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22、CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. ANSI/TIA-1183 ii MEASUREMENT METHODS AND TEST FIXTURES FOR BALUN-LESS MEASUREMENTS OF BALANCED COMPONENTS AND SYSTEMS FOREWORD IV INTRODUCTION . V 1 SCOPE 2 2 NORMATIVE REFERENCES . 2 3 DEFINITION OF TERMS, A
23、CRONYMS AND ABBREVIATIONS, AND UNITS OF MEASURE2 3.1 General 2 3.2 Definitions 2 3.3 Acronyms and abbreviations . 3 3.4 Units of measure . 3 3.5 Variables . 3 4 GENERAL . 4 5 TEST CONFIGURATIONS . 4 5.1 Test configuration with post-processing 4 5.2 Test configurations utilizing internal network-anal
24、yzer impedance settings . 7 6 FIXTURES AND SETUP . 10 6.1 Fixture dimensions 10 6.2 Switching and interconnecting coaxial cable requirements 12 6.3 Test fixture interface performance. . 13 6.4 Overall Test setup performance. . 14 7 PORT TERMINATIONS 14 7.1 Resistor terminations 15 7.2 Termination pe
25、rformance at the calibration plane . 15 8 REFERENCE LOADS FOR CALIBRATION AND TERMINATION . 16 9 CALIBRATION . 16 9.1 General 16 9.2 Application of calibration standards 17 9.3 Calibration kit definitions . 18 10 EXAMPLE TEST FIXTURE ASSEMBLIES 21 ANNEX A (INFORMATIVE)- DERIVATION OF MIXED MODE PARA
26、METERS FROM FOUR PORT S PARAMETER MEASUREMENTS . 28 ANNEX B (INFORMATIVE)- IMPEDANCE TRANSFORMATION CALCULATIONS 31 ANNEX C (INFORMATIVE) CABLING STANDARDS AND TERMINATION IMPEDANCES FOR DIFFERENTIAL CABLING SYSTEMS 36 ANNEX D (INFORMATIVE) PORT IDENTIFICATION AND NOMENCLATURE . 38 ANNEX E (INFORMAT
27、IVE) DE-EMBEDDING BALUNLESS TEST FIXTURES FOR MEASURING 16-PORT DIFFERENTIAL DEVICES . 42 LIST OF TABLES Table 1 Switch performance recommendations 12 Table 2 Test fixture interface performance 13 Table 3 Overall test setup performance 14 Table 4 Termination performance . 16 Table 5 Example calibrat
28、ion standards definitions 19 Table 6 Through calibration artifacts used per port . 19 Table 7 Stimulus and response designations for ports 1 and 2 39 Table 8 S-parameter and TIA nomenclature for 8 port parameters 40 Table 9 S-parameter and TIA nomenclature for four pair DUT parameters 41 ANSI/TIA-11
29、83 iii LIST OF FIGURES Figure 1 Insertion loss configuration for post-processing 5 Figure 2 NEXT configuration for post-processing . 6 Figure 3 Return loss configuration for post-processing . 6 Figure 4 FEXT configuration for post-processing 7 Figure 5 IL and TCTL test configuration for direct measu
30、rement 8 Figure 6 NEXT test configuration for direct measurement 8 Figure 7 RL and TCL test configuration for direct measurement 9 Figure 8 FEXT test configuration for direct measurement 9 Figure 9 Test system block diagram 10 Figure 10 Example pin and socket interface dimension 11 Figure 11 Paired
31、socket interface layout . 11 Figure 12 DUT interface dimensions . 11 Figure 13 Example of four-port network analyzer and switching 12 Figure 14 Resistor termination networks . 15 Figure 15 Example Resistor terminations . 15 Figure 16 Open calibration 17 Figure 17 Short calibration 17 Figure 18 Load
32、calibration . 18 Figure 19 Thru calibration configuration 18 Figure 20 Port numbering for calibration . 20 Figure 21 SMA example test fixture exploded assembly 21 Figure 22 Example DUT Adapter 22 Figure 23 Example load calibration termination 22 Figure 24 Example short calibration termination . 23 F
33、igure 25 Example test head assembly 23 Figure 26 Example near-end thru calibration kit 24 Figure 27 Example DMCM termination, opposite pairs . 24 Figure 28 Example DMCM termination, adjacent pairs . 25 Figure 29 Example DMCM termination, 3 pairs 25 Figure 30 Example far end termination . 26 Figure 3
34、1 Example back-to-back through calibration 26 Figure 32 Example calibration kit 27 Figure 33 Voltage and current on balanced DUT with respect to a ground plane 28 Figure 34 Voltage and current conversion by two mathematical transformers . 29 Figure 35 Example cable types . 37 Figure 36 Example S-par
35、ameter notation for two ports. 38 Figure 37 Example Four pair DUT port numbering . 38 Figure 38 Unprocessed measurement includes test fixtures and DUT . 42 Figure 39 De-embedding matrices cascaded to unprocessed 16-port matrix including all fixtures. 43 Figure 40 Using probing devices to interface p
