1、Comments, suggestions, or questions on this document should be addressed to: Commander, Naval Sea Systems Command, ATTN: SEA 05Q, 1333 Isaac Hull Avenue, SE, Stop 5160, Washington Navy Yard DC 20376-5160 or emailed to CommandStandardsnavy.mil, with the subject line “Document Comment”. Since contact
2、information can change, you may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil. AMSC N/A FSC 5925 INCH-POUND MIL-DTL-17361G(SH) 19 September 2006 SUPERSEDING MIL-C-17361F(SH) 10 March 1989 DETAIL SPECIFICATION CIRCUIT BREAKER TYP
3、ES AQB/NQB, AIR, ELECTRIC, LOW VOLTAGE, INSULATED HOUSING (SHIPBOARD USE), GENERAL SPECIFICATION FOR Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) i CONTENTS PARAGRAPH PAGE 1. SCOPE1 1.1 Scope.1 1.2 Classification.1 2. APPLICABLE
4、 DOCUMENTS 1 2.1 General1 2.2 Government documents 1 2.2.1 Specifications, standards, and handbooks 1 2.2.2 Other Government documents, drawings, and publications.2 2.3 Non-Government publications2 2.4 Order of precedence3 3. REQUIREMENTS .3 3.1 Specification sheets.3 3.2 Qualification .3 3.3 Drawin
5、gs.3 3.4. General performance requirements 3 3.4.1 Creepage and clearance distances 3 3.4.2 Insulation3 3.4.3 Endurance/manual cycling .4 3.4.4 Calibration4 3.4.5 Inclination 4 3.4.6 Temperature rise.4 3.4.7 Interrupting performance4 3.4.8 Shock4 3.4.9 Vibration 4 3.4.10 Electromagnetic interference
6、 (EMI).4 3.4.11 Voltage-spike .4 3.5 Design, construction, and additional performance requirements 4 3.5.1 Recycled, recovered, or environmentally preferable materials 4 3.5.2 Safety4 3.5.2.1 Polyvinyl chloride (PVC) 4 3.5.3 Type NQB circuit breakers.4 3.5.4 Ambient temperature operating range 4 3.5
7、.5 Special tools .5 3.5.6 Dimensions (standardized).5 3.5.7 Position.5 3.5.8 Current carrying connections .5 3.5.9 Arc chamber .5 3.5.10 Transformers 5 3.5.11 Thermoplastic parts 5 3.5.12 Painting 5 3.5.13 Operating handle 5 3.5.14 Insulation5 3.5.14.1 Material5 3.5.14.1.1 Circuit breaker and fuse u
8、nit housing .5 3.5.14.1.2 Mounting base/block.5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) ii PARAGRAPH PAGE 3.5.14.2 Dielectric strength5 3.5.14.2.1 Application points on circuit breaker mounting base/block terminals and grou
9、nd.5 3.5.14.2.2 Application points on attachment leads, circuit breaker mounting base/block terminals, and ground.6 3.5.14.3 Insulation resistance 6 3.5.14.4 Temperature rise6 3.5.15 Operating mechanism/closing and opening6 3.5.15.1 Mechanism 6 3.5.15.2 Simultaneous operation .6 3.5.15.3 Trip free.6
10、 3.5.15.4 Manual closing and opening6 3.5.16 Overcurrent protection tripping devices.6 3.5.16.1 Thermal magnetic trip devices.7 3.5.16.1.1 Long-time delay trip element7 3.5.16.1.2 Instantaneous trip device.7 3.5.16.2 Electronic trip devices .7 3.5.16.2.1 Long-time delay trip element7 3.5.16.2.2 Long
11、-time thermal memory 7 3.5.16.2.3 Instantaneous trip device.7 3.5.16.2.4 Short-time delay trip element7 3.5.17 Current limiting devices .7 3.5.17.1 Current limiting fuses 7 3.5.17.1.1 Function of current limiting fuses.7 3.5.17.1.2 Fused circuit breaker characteristics .7 3.5.17.2 Current limiting f
12、use units.8 3.5.17.2.1 Function of current limiting fuse units8 3.5.17.2.2 Current limiting fuse unit characteristics 8 3.5.17.3 Integral (fuseless) current limiting devices8 3.5.18 Mounting bases/blocks, mounting arrangements, and circuit breaker/mounting base/block interface connections.8 3.5.18.1
13、 Mounting base/block .8 3.5.18.2 Mounting arrangements (circuit breakers and fuse units)9 3.5.18.3 Circuit breaker/mounting base/block interface connections and mounting base/block stud terminals .9 3.5.18.4 Temperature rise9 3.5.19 Attachments9 3.5.19.1 Temperature rise9 3.5.19.2 Endurance9 3.5.19.
