1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationElectrical equipment for measurement, control and laboratory use EMC requirementsPart 2-1: Particular requirements Test configurations, operational conditions and performance cri
2、teria for sensitive test and measurement equipment for EMC unprotected applications (IEC 61326-2-1:2012) BS EN 61326-2-1:2013National forewordThis British Standard is the UK implementation of EN 61326-2-1:2013. It is identical to IEC 61326-2-1:2012. It supersedes BS EN 61326-2-1:2006, which will be
3、withdrawn on 6 November 2015.The UK participation in its preparation was entrusted by Technical Commit-tee GEL/65, Measurement and control, to Subcommittee GEL/65/1, System considerations.A list of organizations represented on this committee can be obtained on request to its secretary.This publicati
4、on does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2013.Published by BSI Standards Limited 2013.ISBN 978 0 580 74934 6 ICS 25.040.40; 33.100.01Compliance with a British Standard cannot confer
5、 immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 28 February 2013.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 61326-2-1:2013EUROPEAN STANDARD EN 61326-2-1 NORME EUROPENNE
6、 EUROPISCHE NORM January 2013 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form
7、and by any means reserved worldwide for CENELEC members. Ref. No. EN 61326-2-1:2013 E ICS 17.220; 25.040.40; 33.100 Supersedes EN 61326-2-1:2006 English version Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configuratio
8、ns, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications (IEC 61326-2-1:2012) Matriel lectrique de mesure, de commande et de laboratoire - Exigences relatives la CEM - Partie 2-1: Exigences particulires - Configurations dessai,
9、 conditions fonctionnelles et critres de performance pour essai de sensibilit et quipement de mesures pour les applications non protges de la CEM (CEI 61326-2-1:2012) Elektrische Mess-, Steuer-, Regel- und Laborgerte EMV-Anforderungen Teil 2-1: Besondere Anforderungen Prfanordnung, Betriebsbedingung
10、en und Leistungsmerkmale fr empfindliche Prf- und Messgerte fr Anwendungen ohne EMV-Schutzmanahmen (IEC 61326-2-1:2012) This European Standard was approved by CENELEC on 2012-11-06. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for givin
11、g this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three o
12、fficial versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrot
13、echnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romani
14、a, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 61326-2-1:2013EN 61326-2-1:2013 Foreword The text of document 65A/641/FDIS, future edition 2 of IEC 61326-2-1, prepared by SC 65A, “Systemaspects“, of IEC TC 65, “Industrial-process measurement, control and autom
15、ation“ was submitted to theIEC-CENELEC parallel vote and approved by CENELEC as EN 61326-2-1:2013. The following dates are fixed: latest date by which the document has to be implemented at national level bypublication of an identical national standard or by endorsement (dop) 2013-08-06 latest date b
16、y which the national standards conflicting with the document have to be withdrawn (dow) 2015-11-06 This document supersedes EN 61326-2-1:2006. EN 61326-2-1:2013 includes the following significant technical changes with respect to EN 61326-2-1:2006: Update with respect to EN 61326-1:2013. EN 61326-2-
17、1:2013 is to be used in conjunction with EN 61326-1:2013 and follows the same numberingof clauses, subclauses, tables and figures. When a particular subclause of EN 61326-1 is not mentioned in this part, that subclause applies as far asis reasonable. When this standard states “addition”, “modificati
18、on” or “replacement”, the relevant text inEN 61326-1 is to be adapted accordingly. NOTE The following numbering system is used: subclauses, tables and figures that are numbered starting from 101 are additional to those in EN 61326-1; unless notes are in a new subclause or involve notes in EN 61326-1
19、, they are numbered starting from 101 includingthose in a replaced clause or subclause; additional annexes are lettered AA, BB, etc. Attention is drawn to the possibility that some of the elements of this document may be the subject ofpatent rights. CENELEC and/or CEN shall not be held responsible f
20、or identifying any or all such patentrights. This document has been prepared under a mandate given to CENELEC by the European Commissionand the European Free Trade Association, and supports essential requirements of EU Directive(s). For the relationship with EU Directive(s) see informative Annex ZZ,
21、 which is an integral part of thisdocument. Endorsement notice The text of the International Standard IEC 61326-2-1:2012 was approved by CENELEC as a EuropeanStandard without any modification. BS EN 61326-2-1:2013EN 61326-2-1:2013 Annex ZA (normative) Normative references to international publicatio
22、nswith their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced doc
23、ument (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HDapplies. Annex ZA of EN 61326-1:2013 applies, except as follows: Publication Year Title EN/HD Year Addition: IEC 61326-1 2012 Electrical e
24、quipment for measurement, control and laboratory use - EMC requirements - Part 1: General requirements EN 61326-1 2013 BS EN 61326-2-1:2013EN 61326-2-1:2013 Annex ZZ (informative) Coverage of Essential Requirements of EU Directives This European Standard has been prepared under a mandate given to CE
25、NELEC by the EuropeanCommission and the European Free Trade Association and within its scope the standard coversprotection requirements of Annex I, Article 1 of the EC Directive 2004/108/EC. Compliance with this standard provides one means of conformity with the specified essentialrequirements of th
26、e Directives concerned. NOTE Other requirements and other EU Directives may be applicable to the products falling within the scope ofthis standard. BS EN 61326-2-1:201361326-2-1 IEC:2012 CONTENTS 1 Scope . . 5 2 Normative references . 5 3 Terms and definitions . 5 4 General . 5 5 EMC test plan . 5 5
27、.1 General . 5 5.2 Configuration of EUT during testing . 6 5.3 Operation conditions of EUT during testing . 6 5.4 Specification of functional performance . 7 5.5 Test description . 7 6 Immunity requirements . 7 6.1 Conditions during the tests . . 7 6.2 Immunity test requirements . 7 6.3 Random aspec
