1、 ETSI TS 102 230-2 V9.1.0 (2016-06) Smart Cards; UICC-Terminal interface; Physical, electrical and logical test specification; Part 2: UICC features (Release 9) TECHNICAL SPECIFICATION ETSI ETSI TS 102 230-2 V9.1.0 (2016-06) 2 Release 9 Reference RTS/SCP-00102230Uv910 Keywords smart card, testing ET
2、SI 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N 348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice The present document can be downloaded from: http
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6、ortStaff.aspx Copyright Notification No part may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm except as authorized by written permission of ETSI. The content of the PDF version shall not be modified without the written authoriz
7、ation of ETSI. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2016. All rights reserved. DECTTM, PLUGTESTSTM, UMTSTM and the ETSI logo are Trade Marks of ETSI registered for the benefit of its Members. 3GPPTM and LTE a
8、 re Trade Marks of ETSI registered for the benefit of its Members and of the 3GPP Organizational Partners. GSM and the GSM logo are Trade Marks registered and owned by the GSM Association. ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)3Release 9Contents Intellectual Property Rights 11 Foreword . 11 Modal v
9、erbs terminology 11 Introduction 12 1 Scope 13 2 References 13 2.1 Normative references . 13 2.2 Informative references 14 3 Definitions, symbols and abbreviations . 15 3.1 Definitions 15 3.2 Symbols 17 3.3 Abbreviations . 17 3.4 Formats . 18 3.4.1 Format of the table of optional features 18 3.4.2 F
10、ormat of the applicability table . 19 3.4.3 Status and Notations . 19 3.4.4 Numbers and Strings . 19 4 Test environment 20 4.1 Table of optional features . 20 4.2 Applicability table 21 4.3 Information provided by the device supplier 23 4.4 Test equipment . 23 4.4.1 Overview 23 4.4.2 Measurement/set
11、ting uncertainties 24 4.4.2.1 Vcc24 4.4.2.2 RST . 24 4.4.2.3 CLK. 24 4.4.2.4 I/O . 24 4.4.3 Precision force-inducing contacting device 24 4.4.4 Temperature controllable environment . 25 4.4.5 Temperature measuring device . 25 4.4.6 Voltage measuring device. 25 4.4.7 Precision measuring device. 25 4.
12、4.8 Current measuring device . 25 4.4.9 Timing Measurements on contact I/O . 25 4.4.10 Default conditions for DUT operation 26 4.5 Test execution 26 4.5.1 Parameter variations . 26 4.5.2 Required application . 26 4.5.2.1 Application requirements 26 4.5.2.2 Required application files . 26 4.5.2.2.1 R
13、equirements for file creation and update . 26 4.5.2.2.2 EFTRANS16b. 27 4.5.2.2.3 EFLF4R20b. 27 4.5.2.2.4 EFLF4R10b. 28 4.5.2.2.5 EFCYC4R3b. 28 4.5.2.2.6 DF on ADF (Application DF) level . 29 4.5.2.2.7 EFSUBTRANS. 29 4.5.2.2.8 EFSUBLF30 4.5.2.2.9 EFSUBCYC30 4.6 Pass criterion 31 ETSI ETSI TS 102 230-