14、3 Electric operating mechanism9 3.5.19.4 Undervoltage release devices.11 3.5.19.4.1 Time delay 12 3.5.19.5 Shunt trip (see 6.4.25)12 3.5.19.6 Auxiliary switches .12 3.5.19.7 Handle locking device .12 3.5.19.8 Handle boot .12 3.5.20 Semiconductor devices.13 3.5.20.1 Electrostatic discharge susceptibl
15、e items.13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) iii PARAGRAPH PAGE 3.5.20.2 Conformal coating .13 3.5.20.3 Sockets.13 3.5.21 Designation and markings13 3.5.21.1 Construction 13 3.5.21.2 Location.13 3.5.21.3 Identificatio
16、n marking .13 4. VERIFICATION 16 4.1 Classification of inspections .16 4.2 Qualification inspection of AQB circuit breakers, mounting bases/blocks, fuses, fuse units and attachments.16 4.2.1 Additional attachment qualification requirements16 4.2.2 Qualification inspection of type NQB circuit breaker
17、s 20 4.2.3 Samples for qualification inspection 20 4.2.4 Retention of qualification.20 4.3 Comparison inspection20 4.4 Conformance inspection .20 4.4.1 Inspection .20 4.4.2 Rejected units .20 4.4.3 Conformance production shock testing 21 4.4.3.1 Sampling21 4.4.3.2 Production shock test.21 4.4.3.3 Ac
18、ceptance criteria 21 4.4.3.4 Action required if failure occurs21 4.4.3.5 Disposition.22 4.5 Tests22 4.5.1 General examination 22 4.5.2 Creepage and clearance distances 22 4.5.3 Trip-free operation .22 4.5.4 Dielectric strength 22 4.5.4.1 Test equipment 22 4.5.4.2 Voltage magnitude.23 4.5.4.2.1 Full
19、voltage .23 4.5.4.2.2 Reduced voltage23 4.5.4.3 Voltage application/duration and pass/fail criteria 23 4.5.4.3.1 Circuit breaker, fuse unit, attachments, and mounting base/block configuration .23 4.5.4.3.1.1 Circuit breaker mounting base/block terminals and ground used as test points .23 4.5.4.3.1.2
20、 Attachment leads used as test points 24 4.5.4.3.1.2.1 Electric operating mechanism24 4.5.4.3.1.2.2 Undervoltage release, shunt trip, and auxiliary switch 24 4.5.5 Insulation resistance .24 4.5.5.1 Test equipment 24 4.5.5.2 Test points and conditions .24 4.5.5.3 Pass/fail criteria .24 4.5.5.3.1 10-m
21、egohm threshold .24 4.5.5.3.2 1-megohm threshold .24 4.5.6 Attachment electrical characteristics24 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) iv PARAGRAPH PAGE 4.5.6.1 Electric operating mechanisms 24 4.5.6.1.1 Voltage range24
22、 4.5.6.1.2 Closing time24 4.5.6.2 Undervoltage release .24 4.5.6.2.1 Operating voltage range25 4.5.6.2.2 Dropout voltage range.25 4.5.6.2.3 Time delay 25 4.5.6.3 Shunt trips25 4.5.7 Undervoltage time delay 25 4.5.8 Auxiliary switch rating.25 4.5.9 Endurance.25 4.5.9.1 Circuit breakers.25 4.5.9.1.1 M
23、echanical endurance test25 4.5.9.1.1.1 Test set-up and method of cycling .25 4.5.9.1.1.2 Number and rate of operations .25 4.5.9.1.2 Electrical endurance test .25 4.5.9.1.2.1 Test set-up and method of cycling .25 4.5.9.1.2.2 Number and rate of operations 25 4.5.9.2 Attachments.25 4.5.9.2.1 Electric
24、operating mechanism.25 4.5.9.2.2 Undervoltage release device .26 4.5.9.2.3 Shunt trip.26 4.5.9.2.4 Example 26 4.5.10 Calibration26 4.5.10.1 Circuit breakers with thermal magnetic trip units26 4.5.10.1.1 Long-time delay26 4.5.10.1.2 Instantaneous trip elements.26 4.5.10.2 Calibration of circuit break
25、ers with electronic trip unit.28 4.5.10.2.1 Long-time delay28 4.5.10.2.1.1 Long-time thermal memory (for circuit breakers with electronic trip units only)28 4.5.10.2.1.1.1 Example of long-time delay and long-time thermal memory testing (AQB-A252 circuit breaker) 28 4.5.10.2.2 Instantaneous trip elem
