1、 ETSI TS 102 346 V1.1.1 (2004-08)Technical Specification NFCIP-1;RF interface test methodsETSI ETSI TS 102 346 V1.1.1 (2004-08) 2 Reference DTS/ECMA-00291 Keywords NCF, testing ETSI 650 Route des Lucioles F-06921 Sophia Antipolis Cedex - FRANCE Tel.: +33 4 92 94 42 00 Fax: +33 4 93 65 47 16 Siret N
2、348 623 562 00017 - NAF 742 C Association but non lucratif enregistre la Sous-Prfecture de Grasse (06) N 7803/88 Important notice Individual copies of the present document can be downloaded from: http:/www.etsi.org The present document may be made available in more than one electronic version or in
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5、 to: editoretsi.org Copyright Notification No part may be reproduced except as authorized by written permission. The copyright and the foregoing restriction extend to reproduction in all media. European Telecommunications Standards Institute 2004. All rights reserved. DECTTM, PLUGTESTSTM and UMTSTM
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7、I TS 102 346 V1.1.1 (2004-08) 3 Contents Intellectual Property Rights5 Foreword.5 1 Scope 6 2 Conformance 6 3 References 6 4 Conventions and notations .6 4.1 Representation of numbers.6 4.2 Names.6 4.3 Test report 6 5 Abbreviations and acronyms7 6 Default items applicable to the test methods7 6.1 Te
8、st environment7 6.2 Default tolerance 7 6.3 Spurious Inductance .7 6.4 Total measurement uncertainty 8 7 Test Set-up and test circuits8 7.1 Calibration coil.8 7.1.1 Size of the calibration coil 8 7.1.2 Thickness and material of the calibration coil PCB8 7.1.3 Coil characteristics8 7.2 Test assembly
9、.9 7.2.1 Field generating antenna.10 7.2.2 Sense coils 10 7.2.3 Arrangement of the test assembly.10 7.3 Reference devices.11 7.3.1 Initiator power 11 7.3.2 Load modulation.11 7.3.3 Dimensions of the reference device11 7.3.4 Thickness of the reference device PCB 11 7.3.5 Coil characteristics11 7.4 Di
10、gital sampling oscilloscope.12 8 Functional Test - Target .12 8.1 Target RF Level Detection .12 8.1.1 Purpose .12 8.1.2 Test procedure 12 8.1.3 Test report.13 8.2 Target passive Communication mode 13 8.2.1 Purpose .13 8.2.2 Test procedure 13 8.2.2.1 Test procedure for 106 kbit/s 13 8.2.2.2 Test repo
11、rt at 106 kbit/s.13 8.2.2.3 Test procedure for 212 kbit/s and 424 kbit/s.13 8.2.2.4 Test report at 212 kbit/s and 424 kbit/s .14 8.3 Target active Communication mode.14 8.3.1 Purpose .14 8.3.2 Test procedure 14 8.3.3 Test report.14 9 Functional Test - Initiator.15 9.1 Initiator field strength in act
12、ive and passive Communication mode.15 9.1.1 Purpose .15 9.1.2 Test procedure 15 ETSI ETSI TS 102 346 V1.1.1 (2004-08) 4 9.1.3 Test report.15 9.2 Initiator modulation index and waveform in active and passive Communication mode16 9.2.1 Purpose .16 9.2.2 Test procedure 16 9.2.3 Test report.16 9.2.4 Ini
13、tiator load modulation reception in passive Communication mode16 Annex A (normative): Field generating antenna.17 A.1 Field generating antenna layout including impedance matching circuit 17 A.2 Impedance matching network 18 Annex B (normative): Sense coil.20 B.1 Sense coil layout.20 B.2 Sense coil a
14、ssembly21 Annex C (normative): Reference device for Initiator power test.22 C.1 Circuit diagram for reference device22 Annex D (normative): Test report template 23 Annex E (informative): Load modulation test.25 E.1 Load modulation test25 E.2 Reference device for load modulation test .25 Annex F (inf
15、ormative): Program for evaluation of the spectrum27 History 32 ETSI ETSI TS 102 346 V1.1.1 (2004-08) 5 Intellectual Property Rights IPRs essential or potentially essential to the present document may have been declared to ETSI. The information pertaining to these essential IPRs, if any, is publicly
16、available for ETSI members and non-members, and can be found in ETSI SR 000 314: “Intellectual Property Rights (IPRs); Essential, or potentially Essential, IPRs notified to ETSI in respect of ETSI standards“, which is available from the ETSI Secretariat. Latest updates are available on the ETSI Web
17、server (http:/webapp.etsi.org/IPR/home.asp). Pursuant to the ETSI IPR Policy, no investigation, including IPR searches, has been carried out by ETSI. No guarantee can be given as to the existence of other IPRs not referenced in ETSI SR 000 314 (or the updates on the ETSI Web server) which are, or ma
18、y be, or may become, essential to the present document. Foreword This Technical Specification (TS) has been produced by ECMA on behalf of its members and those of the European Telecommunications Standards Institute (ETSI). In 2002, ECMA International formed Task Group 19 of Technical Committee 32 to
19、 specify Near Field Communication (NFC) signal interfaces and protocols. The NFC devices are wireless closely coupled devices communicating at 13,56 MHz. The General Assembly of December 2002 adopted Near Field Communication Interface and Protocol-1 (NFCIP-1) as standard ECMA-340. This test standard
20、, the first of two parts, specifies compliance tests for the RF interface of ECMA-340 devices. The companion test standard specifies protocol tests for ECMA-340. ETSI ETSI TS 102 346 V1.1.1 (2004-08) 6 1 Scope The present document is part of a suite of ECMA standards that specify tests for ECMA-340.
