1、_SAE Technical Standards Board Rules provide that: “This report is published by SAE to advance the state of technical and engineering sciences. The use of this report is entirely voluntary, and its applicability and suitability for any particular use, including any patent infringement arising theref
2、rom, is the sole responsibility of the user.”SAE reviews each technical report at least every five years at which time it may be revised, reaffirmed, stabilized, or cancelled. SAE invites your written comments and suggestions.Copyright 2016 SAE InternationalAll rights reserved. No part of this publi
3、cation may be reproduced, stored in a retrieval system or transmitted, in any form or by any means, electronic, mechanical, photocopying, recording, or otherwise, without the prior written permission of SAE.TO PLACE A DOCUMENT ORDER: Tel: 877-606-7323 (inside USA and Canada)Tel: +1 724-776-4970 (out
4、side USA)Fax: 724-776-0790Email: CustomerServicesae.orgSAE WEB ADDRESS: http:/www.sae.orgSAE values your input. To provide feedback on thisTechnical Report, please visithttp:/standards.sae.org/AS6171/7AEROSPACESTANDARDAS6171/7Issued 2016-10Techniques for Suspect/Counterfeit EEE Parts Detection by El
5、ectrical Test MethodsRATIONALEThis document provides guidance and requirements on the electrical test procedures to be employed by the Test Laboratory (Lab) for electrical, electronic and electro-mechanical (EEE) parts for suspect counterfeit (SC) part detection. The level of testing should be deriv
6、ed by the User Organization working in conjunction with the Test Lab, taking intoconsideration the risk level as defined in the SC part detection test sequence specified herein. It shall be the responsibility of the Test Lab to conduct the electrical test following the sequence of test and inspectio
7、ns for a given risk level specified herein. Reporting procedures shall be defined on how to handle anomalous or failed parts and the reporting protocol on how to detect counterfeit parts. The creation of this document is a step in addressing the ever-increasing global problem of EEE parts counterfei
8、ting.INTRODUCTIONThe electrical test serves as an important part of the procedure to ascertain whether a device is SC or not. Typically, electrical testing is one of the last steps performed in the verification process, following less expensive steps such as visual inspection, resistance to solvents
9、 and radiographic examination. Full electrical testing, if performed to the publisheddatasheet, ensures that the Customer will receive devices that operate in accordance with the manufacturers device specifications. However, parts passing electrical testing may still be counterfeit devices. Other te
10、sts may be needed to be performed, other than electrical testing, so as to assure that the parts are not suspect counterfeit. Electrical testing for the purposes of detecting SC electronic devices is most often justified for the following reasons:1. Electrical test is one of the best ways to determi
11、ne if a device is still functional and operational. Electrical test can verify that the device is meeting the rated operating parameters at the specified temperatures per the device electrical test specification.2. Electrical testing is a very efficient and comprehensive way to non-destructively scr
12、een 100% of a component.3. When there is evidence within a lot that some SC parts or rejects have been mixed in and there is no visual way to separate the SC parts from the good ones, electrical test may distinguish between SC parts and authentic parts depending upon the coverage of the electrical t
13、est being applied.4. Electrical testing can identify components with different performance levels, physical structure or revision levels that cannot be accurately determined with other inspection methods.5. If parts are damaged from handling, extended storage or environmental issues, testing can det
14、ermine what percentages of the units are failures. A high rate of failed units can indicate systemic problems with an entire lot received.6. Electrical testing is an effective method in which to detect electrically defective units, such as manufacturing rejects.SAE INTERNATIONAL AS6171/7 Page 2 of 3
15、27. Electrical testing is more critical for applications that have a high risk factor and have the potential for causing life threatening or significant monetary/mission critical damages.8. When all visual and non-electrical testing has been completed without reasonable certainty of verification, an
16、d the part source is not from an OCM or an authorized OCM distributor, then electrical testing may be the only remaining non-destructive testing method to complete the determination. 9. Electrical test may be useful to diagnose actual system failures when no obvious cause of the failures can be foun
