SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf

上传人:brainfellow396 文档编号:1029262 上传时间:2019-03-24 格式:PDF 页数:20 大小:845.41KB
下载 相关 举报
SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf_第1页
第1页 / 共20页
SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf_第2页
第2页 / 共20页
SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf_第3页
第3页 / 共20页
SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf_第4页
第4页 / 共20页
SANS 13937-3-2007 Textiles - Tear properties of fabrics Part 3 Determination of tear force of wing-shaped test specimens (Single tear method)《纺织品 纺织物的撕裂特性 第3部分:翅型试验样品撕裂力量的测定》.pdf_第5页
第5页 / 共20页
点击查看更多>>
资源描述
展开阅读全文
相关资源
猜你喜欢
  • DIN 50450-1-1987 de 3818 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of water impurity in hydrogen.pdf DIN 50450-1-1987 de 3818 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of water impurity in hydrogen.pdf
  • DIN 50450-2-1991 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of oxygen impurity in N Ar He Ne and .pdf DIN 50450-2-1991 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of oxygen impurity in N Ar He Ne and .pdf
  • DIN 50450-3-1991 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of methane impurity in H O N Ar and H.pdf DIN 50450-3-1991 Testing of materials for semiconductor technology determination of impurities in carrier gases and doping gases determination of methane impurity in H O N Ar and H.pdf
  • DIN 50450-4-1993 Testing of materials for semiconductor technology determination of impurities in carrier gases and dopant gases determination of C-C-hydrocarbons in nitrogen by ga.pdf DIN 50450-4-1993 Testing of materials for semiconductor technology determination of impurities in carrier gases and dopant gases determination of C-C-hydrocarbons in nitrogen by ga.pdf
  • DIN 50450-9-2003 Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9 Determination of oxygen nitrogen carbonm.pdf DIN 50450-9-2003 Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9 Determination of oxygen nitrogen carbonm.pdf
  • DIN 50451-1-2003 en 5446 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1 Silver (Ag) gold (Au) calcium (Ca) copper (Cu) iron.pdf DIN 50451-1-2003 en 5446 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1 Silver (Ag) gold (Au) calcium (Ca) copper (Cu) iron.pdf
  • DIN 50451-2-2003 en 4694 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2 Calcium (Ca) cobalt (Co) chromium (Cr) copper (Cu) .pdf DIN 50451-2-2003 en 4694 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2 Calcium (Ca) cobalt (Co) chromium (Cr) copper (Cu) .pdf
  • DIN 50451-3-2014 Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3 Determination of 31 elements in high-purity nitric acid.pdf DIN 50451-3-2014 Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3 Determination of 31 elements in high-purity nitric acid.pdf
  • DIN 50451-4-2007 de 3234 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4 Determination of 34 elements in ultra pure water by.pdf DIN 50451-4-2007 de 3234 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4 Determination of 34 elements in ultra pure water by.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1