21、 It defines test methods for the RF-interface. The present document specifies RF-test methods for NFC devices with antennas fitting within the rectangular area of 85 mm by 54 mm. 2 Conformance A system implementing ECMA-340 shall be in conformance with this ECMA Standard if it meets all the mandator
22、y requirements specified herein. 3 References The following are normative references for the purpose of the present document: Referenced documents which are not found to be publicly available in the expected location might be found at http:/docbox.etsi.org/Reference. 1 ECMA-340: “Near Field Communic
23、ation - Interface and Protocol (NFCIP-1)“. 2 “ISO Guide to the expression of uncertainty in measurement“ (1993). 4 Conventions and notations 4.1 Representation of numbers The following conventions and notations apply in the present document unless otherwise stated: - Letters and digits in parenthese
24、s represent numbers in hexadecimal notation. - The value of a bit is denoted by ZERO or ONE. - Numbers in binary notation and bit patterns are represented by strings of digits 0 and 1 shown with the most significant bit to the left. Within such strings, X may be used to indicate that the value of a
25、bit is not specified within the string. 4.2 Names The names of basic elements, e.g. specific fields, are written with a capital initial letter. 4.3 Test report The test report Includes the number of passed tests versus the total number of tests, the number of different samples and the date of the te
26、sts, see annex D. ETSI ETSI TS 102 346 V1.1.1 (2004-08) 7 5 Abbreviations and acronyms ar Reference device width br Reference device heightch Calibration coil height cr Calibration coil corner radius cw Calibration coil width DFT Discrete Fourier Transformation dis Distance between field generating
27、antenna and sense coils DUT Device under test fc Frequency of the operating field fs Frequency of subcarrier at 106 kbit/s in passive communication mode HmaxMaximum field strength of the Initiator antenna field HminMinimum field strength of the Initiator antenna field HThreshold Minimum field streng
28、th for the RF level detector LCalcoil Inductance of the calibration coil LRefcoilInductance of the reference device lx Length of test assembly connection cable lya Field generating and sense coil PCB width lyb Field generating and sense coil PCB height lyd Field generating coil diameter lyw Field ge
29、nerating coil track width nr Number of turns of reference device oh Calibration coil outline height ow Calibration coil outline width PCB Printed Circuit Board RCalcoil Resistance of the calibration coil RRefcoilResistance of the reference device rs Sense coil corner radius sa Sense coil width sb Se
30、nse coil heightsr Reference device track spacing wr Reference device track width 6 Default items applicable to the test methods 6.1 Test environment Unless otherwise specified, testing shall take place in an environment of temperature 23C 3C (73F 5F) and of relative humidity 40 % to 60 %. 6.2 Defaul
31、t tolerance Unless otherwise specified, a tolerance of 5 % shall be applied to the values given to specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment adjustments). 6.3 Spurious Inductance Resistors and capacitors shall have
32、negligible inductance. ETSI ETSI TS 102 346 V1.1.1 (2004-08) 8 6.4 Total measurement uncertainty The measurement uncertainty shall be recorded. NOTE: Basic information is given in “ISO Guide to the Expression of Uncertainty in Measurement“. 7 Test Set-up and test circuits The test set-up includes: -
33、 calibration coil; - test assembly; - reference devices; - digital sampling oscilloscope. These are described in the following clauses. This test set-up applies to NFCIP-1 devices with antennas fitting within the rectangular area of 85 mm by 54 mm. 7.1 Calibration coil This clause defines the size,