17、d.10. When part marking does not indicate grade (e.g., speed, power, temperature, quality) of the product and the parts have to be a specific grade for the application, electrical test is the best option. The potential of counterfeiting in such a case comes when it is suspected that the parts were c
18、ounterfeited by an unapproved third party supplier and falsely marked with the original manufacturers logo, part number and other markings on the device.11. For all other instances where documentation or external markings have been expertly altered or falsified, electrical testing may be the best co
19、nfirmation of part verification.Counterfeiters are continuing to improve their techniques and their abilities to clone, substitute and forge EEE components. Often the goal of the counterfeiter is to avoid quick detection by visual and mechanical means. Changing of electrical parameters is not easy t
20、o do; hence, counterfeiters rarely perform processes to change such electrical characteristics of the devices. Thus, it is critical that a robust electrical test be performed to aid in the assurance of SCdetection.TABLE OF CONTENTS1. SCOPE 41.1 Scope of Electrical Test Document. 42. REFERENCES 42.1
21、Applicable Documents 42.1.1 SAE Publications. 42.2 Related Publications . 52.3 Terms and Definitions . 52.4 Acronyms 53. MATERIAL CONTROL/ESD HANDLING/TEST HANDLING . 53.1 Material Control/ESD Handling . 53.2 Test Equipment . 64. REQUIREMENTS . 74.1 Sampling Plan . 84.2 Electrical Testing Requiremen
22、ts . 94.3 Burn-In and Environmental Tests . 104.3.1 Burn-In Tests. 104.3.2 Techniques for SC EEE Parts Detection by Selected Environmental Test Methods . 104.3.3 Techniques for Suspect/Counterfeit EEE Parts Detection by Temperature Cycling Test Method. 114.3.4 Techniques for Suspect/Counterfeit EEE
23、Parts Detection by Thermal Shock Test Method for Passive Devices 114.3.5 Techniques for Suspect/Counterfeit EEE Parts Detection by Seal Test Method . 124.4 SC Detection Test Plans. 134.5 Analysis and Interpretation of Results 134.6 Test Report . 134.7 Training and Certification 134.7.1 Personnel Tra
24、ining 134.7.2 Personnel Qualification and Certification 134.7.3 Qualification and Certification . 144.7.4 Specific Training/Certification Considerations for Electrical Testing 144.7.5 Updated Training and Recertification 15SAE INTERNATIONAL AS6171/7 Page 3 of 324.7.6 Usage of Formal Training and Cer
25、tification Services . 154.7.7 Examinations. 154.8 Test Lab Proficiency 164.8.1 Proficiency for Electrical Test 164.8.2 Test Laboratory Responsibility 174.9 Data Retention 174.10 Control Samples/Reference Samples/Standards and Calibration Requirements 184.10.1 Control Samples 184.10.2 Calibration Req
26、uirements 184.11 Minimum Test Lab Requirements . 194.11.1 Lab Qualification Standards 194.12 Subcontracting by Test Labs 204.13 Electrical Safety 205. RELATED TESTS. 206. DATA/COMMUNICATION AND TEST LAB REPORTING. 216.1 Data/Communication to be Submitted with the Job Request . 216.1.1 Material and D
27、ata with Samples Being Evaluated 216.1.2 Test and Test Reports Communications. 217. APPENDIX SUMMARY. 228. NOTES 228.1 Revision Indicator 22APPENDIX A QUESTIONNAIRE 23APPENDIX B REQUIRED LABORATORY PROCEDURES. 24APPENDIX C TABLE C1 - EXAMPLES OF ACTIVE DEVICE KEY ELECTRICAL TEST PARAMETERS 25APPENDI
28、X D TABLE D1 - EXAMPLES OF PASSIVE DEVICES KEY TEST ELECTRICAL PARAMETERS . 27APPENDIX E A PROFICIENCY SCHEME EXAMPLE 29APPENDIX F TEST PLAN OUTLINE 30APPENDIX G TEST REPORT . 31APPENDIX H SAMPLE ELECTRICAL TEST DATALOG FILE . 32TABLE 1 ELECTRICAL TEST LEVEL EXAMPLES (SEE NOTE 1) 8TABLE 2 MINIMUM BA
29、SIC LEVEL TEST 9TABLE 3 BURN-IN TEST METHODS 10SAE INTERNATIONAL AS6171/7 Page 4 of 321. SCOPE1.1 Scope of Electrical Test DocumentThe scope of this document is to:1. Specify techniques to detect SC parts using electrical testing.2. Provide various levels of electrical testing that can be used by th
30、e User to define test plans for detecting SC parts.3. Provide minimum requirements for testing laboratories so that User/Requester can determine which test houses have the necessary capabilities. (For example: technical knowledge, equipment, procedures and protocols for performing electrical testing
31、 for verification analysis.) Note: User/Requester is defined in AS6171 General Requirements4. Specify Burn-In and environmental tests. The environmental tests include Temperature Cycling for Active Devices and Thermal Shock for Passive Devices. Seal Tests are described and recommended for hermetic d
32、evices.The following terminology is used throughout this document:a. Shall = is mandatory;b. Should = is recommended; andc. Will = is planned (is considered to be part of a standard process).If AS6171/7 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.2. RE
33、FERENCES2.1 Applicable DocumentsThe following publications form a part of this document to the extent specified herein. The latest issue of SAE publications shall apply. The applicable issue of other publications shall be the issue in effect on the date of the purchase order. In theevent of conflict
