1、 TIA-1048 (Adopted IEC 62005-7) January 2005Reliability of Fibre Optic Interconnecting Devices and Passive Components- Part 7: Life Stress Modeling ANSI/TIA-1048-2005 APPROVED: JANUARY 13, 2005 REAFFIRMED: MARCH 22, 2013 NOTICE TIA Engineering Standards and Publications are designed to serve the pub
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23、 Part 7: Life stress modeling FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions con
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33、ent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62005-7 has been prepared by subcommittee 86B: Fibre optic interconnecting devices and passive components, of IEC technical committee 86: Fibre optics. The text of this standard is
34、 based on the following documents: FDIS Report on voting 86B/1896/FDIS 86B/1906/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
35、 TIA-1048iiIEC 62005 consists of the following parts, under the general title Reliability of fibre optic interconnecting devices and passive optical components Part 1: Introductory guide and definitions Part 2: Quantitative assessment of reliability based on accelerated ageing tests Temperature and
36、humidity; steady state Part 3: Relevant tests for evaluating failure modes and failure mechanisms for passive components Part 4: Product screening Part 5: Relating accelerated tests to standardized service environments1Part 6: The use of field data to determine, specify and improve component reliabi
37、lity1Part 7: Life stress modelling Part 8: Test methods and statistical models for estimating reliability: a primer on fundamentals1Part 9: Reliability qualification standard1The committee has decided that the contents of this publication will remain unchanged until 2008. At this date, the publicati
38、on will be reconfirmed; withdrawn; replaced by a revised edition, or amended. _ 1Under consideration. TIA-1048 1RELIABILITY OF FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE OPTICAL COMPONENTS Part 7: Life stress modeling 1 Scope This part of IEC 62005 describes a common set of procedures for estim
39、ating the reliability of fibre optic connectors, splices, branching devices and other passive components. This part deals specifically with component reliability as estimated from life tests which are accelerated in some manner as in the example of IEC 62005-2. Since different material systems desig
40、ned to do the same job will often respond in very different ways to the same stresses, both in terms of the form of the acceleration function, and the statistical distribution of failure times (or degradation observed over time), a normative standard specifying specific methods of acceleration or st
41、atistical modeling is inappropriate. Instead, this Part 7 provides a minimal normative standard for presenting data and analyses to support reliability estimates of passive components and an informative portion (bibliography) containing references to more extensive writings on physical and statistic
42、al modeling for accelerated testing. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments
43、) applies. IEC 62005-2:2001, Reliability of fibre optic interconnecting devices and passive components Part 2: Quantitative assessment of reliability based on accelerated ageing tests Temperature and humidity; steady state IEC 62005-3:2001, Reliability of fibre optic interconnecting devices and pass
44、ive components Part 3: Relevant tests for evaluating failure modes and failure mechanisms for passive components 3 Presenting evidence of device reliability 3.1 The argument for reliability The argument for reliability shall meet the following criteria: It shall be consistent with existing physical
45、knowledge of the failure modes stimulated by the device specific stress as described in IEC 62005-3 and IEC 62005-5. It shall be statistically consistent with all the data gathered in experimental study of the device in question. Confidence intervals on prediction parameters must be consistent with
46、the data and the assumed model. Statistical outlier(s) shall be reported. Elimination of outliers may be justified by reasonable arguments based on an understanding of experimental procedure. TIA-1048 23.2 Approaches to reliability The following three approaches are legitimate ways of supporting arg
47、uments that a device is reliable with respect to a specific stress: 3.2.1 Acceptance testing When the argument for reliability is based on survival of devices without failure under accelerated conditions, the time, duration and stress of the acceptance test shall be justified. The test shall be base
48、d on a realistic model that shows that the test conditions bound plausible failure mechanisms operating during service life. Statistical confidence bounds based on probability models shall also be provided. The following shall be reported: a test shall be described (e.g. 85 C for 2 000 h) and the eq
49、uivalent service life conditions shall be described (e.g. 35 C for 25 years). the set of chemical processes such that this test is an end of life test (e.g. all thermally activated processes with an activation energy greater than 0,92 eV); why this set of processes is assumed to be reasonable (e.g., for similar material systems an activation energy below 1,0 eV has never been observed); the measured parameter and the measurement procedure used for testing (e.g. amount of degradation); the number of devices tested; the statistical