14、2 V9.1.0 (2016-06)4Release 95 Conformance Requirements . 31 5.1 Conformance requirement naming . 31 5.2 Physical characteristics . 31 5.3 Electrical specifications of the UICC - Terminal interface 32 5.4 Initial communication establishment procedures . 33 5.5 Transmission protocols . 34 5.6 Applicat
15、ion and file structure . 39 5.7 Security features . 43 5.8 Structure of commands and responses 45 5.9 Commands 46 5.10 Transmission oriented commands 54 5.11 Application independent files . 54 5.12 Application independent protocol 54 5.13 Support of APDU-based UICC applications over USB . 55 6 Test
16、cases 55 6.1 Introduction 55 6.2 Physical characteristic tests 56 6.2.1 Dimensions of the UICC card . 56 6.2.1.1 Test execution . 56 6.2.1.2 Initial conditions . 56 6.2.1.3 Test procedure . 56 6.2.2 Temperature range for card operation . 56 6.2.2.1 Test execution . 56 6.2.2.2 Initial conditions . 56
17、 6.2.2.3 Test procedure 1 57 6.2.2.4 Test procedure 2 57 6.3 Electrical specifications of the UICC - Terminal interface 57 6.3.1 Supply voltage Vcc(contact C1) 57 6.3.1.1 Vcc- Voltage limits 57 6.3.1.1.1 Test execution 57 6.3.1.1.2 Initial conditions 57 6.3.1.1.3 Test procedure . 58 6.3.1.2 Vcc- Idl
18、e current limits 58 6.3.1.2.1 Test execution 58 6.3.1.2.2 Initial conditions 58 6.3.1.2.3 Test procedure . 58 6.3.1.3 Vcc- Current limits in clock-stop-mode . 58 6.3.1.3.1 Test execution 58 6.3.1.3.2 Initial conditions 58 6.3.1.3.3 Test procedure . 59 6.3.2 Reset RST (contact C2) 59 6.3.2.1 RST - St
19、atic operation . 59 6.3.2.1.1 Test execution 59 6.3.2.1.2 Initial conditions 59 6.3.2.2 Test procedure . 59 6.3.3 Programming voltage Vpp (contact C6) . 59 6.3.3.1 Vpp - Static operation . 59 6.3.3.1.1 Test execution 59 6.3.3.1.2 Initial conditions 59 6.3.3.1.3 Test procedure 1 60 6.3.3.1.4 Test pro
20、cedure 2 60 6.3.4 Clock CLK (contact C3) . 60 6.3.4.1 Frequency and duty cycle 60 6.3.4.1.1 Test execution 60 6.3.4.1.2 Initial conditions 60 6.3.4.1.3 Test procedure . 61 6.3.4.2 Voltage and current . 61 6.3.4.2.1 Test execution 61 6.3.4.2.2 Initial conditions 61 6.3.4.2.3 Test procedure . 62 ETSI
21、ETSI TS 102 230-2 V9.1.0 (2016-06)5Release 96.3.5 I/O (contact C7) 62 6.3.5.1 Voltage and current . 62 6.3.5.1.1 Test execution 62 6.3.5.1.2 Initial conditions 62 6.3.5.1.3 Test procedure 1 63 6.3.5.1.4 Test procedure 2 63 6.3.5.1.5 Test procedure 3 64 6.4 Initial communication establishment procedu
22、re . 64 6.4.1 Supply voltage switching 64 6.4.1.1 Supply voltage classes. 64 6.4.1.2 Power consumption of the UICC during ATR 64 6.4.1.2.1 Test execution 64 6.4.1.2.2 Initial conditions 64 6.4.1.2.3 Test procedure . 65 6.4.1.3 Application related electrical parameters 65 6.4.1.3.1 Test execution 65
23、6.4.1.3.2 Initial conditions 65 6.4.1.3.3 Test procedure . 65 6.4.2 ATR content 65 6.4.2.1 ATR - Major capabilities 65 6.4.2.1.1 Test execution 65 6.4.2.1.2 Initial conditions 65 6.4.2.1.3 Test procedure . 66 6.4.2.2 ATR - Speed enhancement 66 6.4.2.2.1 Test execution 66 6.4.2.2.2 Initial conditions