34、 between the text of this document and references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.The requirements of this document are intended to supplement the req
35、uirements of a higher level quality standard (e.g., AS9100, ISO17025) and other quality management system documents. They are not intended to stand alone, supersede, or cancel requirements found in other quality management system documents, requirements imposed by contracting authorities, or applica
36、ble laws and regulations unless an authorized exemption/variance has been obtained.2.1.1 SAE PublicationsAvailable from SAE International, 400 Commonwealth Drive, Warrendale, PA 15096-0001, Tel: 877-606-7323 (inside USA and Canada) or +1 724-776-4970 (outside USA), www.sae.org.AS6171 Test Method Sta
37、ndard, General Requirements, Suspect/Counterfeit, Electrical, Electronic, and Electromechanical PartsAS9003 Inspection and Test Quality Systems, Requirements for Aviation, Space, and Defense OrganizationsARP9009 Aerospace Contract ClausesAS9100 Quality Management Systems - Requirements for Aviation,
38、 Space and Defense OrganizationsAS9120 Quality Management Systems - Requirements for Aviation, Space and Defense DistributorsSAE INTERNATIONAL AS6171/7 Page 5 of 322.2 Related PublicationsThe following publications are provided for information purposes only and are not a required part of this SAE Ae
39、rospace Technical Report.ANSI/ESD S20.20 ESD Control Program StandardANSI/ISO IEC 17025 General Requirements for the Competence of Testing and Calibration LaboratoriesISO 9000 Quality Management Systems-Fundamentals and VocabularyISO 9001 Quality Management Systems-RequirementsIDEA-STD-1010 Acceptab
40、ility of Electronic Components Distributed in the Open MarketJESD-625 Requirements for Handling Electrostatic Discharge Sensitive DevicesMIL-PRF-19500 Semiconductor Devices, General Specification forMIL-PRF-38534 Hybrid Microcircuits, General Specification forMIL-PRF-38535 Integrated Circuits (Micro
41、circuits) Manufacturing, General Specification forMIL-STD-202 Test Method Standard for Electronic and Electrical Component PartsMIL-STD-750 Test Methods for Semiconductor DevicesMIL-STD-883 Test Method Standard-MicrocircuitsMIL-HDBK-103 List of Microcircuit Drawings (FSC 5962)2.3 Terms and Definitio
42、nsSee 2.2 of AS6171.2.4 AcronymsSee 2.3 of AS6171.3. MATERIAL CONTROL/ESD HANDLING/TEST HANDLING3.1 Material Control/ESD HandlingThe handling requirements of this document will meet the minimum requirements of 3.9.5 of the AS6171 General Requirements. Test Labs and their authorized sub-contractors s
43、hall implement handling and storage procedures and processes to prevent part and material degradation and apply the Electrostatic Discharge (ESD) controls as prescribed in this document. The handling and storage procedures shall be maintained from receipt of parts through testing, inspections, stora
44、ge, packaging and shipment back to User/Requester. These processes and procedures shall include as a minimum the following:1. Unique containers and packaging markings to identify the parts as received.2. Control and limit personnel access to the parts during inspection and storage.SAE INTERNATIONAL
45、AS6171/7 Page 6 of 323. Provide for interim storage of parts as required.4. Protective cushioning for storage and transportation.5. ESD Protective bench surfaces where parts are handled during tests, inspections and for other similar processes where parts are being handled 6. Ensure that appropriate
46、 material handling practices are followed keeping in mind the ESD prevention protocols as mentioned above. 3.2 Test Equipment Test equipment is used to create signals and capture responses from a device under test (DUT). Just as component types are unique in their construction and purposes, so also
47、is the equipment used to test them. Test equipment is generally designed and optimized to be effective for specific device functions. As new device technologies are introduced often new test equipment is needed. Test Equipment can be put into two primary categories: Bench Equipment and Automated Tes
48、t Equipment (ATE). Generally, bench equipment is used for more specialized and unique measurements while ATEsare consistently used for repetitive testing that requires multiple testing interactions. A well-equipped testing laboratory will often have both a complement of bench equipment and ATE.NOTE:
49、 The test fixtures and test equipment required to perform the Burn-In and Environmental Tests specified in 4.3herein are described in the reference documents that are cited in that section.1. Basic Bench Equipmenta. Bench equipment is generally used to perform more basic measurements of voltage, current and circuits under test. These are self-contained measurement devices with preset measurement functions, that have defined and specific
