1、BRITISH STANDARDBS EN 60749-32:2003Semiconductor devices Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally induced)ICS 31.080.01g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g3
2、6g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58+A1:2010National forewordThis British Standard is the UK implementation of EN 60749-32:2003+A1:2010. It is identical to IEC 60749-32:2002, incorporating amendment 1:2010. It supersedes BS EN 60749-32:2003,which will be
3、withdrawn on 1 September 2013.The start and finish of text introduced or altered by amendment is in-dicated in the text by tags. Tags indicating changes to IEC text carry the number of the IEC amendment. For example, text altered by IEC amendment 1 is indicated by !“.The UK participation in its prep
4、aration was entrusted to Technical Committee EPL/47, Semiconductors.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct applica
5、tion.Compliance with a British Standard cannot confer immunity from legal obligations.BS EN 60749-32:2003+A1:2010This British Standard was published under the authority of the Standards Policy and Strategy Committee on7 July 2003 BSI 2011Amendments/corrigenda issued since publicationDate Comments 31
6、 March 2011 ISBN 978 0 580 68754 9Implementation of IEC amendment 1:2010 with CENELEC endorsement A1EUROPEAN STANDARD EN 60749-32:2003+A1 NORME EUROPENNE EUROPISCHE NORM September 2010CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Euro
7、pisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-32:2003 E ICS 31.080.01 English version Semiconductor devices - Mec
8、hanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2002) Dispositifs semiconducteurs - Mthodes dessais mcaniques et climatiques Partie 32: Inflammabilit des dispositifs encapsulation plastique (cas dune cause extrieure dinflamma
9、tion)(CEI 60749-32:2002) Halbleiterbauelemente - Mechanische und klimatische PrfverfahrenTeil 31: Entflammbarkeit von Bauelementen in Kunststoffgehusen (Selbstentzndung) (IEC 60749-32:2002) This European Standard was approved by CENELEC on 2002-09-24. CENELEC members are bound to comply with the CEN
10、/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to
11、any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official v
12、ersions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom. Foreword
13、The text of the International Standard IEC 60749-32:2002 was approved by CENELEC as EN 60749-32 on 2002-09-24. The text of this International Standard was reproduced from IEC 60749:1996, chapter 4, subclause 1.2 without change. Therefore, it has not been submitted to vote a second time and is still
14、based on document 47/1394/FDIS. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-01-01 latest date by which the national standards conflicting with the EN have to be withd
15、rawn (dow) 2005-10-01 Each test method governed by this standard and which is part of the series is a stand-alone document, numbered EN 60749-2, EN 60749-3, etc. The numbering of these test methods is sequential, and there is no relationship between the number and the test method (i.e. no grouping o
16、f test methods). The list of these tests will be available in the CENELEC internet site and in the catalogue. Updating of any of the individual test methods is independent of any other part. Annexes designated “normative“ are part of the body of the standard. In this standard, annex ZA normative. An
17、nex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60749-32:2002 was approved by CENELEC as a European Standard without any modification. _ Page 2Foreword to amendment A1The text of document 47/2018/CDV, future amendment 1 to IEC 60749-32:2002, prepared
18、 by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as amendment A1 to EN 60749-32:2003 on 2010-09-01. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC sh
19、all not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2011-06-01 latest date by which the national
20、standards conflicting with the amendment have to be withdrawn (dow) 2013-09-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of amendment 1:2010 to the International Standard IEC 60749-2:2002 was approved by CENELEC as an amendment to the European Standard without any modificatio
21、n. _ BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)INTRODUCTION Activity within IEC technical committee 47, working group 2, includes the generation, coordination and review of climatic, electrical (of which only ESD, latch-up and electrical conditions for life tests are considered), mechan
22、ical test methods, and associated inspection techniques needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes. Page 3BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)SEMICONDUCTOR DEVICES MECHANICAL AND CLIMATIC TEST METHODS Part 32:
23、 Flammability of plastic-encapsulated devices (externally induced) 1 Scope and object This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a
24、needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to claus
25、es 2 and 3 and renumbering. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies
26、. 3 Test procedure This test shall be in accordance with the needle-flame test, with the following specific requirements: a) preconditioning: none; b) number of test specimens: three, unless otherwise stated in the detail specification; c) position of the specimen: according to Figure 1b of IEC 6069
27、5-11-5:2004; d) surface to be tested and point of application: according to Figure 1b of IEC 60695-11-5:2004; e) underlying layer: paper on pinewood, according to 5.4 of IEC 60695-11-5:2004; f) duration of application of the flame (ta): 10 s; g) duration of burning: 10 s; h) extent of burning: it sh
28、all not extend over a surface significantly greater than that touched by the flame during its application. _ Page 4IEC 60695-11-5:2004, Fire hazard testing Part 11-5: Test flames Needle-flame test method Apparatus, confirmatory test arrangement and guidance !“!“BS EN 60749-32:2003+A1:2010EN 60749-32
29、:2003+A1:2010 (E)Annex ZA (normative) Normative references to international publications with their corresponding European publications This European Standard incorporates by dated or undated reference, provisions from other publications. These normative references are cited at the appropriate place
30、s in the text and the publications are listed hereafter. For dated references, subsequent amendments to or revisions of any of these publications apply to this European Standard only when incorporated in it by amendment or revision. For undated references the latest edition of the publication referr
31、ed to applies (including amendments). NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year Page 5IEC 60695-11-5 2004 Fire hazard testing - Part 11-5: Test flames - Needle-flame test method
32、- Apparatus, confirmatory test arrangement and guidance EN 60695-11-5 2005 BS EN 60749-32:2003+A1:2010EN 60749-32:2003+A1:2010 (E)BSI GroupHeadquarters 389 Chiswick High Road, London, W4 4AL, UK Tel +44 (0)20 8996 9001 Fax +44 (0)20 8996 7001 standardsBSI - British Standards InstitutionBSI is the i
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