1、 ETSI TS 102 230-1 V11.0.0 (2016-06) Smart Cards; UICC-Terminal interface; Physical, electrical and logical test specification; Part 1: Terminal features (Release 11) TECHNICAL SPECIFICATION ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)2 Reference RTS/SCP-00102230Tvb00 Keywords smart card, testing ETSI 6
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7、n of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2016. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTMand the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE are Tr
8、ade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)3 Contents Intellectual Property Rights 12g3Foreword . 12g3Modal verbs termin
9、ology 12g3Introduction 12g31 Scope 14g32 References 14g32.1 Normative references . 14g32.2 Informative references 15g33 Definitions, symbols, abbreviations and coding conventions 15g33.1 Definitions 15g33.2 Symbols 15g33.3 Abbreviations . 16g33.4 Coding conventions 17g33.5 Applicability . 17g33.5.1
10、Applicability of the present document 17g33.5.2 Applicability of the individual test cases 17g33.5.3 Applicability to terminal equipment . 17g33.6 Definitions 17g33.6.1 Format of table of the table of optional features . 17g33.6.2 Format of the applicability table . 18g33.6.3 Status and Notations .
11、18g33.7 Table of optional features . 19g33.8 Applicability table 20g34 Physical characteristic tests 24g34.1 Contact pressure . 24g34.1.1 Definition and applicability 24g34.1.2 Conformance requirement 24g34.1.2.0 Description 24g34.1.2.1 Reference 24g34.1.3 Test purpose 24g34.1.4 Method of test . 24g
12、34.1.4.1 Initial conditions . 24g34.1.4.2 Procedure 24g34.1.5 Acceptance criteria . 24g34.2 Curvature of the contacting elements . 24g34.2.1 Definition and applicability 24g34.2.2 Conformance requirement 25g34.2.2.0 Description 25g34.2.2.1 Reference 25g34.2.3 Test purpose 25g34.2.4 Method of test .
13、25g34.2.4.1 Initial conditions . 25g34.2.4.2 Procedure 25g34.2.5 Acceptance criteria . 25g35 Electrical characteristic tests 25g35.1 Test of the power transition phases 25g35.1.1 Phase preceding Terminal power on . 25g35.1.1.1 Definition and applicability . 25g35.1.1.2 Conformance requirement. 25g35
14、.1.1.3 Reference 25g35.1.1.4 Test purpose 26g35.1.1.5 Method of test . 26g35.1.1.5.1 Initial condition . 26g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)4 5.1.1.5.2 Procedure . 26g35.1.1.6 Acceptance criteria 26g35.1.2 Phase during UICC power on . 26g35.1.2.1 Phase during UICC power on: 3 V - 5 V 26g35.
15、1.2.1.1 Definition and applicability . 26g35.1.2.1.2 Conformance requirement . 26g35.1.2.1.3 Reference . 26g35.1.2.1.4 Test purpose 27g35.1.2.1.5 Method of test 27g35.1.2.1.6 Acceptance criteria 27g35.1.2.2 Phase during UICC power on: 1,8 V - 3 V . 27g35.1.2.2.1 Definition and applicability . 27g35.
16、1.2.2.2 Conformance requirement . 27g35.1.2.2.3 Reference . 27g35.1.2.2.4 Test purpose 27g35.1.2.2.5 Method of test 28g35.1.2.2.6 Acceptance criteria 28g35.1.3 Phase during Terminal power off . 28g35.1.3.1 Phase during Terminal power off: 3 V - 5 V . 28g35.1.3.1.1 Definition and applicability . 28g3
17、5.1.3.1.2 Conformance requirement . 28g35.1.3.1.3 Reference . 28g35.1.3.1.4 Test purpose 29g35.1.3.1.5 Method of test 29g35.1.3.1.6 Acceptance criteria 29g35.1.3.2 Phase during Terminal power off: 1,8 V - 3 V 29g35.1.3.2.1 Definition and applicability . 29g35.1.3.2.2 Conformance requirement . 29g35.
