TIA-455-218-2002 FOTP-218 Measurement of Endface Geometry of Single Fiber Optical Connectors《单个光纤连接器的端面几何的测量》.pdf

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1、 TIA-455-218 June 2002 (r 01/2012) FOTP-218 Measurement of Endface Geometry of Single Fiber Optical Connectors NOTICE TIA Engineering Standards and Publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating intercha

2、ngeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for their particular need. The existence of such Standards and Publications shall not in any respect preclude any member or non-member of TIA from manufacturing or sel

3、ling products not conforming to such Standards and Publications. Neither shall the existence of such Standards and Publications preclude their voluntary use by Non-TIA members, either domestically or internationally. Standards and Publications are adopted by TIA in accordance with the American Natio

4、nal Standards Institute (ANSI) patent policy. By such action, TIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This Standard does not purport to address all safety problems associated with its use or al

5、l applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations before its use. (From Project No.3-0001, formulated under the cognizance of the TIA TR-42 Tele

6、communications Cabling Systems, TR-42.13 Subcommittee on Passive Optical Devices and Fiber Optic Metrology). Published by TELECOMMUNICATIONS INDUSTRY ASSOCIATION Standards and Technology Department 2500 Wilson Boulevard Arlington, VA 22201 U.S.A. PRICE: Please refer to current Catalog of TIA TELECOM

7、MUNICATIONS INDUSTRY ASSOCIATION STANDARDS AND ENGINEERING PUBLICATIONS or call IHS, USA and Canada (1-877-413-5187) International (303-397-2896) or search online at http:/www.tiaonline.org/standards/catalog/ All rights reserved Printed in U.S.A. NOTICE OF COPYRIGHT This document is copyrighted by t

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9、) for details on how to request permission. Details are located at: http:/www.tiaonline.org/standards/catalog/info.cfm#copyright or Telecommunications Industry Association Technology (b) there is no assurance that the Document will be approved by any Committee of TIA or any other body in its present

10、 or any other form; (c) the Document may be amended, modified or changed in the standards development or any editing process. The use or practice of contents of this Document may involve the use of intellectual property rights (“IPR”), including pending or issued patents, or copyrights, owned by one

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13、or conditions are reasonable or non-discriminatory. TIA does not warrant or represent that procedures or practices suggested or provided in the Manual have been complied with as respects the Document or its contents. If the Document contains one or more Normative References to a document published b

14、y another organization (“other SSO”) engaged in the formulation, development or publication of standards (whether designated as a standard, specification, recommendation or otherwise), whether such reference consists of mandatory, alternate or optional elements (as defined in the TIA Engineering Man

15、ual, 4thedition) then (i) TIA disclaims any duty or obligation to search or investigate the records of any other SSO for IPR or letters of assurance relating to any such Normative Reference; (ii) TIAs policy of encouragement of voluntary disclosure (see Engineering Manual Section 6.5.1) of Essential

16、 Patent(s) and published pending patent applications shall apply; and (iii) Information as to claims of IPR in the records or publications of the other SSO shall not constitute identification to TIA of a claim of Essential Patent(s) or published pending patent applications. TIA does not enforce or m

17、onitor compliance with the contents of the Document. TIA does not certify, inspect, test or otherwise investigate products, designs or services or any claims of compliance with the contents of the Document. ALL WARRANTIES, EXPRESS OR IMPLIED, ARE DISCLAIMED, INCLUDING WITHOUT LIMITATION, ANY AND ALL

18、 WARRANTIES CONCERNING THE ACCURACY OF THE CONTENTS, ITS FITNESS OR APPROPRIATENESS FOR A PARTICULAR PURPOSE OR USE, ITS MERCHANTABILITY AND ITS NONINFRINGEMENT OF ANY THIRD PARTYS INTELLECTUAL PROPERTY RIGHTS. TIA EXPRESSLY DISCLAIMS ANY AND ALL RESPONSIBILITIES FOR THE ACCURACY OF THE CONTENTS AND

19、 MAKES NO REPRESENTATIONS OR WARRANTIES REGARDING THE CONTENTS COMPLIANCE WITH ANY APPLICABLE STATUTE, RULE OR REGULATION, OR THE SAFETY OR HEALTH EFFECTS OF THE CONTENTS OR ANY PRODUCT OR SERVICE REFERRED TO IN THE DOCUMENT OR PRODUCED OR RENDERED TO COMPLY WITH THE CONTENTS. TIA SHALL NOT BE LIABL

