1、 TIA-455-198 December 2002 (r 01/2012) FOTP-198 Measurement of Polarization Dependence of Insertion Loss of Single-Mode Fiberoptic Components by a Mueller Matrix Method NOTICE TIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings b
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22、THE USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. TIA-455-198 FOTP-198 Measurement of polarization dependence of insertion loss of single-mode fiberoptic components by a Mueller matrix method Contents Forward. . . . . . . . . . . . . . . . . .
23、 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .iii 1. Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 2. Normative references . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
24、. . . . . . . . . . . . . . . . 3 3. Apparatus. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 4. Sampling and specimens. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 5. Procedure . . .
25、. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 6. Calculations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 7. Documentation . . . . . . . . . . . . . . . . . . . . . . . .
26、. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 8. Specification information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Annex A Comparison between this standard and IEC or ITU Standards . . . . . . . . .12 Annex B Estimation of source coher
27、ence length . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Annex C Effect of measurement system PDL and fiber pigtail birefringence . . . . . .14 Figure 1 - Polarization State Adjuster (Example) . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5 Figure 2 - Methods of Single Mode Po
28、larized Source Alignment. . . . . . . . . . . . . . . . . .6 Figure 3 - Reference Power Measurement Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8 Figure 4 - Specimen PDL Measurement Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Figure 5 - Modified PDL Measure
29、ment Setup. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 iTIA-455-198 This page left blank ii TIA-455-198 _ Foreword _ This Standard comes from TIA Project No. 4162 and was formulated under the cognizance of TIA joint working group FO 6.3.5. This FOTP is part of a series of test pr
30、ocedures included within Recommended Standard TIA/EIA-455. This Standard describes a new test method. There is one informative annex to this Standard. Key words: PDL, Mueller matrix, Stokes vector, polarization, polarization sensitivity, polarization dependent loss, insertion loss, branching device
31、Note: The users attention is called to the possibility that compliance with this Standard may require use of an invention covered by patent rights. By publication of this Standard, no position is taken with respect to the scope or validity of such patent claims or of any patent rights in connection
32、therewith. iiiTIA-455-198 This page left blank.iv TIA-455-198 FOTP-198 Measurement of polarization dependence of insertion loss of single-mode fiberoptic components by a Mueller matrix method _ 1 Introduction _ 1.1 Intent The intent of this test is to determine the sensitivity of single-mode fiberop
33、tic components to changes in polarization using a method based on the Mueller matrix formalism. The result of the test is the total variation in insertion loss over all polarization states of light launched in to the Specimen. The maximum observed variation in transmission loss is referred to as pol
34、arization-dependent-loss (PDL). 1.2 Description The method entails an optical power representation of the performance of components by a 4 x 4 matrix known as a Mueller matrix. In addition, the state of polarization of light is described as a 4-element vector known as a Stokes vector. The Stokes vec
35、tor of the incident light multiplied by the Mueller matrix of the Specimen gives a Stokes vector for the output light, and, in general, this light may be from transmission, reflection or scattering. This Procedure, however, is defined only for transmitted light. Reflection and scattering require dif
36、ferent derivations and separate procedures. In the determination of PDL of a component using Mueller matrices it is normally not necessary to determine the full Mueller matrix but rather only the first row, which provides complete information on light intensity but not on the resultant state of pola
37、rization. To generate the first row of the matrix four discrete states of input polarization must be generated sequentially and launched into the input port of the Specimen and the corresponding optical attenuations measured. Higher accuracy may be achieved if a reference splitter and detector are e
38、mployed following the source or polarization-state-adjuster (PSA) but prior to the Specimen. The accuracy of the measurement is nominally independent of the retardance of the Specimen leads and the PDL of the reference splitter/detector combination if the measurement detector itself has negligible p
39、olarization dependence. However it does depend on the stability of these parameters over the duration of the measurement. The converse situation of high PDL levels in the measurement detector is discussed in an informative Annex. 1.3 Scope This procedure can be applied to any single-mode passive com
40、ponent, including connectors, splices, couplers, attenuators, isolators, switches, multiplexers and demultiplexers, optical amplifiers (non-operating), circulators and filters. It is used to 1TIA-455-198 measure the total range of insertion loss as PDL due to changes in polarization of the launch st
41、ate. For branching devices, it can also be used to measure the total range of coupling ratio. It cannot be used to measure polarization-maintaining components or to measure the polarization dependence of return loss nor is this method applicable to measuring the polarization dependence of higher ord
42、er attributes such as center wavelength and bandwidth of filters This procedure could be used to measure the polarization dependence of non-diagonal transmission coefficients, e.g. wavelength isolation and directivity. This method differs from that described in FOTP-157, which is based on manipulati
43、on of the state of polarization of light either continuously or in small increments in order to measure maxima and minima of the attenuation of transmitted light. This method involves the measurement of the behavior of Specimen when illuminated by a small set of well-defined states of polarization o
44、f input light. These measurements are followed by a matrix calculation to determine the polarization dependent loss (PDL) of the Specimen. It may be considered an efficient alternative to FOTP-157 when a result is required from a small, discrete number of measurements, such as in automated testing.
45、Generally, PDL techniques based on matrix methods fall into two categories, i.e. those based on Mueller calculus (hereafter referred to as Mueller/Stokes methods) and those based on the Jones calculus. While the two techniques are mathematically equivalent for completely polarized light, only the Mu
46、eller/Stokes method is applicable in the case of partially polarized light and is therefore to be considered to be more general. In addition, methods based on the Jones matrix generally require known polarization states on both input and output while the Mueller/Stokes methods require only known inp
47、ut states. Precise prior characterization of the input states is required in either case. 2 TIA-455-198 _ 2 Normative references _ The following standards contain provisions that, through reference in this text, constitute provisions of this Standard. At the time of publication, the editions indicat
48、ed were valid. All standards are subject to revision, and parties to agreements based on this Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. ANSI and TIA maintain registers of currently valid national standards published by them. ANSI/TIA/EIA 440-A Fiber Optic Terminology ANSI/TIA/EIA 455-A Standard Test Procedure for Fiber Optic Fibers, Cables, Transducers, Sensors, Connecting and Terminating Devices, and Other Fiber Optic