26、ents.30 4.5.10.2.3 Short-time delay30 4.5.10.3 Abbreviated calibration testing31 4.5.10.3.1 Long-time delay31 4.5.10.3.2 Instantaneous 32 4.5.10.3.3 Short-time delay32 4.5.11 Inclined operation.32 4.5.12 Temperature rise.32 4.5.12.1 Circuit breaker .32 4.5.12.1.1 Test circuit 32 4.5.12.1.2 Sensor lo
27、cations 32 4.5.12.1.2.1 Ambient32 4.5.12.1.2.2 Circuit breaker32 4.5.12.1.3 Temperature stabilization and temperature rise determination .32 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) v PARAGRAPH PAGE 4.5.12.1.4 Pass/fail crit
28、eria.32 4.5.12.1.4.1 Pre-interruption 33 4.5.12.1.4.2 Post-interruption.33 4.5.12.2 Attachments.33 4.5.13 Interrupting performance33 4.5.13.1 Test circuit.33 4.5.13.1.1 AC test circuit .33 4.5.13.1.2 DC test circuit .33 4.5.13.2 Test sequence and pass/fail criteria .33 4.5.14 Shock34 4.5.14.1 Circui
29、t breaker samples, states, and mounting.34 4.5.14.2 Equipment energization.34 4.5.14.2.1 Circuit breakers.34 4.5.14.2.1.1 Thermal magnetic.34 4.5.14.2.1.2 Electronic .34 4.5.14.2.2 Attachments 34 4.5.14.2.2.1 Undervoltage releases 34 4.5.14.2.2.2 Auxiliary switch .34 4.5.14.2.2.3 Electric operating
30、mechanism 34 4.5.14.3 Monitoring of main and auxiliary contacts34 4.5.14.3.1 Monitoring equipment 34 4.5.14.3.2 Number of contacts to monitor .34 4.5.14.4 Pass/fail criteria .34 4.5.14.4.1 Pass/fail criteria during shock .34 4.5.14.4.2 Post-shock pass/fail criteria (manual cycling) 35 4.5.15 Vibrati
31、on 35 4.5.16 Electromagnetic interference (EMI).35 4.5.17 Voltage spike35 4.5.18 Handle locking device operation35 4.5.19 Handle boot operation and high temperature endurance 35 4.5.19.1 Operation (manual cycling) .35 4.5.19.2 High temperature endurance35 5. PACKAGING.35 5.1 Packaging35 6. NOTES .35
32、 6.1 Intended use 35 6.2 Acquisition requirements 35 6.3 Qualification .36 6.4 Definitions 36 6.4.1 AQB circuit breaker .36 6.4.2 Attachments36 6.4.3 Auxiliary switch .37 6.4.4 Back-connected 37 6.4.5 Continuous current rating.37 6.4.6 Current limiting device.37 6.4.7 Current limiting fuse unit base
33、 .37 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) vi PARAGRAPH PAGE 6.4.8 Electric operating attachment.37 6.4.9 Front-connected37 6.4.10 Fused circuit breaker 37 6.4.11 Handle boot 37 6.4.12 Handle locking device37 6.4.13 Inten
34、tional time delay.37 6.4.14 Interrupting rating 37 6.4.15 Low voltage37 6.4.16 NQB circuit breaker .37 6.4.17 Peak let-through current .37 6.4.18 Pickup.37 6.4.19 Pulse method 37 6.4.20 Quick-break37 6.4.21 Quick-make 38 6.4.22 Rated short-time current (for AQB-A1602 only) .38 6.4.23 Removable mount
35、ing .38 6.4.24 Reset time (at interrupting rating) 38 6.4.25 Shunt trip38 6.4.26 Time, interrupting.38 6.4.27 Trip free38 6.4.28 Tripping time38 6.4.29 Trip unit, adjustable38 6.4.30 Type38 6.4.31 Unit operations .38 6.5 Provisioning 38 6.6 Technical manuals.38 6.7 Certification data.38 6.7.1 Condit
36、ion of omission of drawings and certification data sheets .38 6.8 Subject term (key word) listing.39 6.9 Changes from previous issue 39 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) vii LIST OF TABLES TABLE PAGE TABLE I Dielectri
37、c strength voltage magnitude 6 TABLE II. Electric operating mechanism operational requirements11 TABLE III (a). Undervoltage release device operational requirements (field replaceable) .11 TABLE III (b). Undervoltage release device operational requirements (not field replaceable) .11 TABLE IV. Shunt
