1、STDmEIA EIA-5200000-D-ENGL 2000 3234b00 Obb7042 TIL *+ ANSVEIA-5200000-D-20OO Approved: October 25, 2000 ci O O O O c-4 2 W EIA SPECIFICATION Generic Specification for Special-Use Electromechanical Switches of Certified Quality EIA-5200000-D (Revision of EU-5200000-C) OCTOBER 2000 Electronic Conpomn
2、ts, Assembiles .S Materiais Association ELECTRONIC COMPONENTS, ASSEMBLIES the manufacturer shall have the sole responsibility for his compliance with the product and system requirements. The Supplier Declaration of Conformity shall be in accordance with ISO/IEC Guide 22. 3.2.1 Qualification Approval
3、 Tests The tests required for qualification approval inspection are prescribed in annex B. As a minimum, the qualification test shall include all tests in annex B that are designated as mandatory tests. The relevant specification may also prescribe tests that are not in annex B, in that case it shal
4、l include the additional tests either within existing test groups or as additional test groups. The test samples for qualification approval inspection shall be randomly selected from a current production lot or as agreed with the certifjmg organization. 3.2.2 Test Specimens The minimum number of tes
5、t specimens for each test shall be in accordance with annex B. The test specimens shall be representative of the type(s) for which qualification is sought. See 3.3. Test specimens shall not be included in lots released for delivery. 3.2.3 Extent of Qualification Approval Qualification approval may b
6、e granted for all switches that are structurally similar to the qualification test specimens described in the Detail Specification or, in the case of capability approval, it may be granted for the range of products described in the Detail Specification having capability approval requirements. 3.2.4
7、Maintenance of Qualification Qualification is maintained by regular demonstration of compliance with the requirements for quality conformance inspection. Test records must be maintained by the manufacturer and made available on request. 3.2.5 Suspension or Withdrawal of Qualification The manufacture
8、r shall voluntarily suspend its qualification if it fails to comply with the requirements of the specification. Suspension shall be temporary until the reason(s) for failure have been corrected. The manufacturer may also withdraw its qualification. Customers must be notified of suspension or withdra
9、wal of qualification. 3.2.6 Significant changes The manufacturer shall report to its customers any technical modifications that could adversely affect EIA-5200000-D Page 8 the results of the qualification tests. Technical modifications include changes in the design, materials, technology, manufactur
10、ing procedures andor manufacturing location. 3.3 Structurally Similar Switches Structurally similar switches for product qualification detail specifications are switches produced by the same manufacturer with essentially the same design, materials, processes and methods. They are such that the resul
11、ts of a given test carried out on one type of these switches can be recognized as being valid for other types of the group. They are separately identifiable. Structurally similar switches for capability approval specifications are switches produced by the same manufacturer with essentially the same
12、design, materials, processes and methods, and that are within the range of products described in the detail specification having capability approval requirements. The manufacturer shall submit to the System Supervising Inspectorate a certified statement of the structural similarities between the typ
13、es of switches for which qualification is sought and a recommended grouping of switches for each test of the qualification inspection test sequence. The System Supervising Inspectorate shall determine the appropriate grouping of structurally similar components. 3.4 Quality Conformance Inspection The
14、 detail specification associated with the appropriate sectional specification shall prescribe the test schedule for Quality Conformance Inspection (QCI) which, as a minimum, shall be in accordance with those tests in annex C which are designated as mandatory tests. Inspection levels, AQLs and sampli
15、ng plans shall be selected from ANSUASQC Z1.4, ANSUMIL-STD-105, IEC Publication 410. ELA-585 and 585 (The one shown below is an “accept on O“ plan generally based on EM-595). If necessary, more than one QCI schedule may be specified. Accept on zero sampling plan Lot Size 1-8 9- 150 151 -280 281 - 50
16、0 501 - 1200 1201-3200 3201 -10.000 Number of switches to be tested ALL 8 20 29 34 42 50 ELA-5200000-D Page 9 3.4.1 Certified Records of Released Lots When the detail specification specifies the issuance of a Certified Record of Released Lots, it shall prescribe the tests for which the results shall
17、 be presented and shall specify how these results shall be expressed. As a minimum, these records shall contain attributes information (e.g., number of components tested and number of defective components) for tests in the subgroups covered by periodic inspection without reference to the parameters