24、 66 6.4.2.2.3 Test procedure . 66 6.4.2.3 Global Interface bytes . 66 6.4.2.3.1 Test execution 66 6.4.2.3.2 Initial conditions 66 6.4.2.3.3 Test procedure . 67 6.4.3 PPS procedure . 67 6.4.3.1 Test execution . 67 6.4.3.2 Initial conditions . 67 6.4.3.3 Test procedure . 67 6.4.4 Reset procedures . 67
25、 6.4.4.1 Test execution . 67 6.4.4.2 Initial conditions . 67 6.4.4.3 Test procedure 1 68 6.4.4.4 Test procedure 2 68 6.4.4.5 Test procedure 3 68 6.4.4.6 Test procedure 4 68 6.4.5 Clock stop mode . 69 6.4.5.1 Test execution . 69 6.4.5.2 Initial conditions . 69 6.4.5.3 Test procedure . 69 6.4.6 Bit/ch
26、aracter duration and sampling time . 69 6.4.7 Error handling . 69 6.4.7.1 Test execution . 69 6.4.7.2 Initial conditions . 69 6.4.7.3 Test procedure . 69 6.4.8 Compatibility 70 6.4.8.1 Test execution . 70 6.5 Transmission Protocols 70 6.5.1 Physical Layer 70 6.5.1.1 Test execution . 70 6.5.2 Data Li
27、nk Layer 70 6.5.2.1 Character Frame 70 6.5.2.1.1 Test execution 70 6.5.2.1.2 Initial conditions 70 6.5.2.1.3 Test procedure . 70 6.5.2.2 Transmission Protocol T = 0 . 72 ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)6Release 96.5.2.2.1 Test execution 72 6.5.2.2.2 Initial conditions 72 6.5.2.2.3 Test proced
28、ure . 72 6.5.2.3 Transmission Protocol T = 1 . 73 6.5.2.3.1 Timing and specific options for blocks sent with T = 1 73 6.5.2.3.2 Block frame structure 75 6.5.2.3.3 Error free operation . 77 6.5.2.3.4 Error Handling for T = 1 . 77 6.5.2.3.5 Chaining 79 6.5.3 Transport Layer 80 6.5.3.1 Transportation o
29、f an APDU using T = 0 . 80 6.5.3.1.1 Purpose 80 6.5.3.1.2 Case 1 command 80 6.5.3.1.3 Case 2 command 81 6.5.3.1.4 Case 3 81 6.5.3.1.5 Case 4 82 6.5.3.1.6 Use of Procedure Bytes 61xx and 6Cxx . 83 6.5.3.2 Transportation of an APDU using T = 1 . 84 6.5.3.2.1 Purpose 84 6.5.3.2.2 Case 1 84 6.5.3.2.3 Ca
30、se 2 84 6.5.3.2.4 Case 3 85 6.5.3.2.5 Case 4 85 6.5.4 Application Layer . 86 6.6 Application and File structure 86 6.6.1 Purpose . 86 6.6.2 UICC Application structure 86 6.6.2.1 Test execution . 86 6.6.2.2 Initial conditions . 86 6.6.2.3 Test procedure . 86 6.6.3 File types. 87 6.6.3.1 Dedicated fil
31、es . 87 6.6.3.2 Elementary files 87 6.6.3.2.1 Introduction . 87 6.6.3.2.2 Transparent EF 87 6.6.3.2.3 Linear fixed EF 87 6.6.3.2.4 Cyclic EF . 88 6.6.3.2.5 BER-TLV structure EF 90 6.6.4 File referencing . 90 6.6.5 Methods for selecting a file. 90 6.6.5.1 SELECT by File Identifier Referencing 90 6.6.
32、5.1.1 Test execution 90 6.6.5.1.2 Initial conditions 90 6.6.5.1.3 Test procedure . 90 6.6.5.2 SELECT by Path Referencing. 91 6.6.5.2.1 Test execution 91 6.6.5.2.2 Initial conditions 91 6.6.5.2.3 Test procedure . 91 6.6.5.3 Short File Identifier . 91 6.6.5.3.1 Test execution 91 6.6.5.3.2 Initial cond
33、itions 91 6.6.5.3.3 Test procedure . 91 6.6.6 Application characteristic . 92 6.6.6.1 Explicit Application selection . 92 6.6.6.1.1 SELECT by DF Name . 92 6.6.6.1.2 SELECT by partial DF Name 92 6.6.6.2 Application session activation . 93 6.6.6.2.1 Test execution 93 6.6.6.2.2 Initial conditions 93 6.