18、1.3.2.3 Reference . 30g35.1.3.2.4 Test purpose 30g35.1.3.2.5 Method of test 30g35.1.3.2.6 Acceptance criteria 30g35.1.4 Warm reset timing 30g35.1.4.1 Definition and applicability . 30g35.1.4.2 Conformance requirement. 30g35.1.4.2.0 Description 30g35.1.4.2.1 Reference . 31g35.1.4.3 Test purpose 31g35
19、.1.4.4 Method of test . 31g35.1.4.4.1 Initial conditions 31g35.1.4.4.2 Procedure . 31g35.1.4.5 Acceptance criteria 31g35.1.5 UICC type recognition and voltage switching 31g35.1.5.1 Reaction of 3 V technology Terminals on type recognition of 3 V technology UICCs 31g35.1.5.1.1 Definition and applicabi
20、lity . 31g35.1.5.1.2 Conformance requirement . 31g35.1.5.1.3 Reference . 31g35.1.5.1.4 Test purpose 32g35.1.5.1.5 Method of test 32g35.1.5.1.6 Acceptance criteria 32g35.1.5.2 Reaction of 3 V technology Terminals on type recognition of 1,8 V technology UICCs . 32g35.1.5.2.1 Definition and applicabili
21、ty . 32g35.1.5.2.2 Conformance requirement . 32g35.1.5.2.3 Reference . 32g35.1.5.2.4 Test purpose 33g35.1.5.2.5 Method of test 33g35.1.5.2.6 Acceptance criteria 33g35.1.5.3 Reaction of 1,8 V technology Terminals on type recognition of 1,8 V technology UICCs 33g35.1.5.3.1 Definition and applicability
22、 . 33g35.1.5.3.2 Conformance requirement . 33g35.1.5.3.3 Reference . 33g35.1.5.3.4 Test purpose 33g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)5 5.1.5.3.5 Method of test 34g35.1.5.3.6 Acceptance criteria 34g35.1.5.4 Reaction of 1,8 V technology Terminals on type recognition of 3 V technology UICCs . 34
23、g35.1.5.4.1 Definition and applicability . 34g35.1.5.4.2 Conformance requirement . 34g35.1.5.4.3 Reference . 34g35.1.5.4.4 Test purpose 34g35.1.5.4.5 Method of test 35g35.1.5.4.6 Acceptance criteria 35g35.1.5.5 Void. 35g35.1.5.6 Reaction of Terminals receiving no ATR . 35g35.1.5.6.1 Reaction of Term
24、inals receiving no ATR, 3 V - 5 V . 35g35.1.5.6.2 Reaction of Terminals receiving no ATR, 1,8 V - 3 V 36g35.2 Electrical tests on each Terminal contact . 37g35.2.1 Nominal test conditions 37g35.2.2 Electrical tests on contact C1 (Card power supply - VCC). 37g35.2.2.1 Electrical tests on contact C1,
25、Test 1: 3 V - 5 V . 37g35.2.2.1.1 Definition and applicability . 37g35.2.2.1.2 Conformance requirement . 38g35.2.2.1.3 Reference . 38g35.2.2.1.4 Test purpose 38g35.2.2.1.5 Method of test 38g35.2.2.1.6 Acceptance criteria 38g35.2.2.2 Electrical tests on contact C1, Test 2: 3 V - 5 V . 38g35.2.2.2.1 D
26、efinition and applicability . 38g35.2.2.2.2 Conformance requirement . 38g35.2.2.2.3 Reference . 38g35.2.2.2.4 Test purpose 39g35.2.2.2.5 Method of test 39g35.2.2.2.6 Acceptance criteria 41g35.2.2.3 Electrical tests on contact C1, Test 1: 1,8 V - 3 V 41g35.2.2.3.1 Definition and applicability . 41g35
27、.2.2.3.2 Conformance requirement . 41g35.2.2.3.3 Reference . 41g35.2.2.3.4 Test purpose 41g35.2.2.3.5 Method of test 41g35.2.2.3.6 Acceptance criteria 42g35.2.2.4 Electrical tests on contact C1, Test 2: 1,8 V - 3 V 42g35.2.2.4.1 Definition and applicability . 42g35.2.2.4.2 Conformance requirement .
