EIA RS-186-12E-1978 STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 12 HEAT-LIFE TEST.pdf

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1、ANSI/EIA RS-186-E-78 Approved October 27,1978 E-IA STANDARD STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS . METHOD 12: HEAT- LIFE TEST RSl86.12E (Revision ofRS-l86-D, Method 12) OCTOBER 1978 h Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION - 1 NOTICE EIA engineering standard

2、s are designed to serve the public interest through eliminating mis- understandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with mini- mum delay the proper product for his particular nee

3、d. Existence of such standards shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such standards, nor shall the existence of such standards preclude their voluntary use by those other than EIA members whether the standard is to

4、be used either domestically or internationally. Recommended standards are adopted by EIA without regard to whether or not their adop- tion may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligatio

5、n whatever to parties adopting the recommended standards. This EIA Recommended Standard is considered to have international standardization impli- cations, but the International Electrotechnical Commission has chosen to write this test procedure for each type of component. There is therefore no vali

6、d comparison between this EIA recommended standard and the International Electrotechnical Commission recommendation. -The 314 1,000 2 48 85 f 2 (185 5 3,6“F) 200 f 4 (392 rt: 7,gQF)- 24* 1 2,000 f 48 48 It 2-1 I2 5,000 f 250 961 5 10,000 rt: 500 240 .t. 12 The test objective shall be to run continuo

7、usly (unless otherwise specified); occasional discontinuities not to exceed 5% of the total time, are permitted but the tatal hours at the specified temperature must be maintained. Relevant component specifications shall indicate intermediate measurement requirements, if any. If possible, the interm

8、ediate periods shall coincide with one of the standard time periods in the tabula- tion preceding. NQTE: Sufficient injected air shall be provided ta minimize any increase in bumidity due to the heated specimens or the chamber. If satisfactory results are obtained with initid and makeup air having a

9、 humidity within the range of the standard conditious far testing, humidity control need not he employed. If the components or equipment fail to meet the applidAe standard requirements, the tests may be run under the following referee condition, The humidity within the chamber shall be limited so th

10、at it does not exceed an absolute humidity of 20 grams of H, O vapdcv meter (corresponding approxi- mately ta 50% RH at 35C (95F). e 4. PRECAUTION Make original and all subsequent test measurements under similar conditions, to. avoid mixing tem- perature coefficient effects with the desired test res

11、ults. 5. SUMMARY The following details shall be specified in the individual component standard: 5.1 Method of mounting components in the test. 5.2 Test severity, (a) temperature, (h) time duration. 5.3 Measurements required and measurement interval. 5.4 Conditions under which measurements are to he made. 5.5 Component loading condition, duty cycle ar operation, if applicable. t

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