20、E FOR ANY AND ALL DAMAGES, DIRECT OR INDIRECT, ARISING FROM OR RELATING TO ANY USE OF THE CONTENTS CONTAINED HEREIN, INCLUDING WITHOUT LIMITATION ANY AND ALL INDIRECT, SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES (INCLUDING DAMAGES FOR LOSS OF BUSINESS, LOSS OF PROFITS, LITIGATION, OR THE LIKE), WHE

21、THER BASED UPON BREACH OF CONTRACT, BREACH OF WARRANTY, TORT (INCLUDING NEGLIGENCE), PRODUCT LIABILITY OR OTHERWISE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. THE FOREGOING NEGATION OF DAMAGES IS A FUNDAMENTAL ELEMENT OF THE USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLI

22、SHED BY TIA WITHOUT SUCH LIMITATIONS. TIA-455-218 FOTP-218 Measurement of Endface Geometry of Single Fiber Optical Connectors Contents Foreword.iii 1 Introduction . 1 2 Normative references . 3 3 Apparatus 3 4 Test Specimens 5 5 Procedure . 6 6 Calculations or interpretations of results 8 7 Document

23、ation 8 8 Specification Information 9 Annex .10 i TIA-455-218 This page left blank. iiTIA-455-218 FOTP-218 Measurement of Endface Geometry of Single Fiber Optical Connectors Foreword (This Foreword is informative only and is not part of this Standard.) From TIA (Telecommunications Industry Associati

24、on) Project No. 3-0002 formerly Project No. 4645 formulated under the cognizance of TIA FO-6, Committee on Fiber Optics, FO-6.3, Subcommittee on Fiber Optic Interconnecting Devices and Passive Products; and FO-6.3.3, Working Group on Ferrule/Fiber Geometrical Measurements. This FOTP is part of the s

25、eries of test procedures included within Recommended Standard TIA/EIA-455A. There is 1 informative annex. Key words: geometric parameters, radius of curvature, offset, fiber protrusion, fiber undercut, surface analysis, interferometer. iiiTIA-455-218 This page left blank. ivTIA-455-218FOTP-218 Measu

26、rement of Endface Geometry of Single Fiber Optical Connectors 1 Introduction 1.1 Intent The intent of this test is to measure the physical parameters of the endface of a single fiber optical connector to assure its ability to provide acceptable optical performance for long-term use. 1.2 Scope The pu

27、rpose of this procedure is to measure the key geometric parameters of a single fiber optical connector. This includes the radius of curvature, the offset of the polish (apex offset), and the fiber height relative to the ferrule endface. 1.3 Background PC polished connectors are designed to have a sp

28、herical end face with the fiber at the apex or highest point. On connection, this allows the fibers to come into intimate optical contact and compress slightly for the optimum system performance over time, temperature, and vibration. Measuring the endface geometry provides assurance that the fiber-f

29、iber interface will remain intact and will not form an air gap over the long term or when intermated with another connector. 1.4 Definitions Because the endface of a PC polished connector is often aspherical, defined measurement regions are critical for agreement between measurements by different us

30、ers. (See section 4.1) Radius of Curvature is defined as the radius of the best fit spherical surface in the defined Fitting Region. The Apex Offset or Offset of Polish is the linear distance from the center of the fiber to the apex or highest point on the best fit spherical surface. This can also b

31、e express as an angle between these two points. The Fiber Undercut (+U) or Protrusion (-U), is defined as the distance between the fiber endface and the best fit spherical surface over the defined Averaging Region. Note: Undercut is a positive number and protrusion is a negative number. 1TIA-455-218

32、 Figure 1 - Fiber undercut and protrusion of spherically polished ferrule endface 1.5 Summary Two methods are described in this standard: a) Method 1: analyzing the endface with a three-dimensional interferometric type surface analyzer for measuring the radius of curvature, the fiber undercut or pro

33、trusion and the apex offset. b) Method 2: analyzing the endface with a two-dimensional surface analyzer for measuring the radius of curvature and the fiber undercut or protrusion. Method 2 is the reference test method (RTM) for measuring the fiber undercut or protrusion. 2455-218TIA-2 Normative refe