28、42g35.2.2.4.3 Reference . 42g35.2.2.4.4 Test purpose 42g35.2.2.4.5 Method of test 42g35.2.2.4.6 Acceptance criteria 43g35.2.3 Electrical tests on contact C2 (Reset - RST) . 44g35.2.3.1 Electrical tests on contact C2: 3 V - 5 V . 44g35.2.3.1.1 Definition and applicability . 44g35.2.3.1.2 Conformance
29、requirement . 44g35.2.3.1.3 Reference . 44g35.2.3.1.4 Test purpose 44g35.2.3.1.5 Method of test 44g35.2.3.1.6 Acceptance criteria 44g35.2.3.2 Electrical tests on contact C2: 1,8 V - 3 V 44g35.2.3.2.1 Definition and applicability . 44g35.2.3.2.2 Conformance requirement . 45g35.2.3.2.3 Reference . 45g
30、35.2.3.2.4 Test purpose 45g35.2.3.2.5 Method of test 45g35.2.3.2.6 Acceptance criteria 45g35.2.4 Electrical tests on contact C3 (Clock - CLK) . 45g35.2.4.1 Electrical tests on contact C3: 3 V - 5 V . 45g35.2.4.1.1 Definition and applicability . 45g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)6 5.2.4.1.2
31、 Conformance requirement . 45g35.2.4.1.3 Reference . 46g35.2.4.1.4 Test purpose 46g35.2.4.1.5 Method of test 46g35.2.4.1.6 Acceptance criteria 46g35.2.4.2 Electrical tests on contact C3: 1,8 V - 3 V 46g35.2.4.2.1 Definition and applicability . 46g35.2.4.2.2 Conformance requirement . 47g35.2.4.2.3 Re
32、ference . 47g35.2.4.2.4 Test purpose 47g35.2.4.2.5 Method of test 47g35.2.4.2.6 Acceptance criteria 47g35.2.5 Electrical tests on contact C7 (Input/Output - I/O) . 48g35.2.5.1 Electrical tests on contact C7, Test 1: 3 V - 5 V . 48g35.2.5.1.1 Definition and applicability . 48g35.2.5.1.2 Conformance r
33、equirement . 48g35.2.5.1.3 Reference . 48g35.2.5.1.4 Test purpose 48g35.2.5.1.5 Method of test 49g35.2.5.1.6 Acceptance criteria 49g35.2.5.2 Electrical tests on contact C7, Test 2: 3 V - 5 V . 49g35.2.5.2.1 Definition and applicability . 49g35.2.5.2.2 Conformance requirement . 49g35.2.5.2.3 Referenc
34、e . 50g35.2.5.2.4 Test purpose 50g35.2.5.2.5 Method of test 50g35.2.5.2.6 Acceptance criteria 50g35.2.5.3 Electrical tests on contact C7, Test 1: 1,8 V - 3 V 50g35.2.5.3.1 Definition and applicability . 50g35.2.5.3.2 Conformance requirement . 50g35.2.5.3.3 Reference . 51g35.2.5.3.4 Test purpose 51g3
35、5.2.5.3.5 Method of test 51g35.2.5.3.6 Acceptance criteria 51g35.2.5.4 Electrical tests on contact C7, Test 2: 1,8 V - 3 V 51g35.2.5.4.1 Definition and applicability . 51g35.2.5.4.2 Conformance requirement . 52g35.2.5.4.3 Reference . 52g35.2.5.4.4 Test purpose 52g35.2.5.4.5 Method of test 52g35.2.5.
36、4.6 Acceptance criteria 53g36 Initial communication tests 53g36.1 ATR 53g36.1.1 ATR characters . 53g36.1.1.1 Definition and applicability . 53g36.1.1.2 Conformance requirement. 53g36.1.1.2.0 Description 53g36.1.1.2.1 Reference . 53g36.1.1.3 Test purpose 53g36.1.1.4 Method of test . 53g36.1.1.4.1 Ini
37、tial conditions 53g36.1.1.4.2 Procedure . 54g36.1.1.5 Acceptance criteria 56g36.2 Clock stop mode with 1,8 V technology UICC 57g36.2.1 Definition and applicability 57g36.2.2 Conformance requirement 57g36.2.2.0 Description 57g36.2.2.1 Reference 57g36.2.3 Test purpose 57g36.2.4 Method of test . 57g36.
38、2.4.1 Initial conditions . 57g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)7 6.2.4.2 Procedure 57g36.2.5 Acceptance criteria . 59g36.3 Clock stop mode with 3 V technology UICC . 60g36.3.1 Definition and applicability 60g36.3.2 Conformance requirement 60g36.3.2.0 Description 60g36.3.2.1 Reference 60g36.3
39、.3 Test purpose 60g36.3.4 Method of test . 60g36.3.4.1 Initial conditions . 60g36.3.4.2 Procedure 60g36.3.5 Acceptance criteria . 62g36.4 Void 62g36.5 Speed enhancement 62g36.5.1 Definition and applicability 62g36.5.2 Conformance requirement 63g36.5.3 Test purpose 63g36.5.4 Method of test . 63g36.5.