36、orts C and D to measure FWDx and REVx . 44 Figure 41 An example of probing devices (rigid SMA cable is modified) 44 Figure 42 Illustration for cascading de-embedding matrices and ideal baluns . 46 Figure 43 Cascading using RF simulation application (comparable to Figure 39) 47 Figure 44 Adding ideal
37、 baluns to extract differential, common, and cross-modal parameters . 47 ANSI/TIA-1183 iv FOREWORD (This forward is not a part of this Standard.) This project was initiated in conjunction with the need to measure additional parameters for modeling of alien crosstalk in permanent links and channels o
38、f Category 6A and better cabling and components. The scope of the project has been broadened to higher frequencies and general testing purposes. The Standard is intended to be published as an independent testing reference. This Standard was developed by TIA Subcommittee TR-42.7. Approval of this Sta
39、ndard This Standard was approved by TIA Sub-Committee TR-42.7, TIA Engineering Committee TR-42, and the American National Standards Institute (ANSI). ANSI/TIA reviews standards every 5 years. At that time, standards are reaffirmed, rescinded, or revised according to the submitted updates. Updates to
40、 be included in the next revision should be sent to the committee chair or to ANSI/TIA. Contributing Organizations More than 30 organizations within the telecommunications industry contributed their expertise to the development of this Standard (including manufacturers, consultants, end users, and o
41、ther organizations). Annexes Annexes A through E are informative and not considered requirements of this standard. ANSI/TIA-1183 v INTRODUCTION This standard describes test fixturing and methods for obtaining performance measurements of passive devices designed for differential signal transmission.
42、The measurements are generally aimed at swept frequency response measurements where the source signal is provided by test equipment. A network analyzer is typically used for these types of measurements. The fixtures are not limited to use with network analyzers, though, and can be used with time dom
43、ain measurement equipment (TDRs, Oscilloscopes) as well. The primary enhancement of these test methods and fixtures relative to conventional devices is the elimination of balun transformers for impedance matching between the device under test (DUT) and the measurement equipment. Purpose Removal of t
44、he balun transformers from the measurement circuit allows extension of the bandwidth of testing up to the inherent capabilities of the network analyzer and the associated test fixtures. Elimination of baluns also allows the DUT to be tested with both differential mode stimulus or response, or common
45、 mode stimulus or response. This enables testing of mixed mode parameters such as TCL, TCTL and cross-modal NEXT and FEXT couplings without reconfiguration of the DUT or the measurement setup. Specification of criteria Two categories of criteria are specified; mandatory and advisory. The mandatory r
46、equirements are designated by the word “shall“; advisory requirements are designated by the words “should”, “may“, or “desirable“ which are used interchangeably in this Standard. Mandatory criteria apply to performance and compatibility; they specify the absolute minimum acceptable requirements. Adv
47、isory or desirable criteria are presented when their attainment will enhance the general performance of the testing platform in all its contemplated applications. A note in the text, table, or figure is used for emphasis or offering informative suggestions. Metric equivalents of US customary units T
48、he majority of the metric dimensions in this Standard are metric with soft conversions to US customary units; e.g., 4 inches (in) is the soft conversion of 100 millimeters (mm). Life of the Standard This Standard is a living document. The criteria contained in this Standard are subject to revisions
49、and updating as warranted by advances in telecommunications technology. ANSI/TIA-1183 2 1 SCOPE Balun-less measurement methods, nomenclature, and fixtures are defined for measurement of transmission parameters of four-pair (16 port) devices typically utilizing multi-port network analyzers. The methods and fixtures have shown to facilitate measurement of all differential mode, mixed mode, and common mode transmission parameters up to 1 GHz. Test interface performance specifications above 1GHz are under study. 2 NORMATIVE REFERENCES The following standards contain provisions that, through
