1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationHigh-voltage switchgear and controlgearPart 101: Synthetic testingBS EN 62271-101:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under lice
2、nse with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-National forewordThis British Standard is the UK implementation of EN 62271-101:2013. It is identical to IEC 62271-101:2012. It supersedes BS EN 62271-101:2006+A1:2010 which is withdrawn.The UK partici
3、pation in its preparation was entrusted by Technical Committee PEL/17, Switchgear, controlgear, and HV-LV co-ordination, to Subcommittee PEL/17/1, High-voltage switchgear and controlgear.A list of organizations represented on this committee can be obtained on request to its secretary.This publicatio
4、n does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2013Published by BSI Standards Limited 2013 ISBN 978 0 580 71087 2 ICS 29.130.10Compliance with a British Standard cannot confer immunity fro
5、m legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 March 2013.Amendments issued since publicationDate Text affectedBRITISH STANDARDBS EN 62271-101:2013Copyright European Committee for Electrotechnical Standardization Provi
6、ded by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EUROPEAN STANDARD EN 62271-101 NORME EUROPENNE EUROPISCHE NORM January 2013 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrote
7、chnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62271-101:2013 E ICS 29.130.10 Supersedes EN 62271-101:2006 + A1:
8、2010 English version High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-101:2012) Appareillage haute tension - Partie 101: Essais synthtiques (CEI 62271-101:2012) Hochspannungs-Schaltgerte und -Schaltanlagen - Teil 101: Synthetische Prfung (IEC 62271-101:2012) This Euro
9、pean Standard was approved by CENELEC on 2012-11-16. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical reference
10、s concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN
11、ELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugosla
12、v Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 62271-101:2013Copyright European Committe
13、e for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-EN 62271-101:2013 - 2 - Foreword The text of document 17A/1015/FDIS, future edition 2 of IEC 62271-101, prepared by SC 17A, “High-voltag
14、e switchgear and controlgear“, of IEC TC 17, “Switchgear and controlgear“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62271-101:2013. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identic
15、al national standard or by endorsement (dop) 2013-08-16 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-11-16 This document supersedes EN 62271-101:2006 + A1:2010. EN 62271-101:2013 includes the following significant technical changes with re
16、spect to EN 62271-101:2006: addition of the new rated voltages of 1 100 kV and 1 200 kV; revision of Annex F regarding circuit-breakers with opening resistors; alignment with the EN 62271-100:2009 + A1: 2012. This publication shall be read in conjunction with EN 62271-100:2009, to which it refers. T
17、he numbering of the subclauses of Clause 6 is the same as in EN 62271-100. However, not all subclauses of EN 62271-100 are addressed; merely those where synthetic testing has introduced changes. Attention is drawn to the possibility that some of the elements of this document may be the subject of pa
18、tent rights. CENELEC and/or CEN shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62271-101:2012 was approved by CENELEC as a European Standard without any modification. BS EN 62271-101:2013Copyright European Co
19、mmittee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 3 - EN 62271-101:2013 Annex ZA (normative) Normative references to international publications with their corresponding European p
20、ublications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) appl
21、ies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 62271-100 + A1 2008 2012 High-voltage switchgear and controlgear - Part 100: Alternating current circuit-breakers EN 62271-100
22、+ A1 2009 2012 BS EN 62271-101:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 62271-101 IEC:2012 CONTENTS 1 Scope . 9 2 Normative references . 9 3 Te
23、rms and definitions . 9 4 Synthetic testing techniques and methods for short-circuit breaking tests . 11 Basic principles and general requirements for synthetic breaking test 4.1methods 11 General . 11 4.1.1High-current interval 12 4.1.2Interaction interval . 12 4.1.3High-voltage interval 13 4.1.4Sy
24、nthetic test circuits and related specific requirements for breaking tests 14 4.2Current injection methods 14 4.2.1Voltage injection method . 15 4.2.2Duplicate circuit method (transformer or Skeats circuit) . 15 4.2.3Other synthetic test methods . 16 4.2.4Three-phase synthetic test methods 16 4.35 S
25、ynthetic testing techniques and methods for short-circuit making tests . 19 Basic principles and general requirements for synthetic making test methods . 19 5.1General . 19 5.1.1High-voltage interval 19 5.1.2Pre-arcing interval . 19 5.1.3Latching interval and fully closed position 20 5.1.4Synthetic
26、test circuit and related specific requirements for making tests 20 5.2General . 20 5.2.1Test circuit 20 5.2.2Specific requirements 20 5.2.36 Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 through 6.111 of IEC 62271-100:2008 . 21 Ann
27、ex A (informative) Current distortion 42 Annex B (informative) Current injection methods 58 Annex C (informative) Voltage injection methods . 62 Annex D (informative) Skeats or duplicate transformer circuit 65 Annex E (normative) Information to be given and results to be recorded for synthetic tests
28、 . 68 Annex F (normative) Synthetic test methods for circuit-breakers with opening resistors . 69 Annex G (informative) Synthetic methods for capacitive-current switching . 76 Annex H (informative) Re-ignition methods to prolong arcing 88 Annex I (normative) Reduction in di/dt and TRV for test duty