34、6.6.2.3 Test procedure . 94 6.6.6.3 Application session termination 94 6.6.6.3.1 Test execution 94 ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)7Release 96.6.6.3.2 Initial conditions 94 6.6.6.3.3 Test procedure 1 94 6.6.6.3.4 Test procedure 2 94 6.6.6.3.5 Test procedure 3 95 6.6.6.3.6 Test procedure 4 95
35、6.6.6.3.7 Test procedure 5 95 6.6.6.4 Application session reset . 95 6.6.6.4.1 Test execution 95 6.6.6.4.2 Initial conditions 96 6.6.6.4.3 Test procedure . 96 6.6.7 Reservation of file IDs 96 6.6.7.1 Test execution . 96 6.6.7.2 Initial conditions . 96 6.6.7.3 Test procedure 1 96 6.6.7.4 Test procedu
36、re 2 96 6.6.7.5 Test procedure 3 97 6.6.8 Logical channels . 97 6.6.8.1 No Logical Channel Support . 97 6.6.8.1.1 Test execution 97 6.6.8.1.2 Initial conditions 97 6.6.8.1.3 Test procedure . 97 6.6.8.2 Logical Channels - Basic Behaviour . 97 6.6.8.2.1 Test execution 97 6.6.8.2.2 Initial conditions 9
37、7 6.6.8.2.3 Test procedure 1 98 6.6.8.2.4 Test procedure 2 98 6.6.8.3 Opening a Logical Channel from the Basic Channel 99 6.6.8.3.1 Test execution 99 6.6.8.3.2 Initial conditions 99 6.6.8.3.3 Test procedure . 99 6.6.8.4 Opening a Logical Channel from a Non-Basic Channel . 99 6.6.8.4.1 Test execution
38、 99 6.6.8.4.2 Initial conditions 99 6.6.8.4.3 Test procedure . 99 6.6.8.5 Opening a Logical Channel on Non-Shareable Files 100 6.6.8.5.1 Test execution 100 6.6.8.5.2 Initial conditions 100 6.6.8.5.3 Test procedure . 100 6.6.8.6 Logical Channels and Shareable Files. 100 6.6.8.6.1 Test execution 100 6
39、.6.8.6.2 Initial conditions 101 6.6.8.6.3 Test procedure 1- (non-shareable files) . 101 6.6.8.6.4 Test procedure 2 - (shareable files) . 101 6.6.8.7 Command Interdependencies 102 6.6.8.7.1 Test execution 102 6.6.8.7.2 Initial conditions 102 6.6.8.7.3 Test procedure . 102 6.6.8.8 Consistency of File
40、Updates 103 6.6.8.8.1 Test execution 103 6.6.8.8.2 Initial conditions 103 6.6.8.8.3 Test procedure . 103 6.7 Security features . 104 6.7.1 Foreword . 104 6.7.2 Supported security features . 104 6.7.2.1 Test execution . 104 6.7.2.2 Initial conditions . 104 6.7.2.3 Test procedure 1 105 6.7.2.4 Test pr
41、ocedure 2 105 6.7.3 Security architecture . 105 6.7.3.1 Test execution . 105 6.7.3.2 Initial conditions . 105 6.7.3.3 Test procedure 1 105 ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)8Release 96.7.3.4 Test procedure 2 106 6.7.4 Security environment 106 6.7.4.1 Test execution . 106 6.7.4.2 Initial conditi