40、4.1 Initial conditions . 63g36.5.4.2 Procedure 63g36.5.5 Acceptance criteria . 64g37 Transmission protocol tests 64g37.1 Character transmission . 64g37.1.1 Bit/character duration during the transmission from the Terminal to the UICC . 64g37.1.1.1 Definition and applicability . 64g37.1.1.2 Conformanc
41、e requirement. 64g37.1.1.2.0 Description 64g37.1.1.2.1 Reference . 64g37.1.1.3 Test purpose 65g37.1.1.4 Method of test . 65g37.1.1.4.1 Initial conditions 65g37.1.1.4.2 Procedure . 65g37.1.1.5 Acceptance criteria 65g37.1.2 Bit/character duration during the transmission from the UICC to the Terminal .
42、 65g37.1.2.1 Definition and applicability . 65g37.1.2.2 Conformance requirement. 65g37.1.2.2.0 Description 65g37.1.2.2.1 Reference . 65g37.1.2.3 Test purpose 65g37.1.2.4 Method of test . 65g37.1.2.4.1 Initial conditions 65g37.1.2.4.2 Procedure . 66g37.1.2.5 Acceptance criteria 66g37.2 T=0 protocol .
43、 66g37.2.1 Timing 66g37.2.1.1 Definition and applicability . 66g37.2.1.2 Conformance requirement. 66g37.2.1.2.0 Description 66g37.2.1.2.1 Reference . 66g37.2.1.3 Test purpose 66g37.2.1.4 Method of test . 66g37.2.1.4.1 Initial conditions 66g37.2.1.4.2 Procedure . 67g37.2.1.5 Acceptance criteria 67g37
44、.2.2 Command processing, ACK, NACK, NULL procedure bytes . 68g37.2.2.1 Definition and applicability . 68g37.2.2.2 Conformance requirement. 68g37.2.2.2.0 Description 68g37.2.2.2.1 Reference . 68g37.2.2.3 Test purpose 68g37.2.2.4 Method of test . 68g3ETSI ETSI TS 102 230-1 V11.0.0 (2016-06)8 7.2.2.4.1
45、 Initial conditions 68g37.2.2.4.2 Procedure . 68g37.2.2.5 Acceptance criteria 69g37.2.3 Case 2 command, use of procedure bytes 61xx and 6Cxx . 69g37.2.3.1 Definition and applicability . 69g37.2.3.2 Conformance requirement. 69g37.2.3.2.0 Description 69g37.2.3.2.1 Reference . 69g37.2.3.3 Test purpose
46、69g37.2.3.4 Method of test . 69g37.2.3.4.1 Initial conditions 69g37.2.3.4.2 Procedure . 69g37.2.3.5 Acceptance criteria 69g37.2.4 Case 4 command, use of procedure bytes 61xx . 70g37.2.4.1 Definition and applicability . 70g37.2.4.2 Conformance requirement. 70g37.2.4.2.0 Description 70g37.2.4.2.1 Refe
47、rence . 70g37.2.4.3 Test purpose 70g37.2.4.4 Method of test . 70g37.2.4.4.1 Initial conditions 70g37.2.4.4.2 Procedure . 70g37.2.4.5 Acceptance criteria 70g37.2.5 Command processing, warning and error status bytes 71g37.2.5.1 Definition and applicability . 71g37.2.5.2 Conformance requirement. 71g37.
48、2.5.2.0 Description 71g37.2.5.2.1 Reference . 71g37.2.5.3 Test purpose 71g37.2.5.4 Method of test . 71g37.2.5.4.1 Initial conditions 71g37.2.5.4.2 Procedure . 71g37.2.5.5 Acceptance criteria 71g37.2.6 Error correction . 71g37.2.6.1 Definition and applicability . 71g37.2.6.2 Conformance requirement.
49、72g37.2.6.2.0 Description 72g37.2.6.2.1 Reference . 72g37.2.6.3 Test purpose 72g37.2.6.4 Method of test . 72g37.2.6.4.1 Initial conditions 72g37.2.6.4.2 Procedure . 72g37.2.6.5 Acceptance criteria 72g37.2.7 Error detection 72g37.2.7.1 Definition and applicability . 72g37.2.7.2 Conformance requirement. 72g37.2.7.2.0 Description 72g37.2.7.2.1 Reference . 72g37.2.7.3 Test purpose 72g37.2.7.4 Method of test . 73g37.2.7.4.1 Initial conditions 73g37.2.7.4.2 Procedure . 73g37.2.7.5 Acceptance criteria 73g37.3 T=1 protocol . 73g37.3.1 Character Waiting Time 73g37.3.1.1 Definition
