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2、 KS C IEC 32: ( ) 60749 32: 2006(2011 ) Semiconductor devices Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated devices(externally induced) 2002 1 IEC 60749 32 Semiconductor devices Mechanical and climatic test methods Part 32: Flammability of plastic-encapsulated de
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