34、rences Test or inspection requirements may include, but are not limited to, the following references: TIA/EIA-455-B Standard test procedures for fiber optic fibers, cables, transducers, sensors, connecting and terminating devices, and other fiber optic components, IEC-1300-3-15, 1998, Fiber optic in

35、terconnecting devices and passive components eccentricity of a spherically polished ferrule endface. IEC-1300-3-23, 1998, Fiber optic interconnecting devices and passive components fiber position relative to endface. 3 Apparatus 3.1 Method 1 Three-dimensional surface analysis by interferometry The a

36、pparatus shown in figure 2 consists of a suitable ferrule holder, a positioning stage and a three-dimensional interferometric analyzer. 3.1.1 Ferrule holder The ferrule holder is a suitable device to hold the ferrule in a fixed position, or in a tilted position in the case of an angled ferrule type.

37、 3.1.2 Positioning stage The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved to the appropriate position. The stage shall have enough rigidity so as to measure the ferrule endface with a precision in the nanometer range. 3.1.3 Three-dimensional interferome

38、try analyzer The three-dimensional interferometry analyzer shall have an ability to measure the surface of the ferrule endface with accuracy better than 10 nm. The interferometer shall be able to process the surface data so as to measure the radius of curvature, apex offset and fiber undercut or pro

39、trusion. The unit calculates an ideal spherical surface fitted to the spherical ferrule endface from the measured surface data. This allows it to calculate the radius of curvature. It locates the center of the fiber and the apex of the ideal spherical surface, then calculates the offset distance. Ex

40、tracting the ideal spherical surface data from the measured surface data creates a converted surface or surface fit curve. Undercut or protrusion is calculated by averaging the heights of the converted surface over the defined measurement regions and measuring the difference. Ideally, the unit shoul

41、d have an ability to correct the surface data 3TIA-455-218 taking into account the difference in refractive indices and absorption coefficients of the fiber and the ferrule. Ferrule holder Figure 2 Apparatus for three-dimensional surface analysis by interferometry system 3.2.1 Method 2 Two-dimension

42、al surface analysis The apparatus shown in figure 3 consists of a suitable ferrule holder, a positioning stage and a two-dimensional surface analyzer. 3.2.2 Ferrule holder The ferrule holder is a suitable device to hold the ferrule in a fixed vertical position, or in a tilted position in the case of

43、 an angled ferrule type. 3.2.3 Positioning stage The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved to the appropriate position. The stage shall have enough rigidity so 4-455-218TIA-as to measure the ferrule endface with a precision in the nanometer range

44、. Figure 3 - Apparatus for two-dimensional surface analysis 3.2.4 Two dimensional surface analyzer The two dimensional surface analyzer shall have an ability to measure the profile of the ferrule endface with accuracy with accuracy better than 10 nm. The analyzer shall consist of a profilometer, a p

45、rofile data processing unit and a monitor. The profilometer shall be equipped with a wedge type probe arranged so that the motion of the trace is perpendicular to the ferrule axis. The profile data processing unit shall be able to process the profile data so as to measure the radius of curvature and

46、 the fiber undercut or protrusion. The unit calculates the best circular fit for the profile data. This allows it to calculate the radius of curvature. Undercut or protrusion is calculated from the converted surface data by extracting the ideal circular surface data from the measured surface data an

47、d measuring the average difference over the defined measurement regions. 4 Test Specimens Unless otherwise specified, use an optical fiber connector ferrule for the test specimen. The specimen may be part of an optical fiber connector at the time of measurement. Keep the specimen free from dust or d

48、irt to provide accurate 5TIA-455-218 measurement of the endface geometry. 5 Procedure 5.1 Measurement regions Three regions shall be defined on the ferrule endface for the measurement. (see figure 5): a) fitting region: the fitting region is set on the ferrule surface and defined by a circular regio

49、n having a diameter D minus the diameter E of the extracting region. The fitting region shall be defined in order to cover the contact zone of the ferrule endface when the ferrule is mated; b) extracting region: the extracting region, which includes the fiber endface region and the adhesive region, is defined by a circle having a diameter E; c) averaging region: the averaging region is set on the fiber surface, and defined by a circle having a diameter F. Fig 5 -Ferrule endface and measurement regions 6-455-218TIAThe three regions shall be centered on the ferrule axis.

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