38、 trip device operational requirements 12 TABLE V. Qualification test schedule and sequence (for inspection samples 1A, 2A, and 3A) .17 TABLE VI. Qualification inspection test schedule (for inspection samples 1B, 2B, and 3B)19 TABLE VII. Conformance inspection21 TABLE VIII. Dielectric strength test p
39、oints (mounting base/block terminals and ground) with circuit breaker open.23 TABLE IX. Dielectric strength test points (mounting base/block terminals and ground) with circuit breaker closed.23 TABLE X. Dielectric strength test points (mounting base/block terminals, attachment leads, and ground)24 T
40、ABLE XI. Long-time delay testing (thermal magnetic trip units)26 TABLE XII. Instantaneous pickup testing (thermal magnetic and electronic trip units)27 TABLE XIII. Instantaneous timing test (thermal magnetic and electronic trip units)28 TABLE XIV (a). Long-time delay and long-time thermal memory tes
41、ting (electronic trip units).28 TABLE XIV (b). Example of long-time delay and long-time thermal memory testing (AQB-A252 circuit breaker).29 TABLE XV. Short-time delay pickup testing (electronic trip units) 30 TABLE XVI. Short-time delay trip time testing (electronic trip units) 31 TABLE XVII. Short
42、-time resettable delay testing (electronic trip units) .31 LIST OF FIGURES FIGURE PAGE FIGURE 1. Typical master drawing .40 FIGURE 2. Current limiting fuses, outline dimensions42 FIGURE 3. Handle locking devices for circuit breakers 43 FIGURE 4. Standard mounting for shock testing drawout-mounted ty
43、pe AQB circuit breakers.44 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) viii APPENDIX A AQB/NQB CIRCUIT BREAKER OBSOLESCENCE AND RELATED INFORMATION A.1. SCOPE46 A.1.1 Scope.46 A.2. GENERAL CIRCUIT BREAKER INFORMATION.46 A.2.1 S
44、PD AQB/NQB circuit breakers.46 A.2.1.1 Obsolete thermal magnetic .46 A.2.1.2 Electronic .47 A.2.1.3 Miscellaneous information .47 A.2.2 Cutler-Hammer (formerly Westinghouse) AQB/NQB circuit breakers47 A.2.2.1 Thermal magnetic.47 A.2.2.2 Electronic .47 A.2.2.3 Miscellaneous information .47 A.3. DETAI
45、LED INFORMATION BY FRAME SIZE .48 A.3.1 50-amp frame 48 A.3.1.1 SPD AQB-A50.48 A.3.1.2 Cutler-Hammer AQB-A50 and AQB-A51.48 A.3.1.3 Form, fit, and function replacement considerations (circuit breakers from same vendor) .48 A.3.1.4 Form, fit, and function replacement considerations (circuit breakers
46、from different vendors) 48 A.3.2 100-amp frame 48 A.3.2.1 AQB-A101 thermal magnetic and electronic counterparts.48 A.3.2.1.1 SPD48 A.3.2.1.1.1 AQB-A101 (thermal magnetic).48 A.3.2.1.1.2 AQB-A102 (electronic).49 A.3.2.1.2 Cutler-Hammer49 A.3.2.1.2.1 AQB-A101 (thermal magnetic).49 A.3.2.1.2.2 AQB-A103
47、 (electronic).49 A.3.2.1.3 Form, fit, and function replacement considerations (circuit breakers from same vendor).50 A.3.2.1.3.1 SPD .50 A.3.2.1.3.2 Cutler-Hammer .50 A.3.2.1.4 Form, fit, and function replacement considerations (circuit breakers from different vendors)50 A.3.2.1.5 Attachments .50 A.
48、3.2.1.5.1 Shunt trip leads for SPD AQB-A102 50 A.3.2.1.5.2 Shunt trip and cut-off switch.51 A.3.2.2 AQB-A100 and AQB-LF100 .51 A.3.3 250-amp frame (thermal magnetic and electronic types) 51 A.3.3.1 SPD.51 A.3.3.1.1 Thermal magnetic 51 A.3.3.1.1.1 AQB-A25051 A.3.3.1.1.2 AQB-LF250 52 A.3.3.1.1.3 AQB-L
49、F226 52 A.3.3.1.2 Electronic.52 A.3.3.1.2.1 AQB-A25252 A.3.3.1.2.2 AQB-LF252 52 A.3.3.2 Cutler-Hammer.53 A.3.3.2.1 Thermal magnetic 53 A.3.3.2.1.1 AQB-A25053 A.3.3.2.1.2 AQB-LF250 53 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-DTL-17361G(SH) ix A.3.3.2.2 Electronic.53 A.3.3.2.2