42、ons . 106 6.7.4.3 Test procedure . 106 6.7.5 PIN definitions 108 6.7.5.1 Test execution . 108 6.7.5.2 Initial conditions . 108 6.7.5.3 Test procedure 1 108 6.7.5.4 Test procedure 2 108 6.7.5.5 Test procedure 3 109 6.7.6 PIN and key reference relationship . 109 6.7.6.1 Test execution . 109 6.7.6.2 In
43、itial conditions . 109 6.7.6.3 Test procedure 1 109 6.7.6.4 Test procedure 2 111 6.8 Structure of commands and responses 112 6.8.1 Purpose . 112 6.8.2 Mapping principles . 112 6.8.2.1 Test execution . 112 6.8.2.2 Initial conditions . 112 6.8.2.3 Test procedure . 112 6.8.3 Response APDU Structure 113
44、 6.8.3.1 Status Conditions Returned by the UICC 113 6.8.3.1.1 Test execution 113 6.8.3.1.2 Initial conditions 113 6.8.3.1.3 Test procedure . 113 6.9 Commands 114 6.9.1 Generic Commands. 114 6.9.1.1 SELECT 114 6.9.1.1.1 Test execution 114 6.9.1.1.2 Initial conditions 114 6.9.1.1.3 Test procedure 1 11
45、5 6.9.1.1.4 Test procedure 2 116 6.9.1.2 STATUS . 116 6.9.1.2.1 Test execution 116 6.9.1.2.2 Initial conditions 116 6.9.1.2.3 Test procedure . 117 6.9.1.3 READ BINARY . 118 6.9.1.3.1 Test execution 118 6.9.1.3.2 Initial conditions 118 6.9.1.3.3 Test procedure . 118 6.9.1.4 UPDATE BINARY. 119 6.9.1.4
46、.1 Test execution 119 6.9.1.4.2 Method of test Initial conditions 119 6.9.1.4.3 Test procedure . 119 6.9.1.5 READ RECORD. 120 6.9.1.5.1 Test execution 120 6.9.1.5.2 Initial conditions 120 6.9.1.5.3 Test procedure 1 (CURRENT and ABSOLUTE mode) 120 6.9.1.5.4 Test procedure 2 (NEXT and PREVIOUS mode) .
47、 121 6.9.1.5.5 Test procedure 3 (SFI referencing) 122 6.9.1.6 UPDATE RECORD 122 6.9.1.6.1 Test execution 122 6.9.1.6.2 Initial conditions 122 6.9.1.6.3 Test procedure 1 (CURRENT and ABSOLUTE mode) 123 6.9.1.6.4 Test procedure 2 (NEXT and PREVIOUS mode) . 124 6.9.1.6.5 Test procedure 3 (SFI referenci
48、ng) 125 6.9.1.7 SEARCH RECORD 125 6.9.1.7.1 Test execution 125 6.9.1.7.2 Initial condition . 125 6.9.1.7.3 Test procedure 1 (simple search) . 125 ETSI ETSI TS 102 230-2 V9.1.0 (2016-06)9Release 96.9.1.7.4 Test procedure 2 (enhanced search) 126 6.9.1.7.5 Test procedure 3 (SFI) . 129 6.9.1.7.6 Test pr
49、ocedure 4 (Only applicable for T=1 protocol) 130 6.9.1.8 INCREASE . 130 6.9.1.8.1 Test execution 130 6.9.1.8.2 Initial condition . 130 6.9.1.8.3 Test procedure . 130 6.9.1.9 VERIFY PIN . 131 6.9.1.9.1 Test execution 131 6.9.1.9.2 Initial conditions 131 6.9.1.9.3 Test procedure 1 131 6.9.1.9.4 Test procedure 2 132 6.9.1.9.5 Test procedure 3 133 6.9.1.10 CHANGE PIN . 133 6.9.1.10.1 Test execution 133 6.9.1.10.2 Initial conditions 133 6.9.1.10.3 Test procedure 1 133 6.9.1.10.4 Test procedure 2 134 6.9.1.11 DISABLE PIN 134 6.9.1.11.1 Test execution 134 6.9.1.11.2 Initial condit