28、ts. . 7 6.4 Performance criteria . 7 7 Emission requirements . 7 8 Test results and test report . . 7 9 Instructions for use 7 BS EN 61326-2-1:201361326-2-1 IEC:2012 5 ELECTRICAL EQUIPMENT FOR MEASUREMENT, CONTROL AND LABORATORY USE EMC REQUIREMENTS Part 2-1: Particular requirements Test configurati
29、ons, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications 1 Scope In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test configurations, operational conditions and performance criteria for
30、equipment with test and measurement circuits (both internal and/or external to the equipment) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects th
31、e appropriate test level specifications of IEC 61326-1. NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers, network analysers, analogue instruments, digital multimeters (DMM) and board test systems. 2 Normative references The following docu
32、ments, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. Clause 2 of IEC 61326-1 a
33、pplies, except as follows: Addition: IEC 61326-1: 2012, Electrical equipment for measurement, control and laboratory use EMC requirements Part 1: General requirements 3 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 61326-1 and IEC 60050-161 apply. 4
34、General Clause 4 of IEC 61326-1 applies. 5 EMC test plan 5.1 General Subclause 5.1 of IEC 61326-1 applies. BS EN 61326-2-1:2013 6 61326-2-1 IEC:2012 5.2 Configuration of EUT during testing Subclause 5.2 of IEC 61326-1 applies, except as follows: Addition: 5.2.4.101 I/O ports for test and measurement
35、 purposes Test and measurement input ports shall be capped and shorted unless this leads to an operating condition unsuitable for measuring the emission and immunity performance of the product. If an input signal is needed, an appropriate input signal shall be applied using test leads or probes as s
36、pecified by the manufacturer. Test and measurement output ports not needed to evaluate the essential functions of the EUT shall be capped and/or terminated. Electrostatic discharges shall be applied to the housing shield, but not to the inner pins of shielded port or cable connectors. Examples inclu
37、de: BNC, D-subminiature, IEEE 488 (IEC 60488), RS232 and IEEE 1284-B (parallel printer port), etc. NOTE 1 Probes and/or test leads not used to apply an input signal during test to the test and measurement ports do not need to be connected. Such test leads can vary substantially from one application
38、to another and are often connected to equipment that has the covers removed and may be in various stages of disassembly to provide access to test points inside. Connected test leads may increase emissions and/or reduce immunity in certain applications. NOTE 2 Capped means locally covered with a scre
39、en or shield. 5.3 Operation conditions of EUT during testing Subclause 5.3 of IEC 61326-1 applies, except as follows: Addition: 5.3.101 Operational conditions When both battery and a.c. options are available, both modes of operation shall comply. 5.3.102 Oscilloscopes The oscilloscope ports shall be
40、 set for maximum sweep speed, maximum sensitivity and continuous acquisition mode unless other modes are known to provide worst-case emission or immunity results within normal applications. 5.3.103 Logic analysers The logic analyser shall be set for data analysis modes during emission measurement an
41、d continuous data acquisition mode during immunity testing unless other modes are known to provide worst-case emission or immunity results within normal applications. 5.3.104 Digital multimeters (DMM) Typical set-ups include: peak detect, maximum sensitivity (usually auto-range, if available, will s
42、uffice) and continuous acquisition mode. 5.3.105 Other equipment For equipment not mentioned in 5.3.102 to 5.3.104, the following philosophy shall apply. BS EN 61326-2-1:201361326-2-1 IEC:2012 7 A selection of representative operation modes shall be made, taking into account that not all functions,
43、but only the most typical functions of the equipment can be tested. The estimated worst-case operating modes for normal application shall be selected 5.4 Specification of functional performance Subclause 5.4 of IEC 61326-1 applies. 5.5 Test description Subclause 5.5 of IEC 61326-1 applies. 6 Immunit
44、y requirements 6.1 Conditions during the tests Subclause 6.1 of IEC 61326-1 applies. 6.2 Immunity test requirements Subclause 6.2 of IEC 61326-1 applies. 6.3 Random aspects Subclause 6.3 of IEC 61326-1 applies. 6.4 Performance criteria Subclause 6.4 of IEC 61326-1 applies, except as follows: Additio
45、n: 6.4.101 Tests with transient electromagnetic phenomenon During testing with transient electromagnetic phenomena that are assigned to performance criteria B in Table 1, 2 or 3 of IEC 61326-1, the EUT may have temporary degradation or loss of function or performance which is self-recovering. Self-r
46、ecovery times greater than 10 s shall be specified by the manufacturer in the equipment documentation for the user. Trigger functions need not be evaluated. No change in actual operating state or loss of stored data is allowed. 7 Emission requirements Clause 7 of IEC 61326-1 applies. 8 Test results
47、and test report Clause 8 of IEC 61326-1 applies. 9 Instructions for use Clause 9 of IEC 61326-1 applies, except as follows: Addition: BS EN 61326-2-1:2013 8 61326-2-1 IEC:2012 9.101 Additional instructions The manufacturer shall give information that the equipment may not meet the immunity requireme
48、nts of this standard when test leads and/or test probes are connected and shall give guidance how to use test leads and/or test probes to minimize the impact of disturbances. _ BS EN 61326-2-1:2013This page deliberately left blankThis page deliberately left blankBSI is the independent national body
49、responsible for preparing British Standards and other standards-related publications, information and services. It presents the UK view on standards in Europe and at the international level. BSI is incorporated by Royal Charter. British Standards and other standardisation products are published by BSI Standards Limited.British Standards Institution (BSI)raising standards worldwideBSI389 Chiswick High Road London W4 4AL UKTel +44 (0)20 8996 9001Fax +44 (0)20 8996 7001www.bsigro
