KS C IEC 60749-32-2006 Semiconductor devices-Mechanical and climatic test methods-Part 32:Flammability of plastic-encapsulated devices(externally induced)《半导体器件 机械和气候试验方法 第32部分 塑料密.pdf

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1、 KSKSKSKS SKSKSKS KSKSKS SKSKS KSKS SKS KS 2006 11 30 http:/www.kats.go.krKS C IEC 6074932 32: ( )KS C IEC 60749 32: 2006 (2011 )C IEC 60749 32: 2006 : ( ) ( ) ( ) ( ) : (http:/www.standard.go.kr) : : 2006 11 30 : 2011 12 13 2011-0563 : : ( 02-509-7294) (http:/www.kats.go.kr). 10 5 , . ICS 31.080.01

2、 KS C IEC 32: ( ) 60749 32: 2006(2011 ) Semiconductor devices Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices(externally induced) 2002 1 IEC 60749 32 Semiconductor devices Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated de

3、vices(externally induced) . 1. ( ) . . . 2. . . KS C IEC 60695 2 2: 2002 2: 2: 3. . a) : b) : 3, c) : KS C IEC 60695 2 2 1 b) d) , KS C IEC 60695 2 2 1 b) e) : , KS C IEC 60695 2 2 4. f) (ta): 10 s g) : 10 s h) : . 32 : ( ) 153787 1 92 3(13) (02)26240114 (02)2624 0148 9 http:/ KSKSKSSKSKS KSKS SKS KSKS SKSKS KSKSKSKS C IEC 60749 32: 2006 Semiconductor devicesMechanicaland climatic test methodsPart 32:Flammability of plastic encapsulateddevices(externally induced)ICS 31.080.01 Korean Agency for Technology and Standards http:/www.kats.go.kr

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