29、T100a 91 Annex J (informative) Three-phase synthetic test circuits . 100 Annex K (normative) Test procedure using a three-phase current circuit and one voltage circuit . 107 Annex L (normative) Splitting of test duties in test series taking into account the associated TRV for each pole-to-clear 127
30、Annex M (normative) Tolerances on test quantities for type tests . 147 BS EN 62271-101:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-62271-101 IEC:2012
31、 3 Annex N (informative) Typical test circuits for metal-enclosed and dead tank circuit-breakers . 150 Annex O (informative) Combination of current injection and voltage injection methods . 160 Bibliography 163 Figure 1 Interrupting process Basic time intervals . 33 Figure 2 Examples of evaluation o
32、f recovery voltage 34 Figure 3 Equivalent surge impedance of the voltage circuit for the current injection method . 35 Figure 4 Making process Basic time intervals 36 Figure 5 Typical synthetic making circuit for single-phase tests 37 Figure 6 Typical synthetic making circuit for out-of-phase 38 Fig
33、ure 7 Typical synthetic make circuit for three-phase tests (kpp= 1,5) 39 Figure 8 Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100s with kpp= 1,5 40 Figure 9 Comparison of arcing time settings during three-phase direct tests (left)
34、and three-phase synthetic (right) for T100a with kpp= 1,5 41 Figure A.1 Direct circuit, simplified diagram . 49 Figure A.2 Prospective short-circuit current . 49 Figure A.3 Distortion current 49 Figure A.4 Distortion current 50 Figure A.5 Simplified circuit diagram 51 Figure A.6 Current and arc volt
35、age characteristics for symmetrical current 52 Figure A.7 Current and arc voltage characteristics for asymmetrical current 53 Figure A.8 Reduction of amplitude and duration of final current loop of arcing . 54 Figure A.9 Reduction of amplitude and duration of final current loop of arcing . 55 Figure
36、 A.10 Reduction of amplitude and duration of final current loop of arcing . 56 Figure A.11 Reduction of amplitude and duration of final current loop of arcing . 57 Figure B.1 Typical current injection circuit with voltage circuit in parallel with the test circuit-breaker . 59 Figure B.2 Injection ti
37、ming for current injection scheme with circuit B.1 60 Figure B.3 Examples of the determination of the interval of significant change of arc voltage from the oscillograms . 61 Figure C.1 Typical voltage injection circuit diagram with voltage circuit in parallel with the auxiliary circuit-breaker (sim
38、plified diagram) 63 Figure C.2 TRV waveshapes in a voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker . 64 Figure D.1 Transformer or Skeats circuit 66 Figure D.2 Triggered transformer or Skeats circuit . 67 Figure F.1 Test circuit to verify thermal re-i
39、gnition behaviour of the main interrupter 73 Figure F.2 Test circuit to verify dielectric re-ignition behaviour of the main interrupter . 73 Figure F.3 Test circuit on the resistor interrupter 74 Figure F.4 Example of test circuit for capacitive current switching tests on the main interrupter . 75 B
40、S EN 62271-101:2013Copyright European Committee for Electrotechnical Standardization Provided by IHS under license with CENELECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 4 62271-101 IEC:2012 Figure F.5 Example of test circuit for capacitive current switching
41、tests on the resistor interrupter 75 Figure G.1 Capacitive current circuits (parallel mode) 79 Figure G.2 Current injection circuit . 80 Figure G.3 LC oscillating circuit . 81 Figure G.4 Inductive current circuit in parallel with LC oscillating circuit . 82 Figure G.5 Current injection circuit, norm
42、al recovery voltage applied to both terminals of the circuit-breaker 83 Figure G.6 Synthetic test circuit (series circuit), normal recovery voltage applied to both sides of the test circuit breaker . 84 Figure G.7 Current injection circuit, recovery voltage applied to both sides of the circuit-break
43、er . 85 Figure G.8 Making test circuit 86 Figure G.9 Inrush making current test circuit 87 Figure H.1 Typical re-ignition circuit diagram for prolonging arc-duration . 89 Figure H.2 Combined Skeats and current injection circuits . 89 Figure H.3 Typical waveforms obtained during an asymmetrical test
44、using the circuit in Figure H.2 . 90 Figure J.1 Three-phase synthetic combined circuit . 102 Figure J.2 Waveshapes of currents, phase-to-ground and phase-to phase voltages during a three-phase synthetic test (T100s; kpp = 1,5 ) performed according to the three-phase synthetic combined circuit . 103
45、Figure J.3 Three-phase synthetic circuit with injection in all phases for kpp= 1,5. 104 Figure J.4 Waveshapes of currents and phase-to-ground voltages during a three-phase synthetic test (T100s; kpp=1,5) performed according to the three-phase synthetic circuit with injection in all phases . 104 Figu
46、re J.5 Three-phase synthetic circuit for terminal fault tests with kpp= 1,3 (current injection method) . 105 Figure J.6 Waveshapes of currents, phase-to-ground and phase-to-phase voltages during a three-phase synthetic test (T100s; kpp=1,3 ) performed according to the three-phase synthetic circuit s
47、hown in Figure J.5 105 Figure J.7 TRV voltages waveshapes of the test circuit described in Figure J.5 . 106 Figure K.1 Example of a three-phase current circuit with single-phase synthetic injection 118 Figure K.2 Representation of the testing conditions of Table K.1 . 119 Figure K.3 Representation o
48、f the testing conditions of Table K.2 . 120 Figure K.4 Representation of the testing conditions of Table K.3 . 121 Figure K.5 Representation of the testing conditions of Table K.4 . 122 Figure K.6 Representation of the testing conditions of Table K.5 . 123 Figure K.7 Representation of the testing conditions of Table K.6 . 124 Figure K.8 Representation of the testing conditions of Table K.7 . 125 Figure K.9 Representation of the testing conditions of Table K.8 . 126 Figure L.1 Graphical representation of the tes