18、for which rejection was made. 3.4.2 Delayed Delivery Switches held for more than 3 years (unless otherwise specified by the relevant specification) following the release of the inspection lot shall be re-examined prior to delivery. The procedure of the re-examination shall be approved by the certify
19、ing organization. Once a lot has been re-inspected, its quality is re-assured for the specified period. 3.4.3 Release of Lots for Delivery The lots shall be released or rejected on the basis of the lot-by-lot tests unless otherwise prescribed in the relevant specification. 3.4.4 Delivery of Tested S
20、witches Only switches subjected to nondestructive inspections may be included in the lot to be delivered. Switches subjected to destructive inspections shall not be included in the lot to be delivered. Destructive inspections are noted in annexes B and C. 3.4.5 Lot-by-Lot Inspection Tests: The minim
21、um requirements for lot-by-lot inspection shall be as prescribed in annex C. 3.4.6 Periodic Inspection Tests The tests required for periodic inspection shall be prescribed in the sectional specification. Annex C shows an example. The periodic inspection shall be performed at intervals no greater tha
22、n 36 months. 3.5 Alternative Test Methods The test and measurement methods prescribed herein are not necessarily the only methods which can be used. However, the manufacturer shall satisfy the certibng organization that any alternative methods that he may use will produce results equivalent to those
23、 obtained by the specified methods. In case of dispute, the specified methods shall be used for referee or reference purposes. EIA-5200000-D Page 10 3.6 Unchecked Parameters Only those parameters of a switch that have been specified in a detail specification and that were subject to testing can be a
24、ssumed to be within the specified limits. It should not be assumed that any parameters not specified will remain unchanged from one switch to another. Should it be necessary for any reason for further parameter(s) to be controlled, then a new, more extensive, specification should be used. The additi
25、onal test method(s) shall be fully described and appropriate limits, AQLs and inspection levels specified. 4 TEST AND MEASUREMENT PROCEDURES 4.1 General The sectional and/or detail specification shall contain tables showing the tests to be made, the measurements to be made before and after each test
26、 or group of tests, and the sequence in which they shall be carried out. The measuring conditions shall be the same for initial and final measurements. When tests are conducted in a sequence the final measurements of one test may be taken as the initial measurements for the succeeding test. Not all
27、the test methods prescribed herein are applicable to all types and styles of switches. The detail specification shall prescribe the test methods which are applicable for that switch type. See 3.1.1 for the minimum tests required of Qualification Approval Inspection. When necessary, additional test m
28、ethods and/or details of the test methods shall be prescribed by the sectional or detail specification. 4.1.1 Electrical Tolerances The actual value of the test voltage, test current, and test fi-equency shall be within 5% of the nominal switch ratings. 4.1.2 Special Preparation Unless specified by
29、the test method, the switches shall not be subjected to any special preparations, such as cleaning, prior to or during the tests. 4.1.3 Mounting When mounting is prescribed by the test method, the switch shall be rigidly mounted by its normal mounting means on a metal plate or, if applicable, on a p
30、rinted circuit board. The dimensions of the metal plate and printed circuit board shall be such that the contour of the switch in the mounting plane is exceeded. The method of mounting and the materials used for mounting shall not adversely affect the electrical or mechanical performance of the swit
31、ch. STD-EIA EIA-5200000-D-ENGL 2000 W 3234b00 ObbSOb T37 = EM-5200000-D Page 11 4. I .4 Order of Precedence The order of precedence for limits applicable to any required test method shall be: a) Detail Specification b) Sectional Specification c) Generic Specification d) Basic Specification 4.1.5 Opt
32、ional Reduction of Testing Where prescribed by the applicable specification, the total number of contact sets tested may be reduced according to the conditions prescribed by the relevant specification. 4.2 Standard Atmospheric Conditions 4.2.1 Standard Atmospheric Conditions for Testing Unless other
33、wise specified, all tests and measurements shall be made under standard atmospheric conditions for testing as given in EM-448: temperature : 15 OC k 35 “C relative humidity: 45% - 75% air pressure : 86 kPa - 106 kPa Before the measurements are made, the switches shall be stored at the measuring temp
