6.5.4 Identity of each contact pair and the specimen along with the corresponding test results 6.5.5 Connector visual examination 6.6 Name of operator and start/finish dates of test ECIA Document Improvement P
34、roposal If in the review or use of this document, a potential change is made evident for safety, health or technical reasons, please fill in the appropriate information below and mail or FAX to: Electronic Components Industry Association EIA Standards & Technology Department 2214 Rock Hill Rd., Suit
35、e 265 Herndon, VA 20170 FAX: (571-323-0245) Document No.: Document Title: Submitters Name: Telephone No.: FAX No.: e-mail: Address: Urgency of Change: Immediate: At next revision: Problem Area: a. Clause Number and /or Drawing: b. Recommended Changes: c. Reason/Rationale for Recommendation: Addition
36、al Remarks: Signature: Date: FOR ECIA USE ONLY Responsible Committee: Chairman: Date comments forwarded to Committee Chairman: Revision History Revision letter Project number Publication date Additions, changes and deletions - SP-1041 September 1970 Initially published in EIA RS-364-1 A SP-1547 Febr
37、uary 1983 B SP-4304 June 1999 C SP-5177 March 2009 Revise paragraph 4.1 and 6.6. D SP-5345.01 Revised text under paragraph 6 Deleted paragraph 6.5.3 Renumbered paragraph 6.5.4 to 6.5.3 and 6.5.5 to 6.5.4 Revised renumbered paragraph 6.5.4 Electronic Components Industry Association 2214 Rock Hill Road, Suite 265 * Herndon, VA 20170 * tel 571-323-0294 * fax 571-323-0245 www.ecianow.org