34、thickness and characteristics of the calibration coil. 7.1.1 Size of the calibration coil The calibration coil shall be integrated in a PCB that consists of an area, which has the height and width defined in table 1 containing a single turn coil concentric with the calibration coil outline. Figure 1
35、 illustrates the calibration coil. Coil cw x ch 1 turnConnectionsOutline ow x ohCoil corner radius crFigure 1: Calibration coil 7.1.2 Thickness and material of the calibration coil PCB The thickness of the calibration coil PCB shall be 0,76 mm 10 %. It shall be constructed of a suitable insulating m
36、aterial. 7.1.3 Coil characteristics The coil shall have one turn. The outer size of the coil shall have a corner radius cr as defined in table 1. The coil is made as a printed coil on a PCB plated with 35 m copper. Track width shall be 500 m 20 %. The size of the connection pads shall be 1,5 mm by 1
37、,5 mm. ETSI ETSI TS 102 346 V1.1.1 (2004-08) 9 Table 1: Definition of calibration coil Name Symbol Value Outline width ow 85 mm (2 %) Outline height oh 54 mm (2 %) Coil width cw 72 mm (2 %) Coil height ch 42 mm (2 %) Coil corner radius cr 5 mm (2 %) NOTE 1: At 13,56 MHz the approximate inductance LC
38、alcoilis 250 nH and the approximate resistance is RCalcoil0,4 . A high impedance oscilloscope probe (e.g. 1 M, #include #include #include #define MAX_SAMPLES 5000 float pi; /* pi=3.14 */ ETSI ETSI TS 102 346 V1.1.1 (2004-08) 28/* Array for time and sense coil voltage vd*/ float vtimeMAX_SAMPLES; /*
39、time array */ float vdMAX_SAMPLES; /* Array for different coil voltage */ /*/ /* Read CSV File Function */ /* */ /* Description: */ /* This function reads the table of time and sense coil */ /* voltage from a File in CSV Format */ /* */ /* Input: filename */ /* */ /* Return: Number of samples (sampl
40、e Count) */ /* 0 if an error occurred */ /* */ /* Displays Statistics: */ /* */ /* Filename, SampleCount, Sample rate, Max/Min Voltage */ /*/ int readcsv(char* fname) float a,b; float max_vd,min_vd; int i; FILE *sample_file; /* Open File */ if (!strchr(fname, .) strcat(fname, “.csv“); if (sample_fil
41、e = fopen(fname, “r“) = NULL) printf(“Cannot open input file %s.n“,fname); return 0; /*/ /* Read CSV File */ /*/ max_vd=-1e-9F; min_vd=-max_vd; i=0; while (!feof(sample_file) if (i=MAX_SAMPLES) printf(“Warning: File truncated !n“); printf(“To much samples in file %sbn“,fname); break; fscanf(sample_f
42、ile,“%f,%fn“, vtimei = a; vdi = b; if (vdimax_vd) max_vd=vdi; if (vdimin_vd) min_vd=vdi; i+; fclose(sample_file); ETSI ETSI TS 102 346 V1.1.1 (2004-08) 29/* Displays Statistics */ printf(“n*n“); printf(“nStatistics: n“); printf(“ Filename : %sn“,fname); printf(“ Sample count: %dn“,i); printf(“ Sampl
43、e rate : %1.0f MHzn“,1e-6/(vtime1-vtime0); printf(“ Max(vd) : %4.0f mVn“,max_vd*1000); printf(“ Min(vd) : %4.0f mVn“,min_vd*1000); return i; /* End ReadCsv */ /*/ /* DFT: Discrete Fourier Transform */ /*/ /* Description: */ /* This function calculate the Fourier coefficient */ /* */ /* Input: Number
44、 of samples */ /* Global Variables: */ /* */ /* Displays Results: */ /* */ /* Carrier coefficient */ /* Upper sideband coefficient */ /* Lower sideband coefficient */ /* */ /*/ void dft(int count) float c0_real,c0_imag,c0_abs,c0_phase; float c1_real,c1_imag,c1_abs,c1_phase; float c2_real,c2_imag,c2_
45、abs,c2_phase; int N_data,center,start,end; float w0,wu,wl; int i; w0=(float)(13.56e6*2.0)*pi; /* carrier 13.56 MHz */ wu=(float)(1.0+1.0/16)*w0; /* upper sideband 14.41 MHz */ wl=(float)(1.0-1.0/16)*w0; /* lower sideband 12.71 MHz */ c0_real=0; /* real part of the carrier fourier coefficient */ c0_imag=0; /* imag part of the carrier fourier coefficient */ c1_real=0; /* real part of the up. sideband fourier coefficient */ c1_imag=0; /* imag part of the up. sideband fourier coefficien
