收藏
下载资源 加入VIP,免费下载

NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf

上传人：twoload295 文档编号：988713 上传时间：2019-03-15 格式：PDF 页数：9 大小：460.38KB
下载 相关 举报
NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf_第1页
第1页 / 共9页
NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf_第2页
第2页 / 共9页
NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf_第3页
第3页 / 共9页
NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf_第4页
第4页 / 共9页
NBN T 42-008-1984 1875 Polyethylene pressure pipes - Classification in PE 50 and PE 63《聚乙烯压力管 PE50和PE63分类》.pdf_第5页
第5页 / 共9页
点击查看更多>>
资源描述
展开阅读全文
相关资源
猜你喜欢
  • EN 60749-4-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 4 Damp Heat Steady State Highly Accelerated Stress Test (HAST)《半导体器件 机械和气候试验方法 第4部分 稳态温度湿度偏差耐久性试验.pdf EN 60749-4-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 4 Damp Heat Steady State Highly Accelerated Stress Test (HAST)《半导体器件 机械和气候试验方法 第4部分 稳态温度湿度偏差耐久性试验.pdf
  • EN 60749-4-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST).pdf EN 60749-4-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST).pdf
  • EN 60749-40-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件 机械和气候试验方法 第40部分 使用应变仪的板级跌落试验方法》.pdf EN 60749-40-2011 en Semiconductor devices - Mechanical and climatic test methods - Part 40 Board level drop test method using a strain gauge《半导体器件 机械和气候试验方法 第40部分 使用应变仪的板级跌落试验方法》.pdf
  • EN 60749-42-2014 en Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage.pdf EN 60749-42-2014 en Semiconductor devices - Mechanical and climatic test methods - Part 42 Temperature and humidity storage.pdf
  • EN 60749-43-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans.pdf EN 60749-43-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans.pdf
  • EN 60749-44-2016 en Semiconductor devices - Mechanical and climatic test methods - Part 44 Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.pdf EN 60749-44-2016 en Semiconductor devices - Mechanical and climatic test methods - Part 44 Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.pdf
  • EN 60749-5-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 5 Steady-state temperature humidity bias life test.pdf EN 60749-5-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 5 Steady-state temperature humidity bias life test.pdf
  • EN 60749-6-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 6 Storage at High Temperature《半导体器件 机械和气候试验方法 第6部分 高温下储存 部分替代EN 60749-1999+A1-2000+A2-2001 IEC 60.pdf EN 60749-6-2002 en Semiconductor Devices Mechanical and Climatic Test Methods Part 6 Storage at High Temperature《半导体器件 机械和气候试验方法 第6部分 高温下储存 部分替代EN 60749-1999+A1-2000+A2-2001 IEC 60.pdf
  • EN 60749-6-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature.pdf EN 60749-6-2017 en Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature.pdf
    • 相关搜索
    资源标签

    当前位置：首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库（www.mydoc123.com）网站版权所有
    备案/许可证编号：苏ICP备17064731号-1