34、erature for a time sufficient to allow the entire switch to reach this temperature. The time period prescribed for recovery at the end of the test is sufficient for this purpose. 4.2.2 Recovery Conditions Unless otherwise specified, recovev shall take place under the standard atmospheric conditions
35、for testing. Unless otherwise specified, a duration of 1 to 2 hours shall be used. 4.3 Standard Drying Conditions When drying is specified by the relevant specification, the drying conditions shall be 55 “C +_ 2 OC, 20% R.H. maximum maintained for 6 hours minimum. 4.4 Test 1 , General Examinations T
36、est 1-1 Visual Examination EIA-5200000-D Page 12 OBJECT: The objective of the examination is the assessment of proper markings, appearance, and workmanship. METHOD: The following parameters shall be examined without magnification: a) markings (Subclause 2.5) b) general appearance c) workmanship CRIT
37、ERIA: The markings shall be correct and legible. The switch shall be manufactured in a careful and workmanlike manner. Test 1-2 Dimensions OBJECT: The objective of the examination is the assessment of the actual switch dimensions. METHOD: The measurements shall be performed according to the followin
38、g details: a) The specified dimension shall be measured. b) The accuracy and resolution of the measuring equipment (micrometers, calipers, visual comparators, etc.) shall be commensurate with the dimensions being measured. CRITERIA: The dimensions shall be within the limits specified by the detail s
39、pecification. Test 1-3 Gauging OBJECT: The objective of the examination is the assessment of compliance with specified gauges or gauge dimensions. METHOD: The dimensions prescribed by the detail specifications as being suitable for gauging shall be checked using the gauges or gauge dimensions specif
40、ied by the detail specification. CRITERIA: The switch shall comply with the prescribed gauging. Test 1-4 Mass OBJECT: The objective of the measurement is the assessment of the actual switch mass. METHOD: The measurement shall be performed in accordance with the following details: a) The accuracy and
41、 resolution of the measuring equipment shall be commensurate with the mass EIA-5200000-D Page 13 being measured. b) The measurement shall include all removable parts (mounting hardware, etc.) prescribed by the detail specification. CRITERIA: The mass shall be within the limits specified by the detai
42、l specification. Test 1-5 Functional Operation OBJECT: The objective of the examination is the assessment of the proper functioning of all switching operations. METHOD: Each switching circuit shall be connected to a monitoring circuit that has a maximum voltage of 10 volts, has a maximum current of
43、150 milliamperes, and provides an indication of current flow. The switch shall be actuated throughout its range of travel to provide an output from each switching circuit. The correct functioning of all mechanical detents, latching, locking, interlocking, and self-return mechanisms shall be checked.
44、 The correct functioning of all electrical nonswitching operations, such as lamp circuits or solenoids, shall be checked at its rated voltage or rated current. CRITERIA: The functional operation of the switch, including the sequence of contact operations, shall comply with the requirements specified
45、 by the detail specification. Test 1-6 Operating Characteristics OBJECT: The objective of the measurements is the assessment of the actual force and travel characteristics of the switch actuator. METHOD: The method of measuring the operating characteristics shall be appropriate for the characteristi
46、c being measured. Its accuracy shall be commensurate with the characteristic being measured. CRITERIA: The operating Characteristics shall be within the limits specified by the detail specification. Test 1-7 Contact Bounce OBJECT: The objective of the test to assess the duration of the random openin
47、g and closing of switch contacts that may occur after contact transfer. METHOD: The test shall be performed in accordance with EIA-448, Method 15. STD-EIA EIA-5200000-D-ENGL 2O = 323Lib00 Obb90b3 74b m EU-5200000-D Page 14 CRITERIA: The contact bounce shall not exceed 8 milliseconds unless otherwise
48、 specified by the detail specification. 4.5 Test 2, Resistance Measurements Test 2-1 Switch Resistance - Millivolt Level OBJECT: The objective of the measurement is the determination of the total electrical resistance of the conducting switching circuits, including the switch terminations, at a volt
49、age that has no electrical effect on the contact material. METHOD: The measurement shall be performed in accordance with ELA-448, Method 1. The following details shall apply: a) The voltage drop measurement shall be made across the switch terminations associated with the switch circuit being measured. b) The switching circuit may be operated 4 cycles maximum prior to the measuring cycle(s), unless otherwise specified. c) The test voltage shall be 30 millivolts maximum. The test current shall be 10 milliamperes maximum. d) For lot-by-lot inspections, one actuation shall
